• 한국안광학회지
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• 제10권2호
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• pp.133-138
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• 2005

비구면렌즈는 구면렌즈계의 단점을 보완하여 결상 성능을 향상시키며, 렌즈의 사용매수를 경감시키고 이로 인하여 광학계의 무게와 부피를 줄이는 소형경량화를 목적으로 하여 사용되고 있다. 비구면 광학소자의 생산기술과 측정기술은 현대의 첨단기술로 부각되고 있다. 비구면으로 구성된 원광학계는 넓은 시야와 고성능, 양질의 상을 얻을 수 있고, 또한 소형, 경량화 시킬 수 있는 등 많은 장점을 가지고 있다. 이러한 비구면 소자의 급증하는 필요성에 부응하여 비구면 가공 기술과 측정 기술에 대하여 연구하고자 한다. 비구면 생산 기술과 측정 및 평가 기술은 끊임없이 발전하고 있음을 밝혀둔다.

• 한국기계가공학회지
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• 제10권2호
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• pp.104-109
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• 2011

I present a method of aspheric surface profile measurement using 2nd derivative of local area profile. This method is based on the principle of curvature sensor which measures the local 2nd derivative under test along a line. The profile is then reconstructed from the data on the each point. Unlike subaperture-stiching method and slope detection method, 2nd derivative method has strong points from a geometric point of view in measuring the aspheric surface profile. The second derivative terms of surface profile is an intrinsic property of the test piece, which is independent of its position and tip-tilt motion. The curvature is measured at every local area with high accuracy and high lateral resolution by using White-light scanning interferometry.

• 한국정밀공학회지
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• 제21권1호
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• pp.40-45
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• 2004

Recently, aspheric optical lenses and mirrors, which are harder to manufacture and measure than the conventional spherical ones, are widely used, particularly in electronic fabrication process. Generally, interferometric optical method is used for the measurement of spherical optical surface. However, the interferometric method for aspheric surface measurement is difficult because it needs a precise null corrector and strict environmental conditions such as constant temperature, humidity and vibrations. We have been studied on the manufacturing of aspheric optics to improve the surface profile accuracy and productivity using a corrective polishing process. For the corrective polishing, a practical method of On-Machine Measurement (OMM) is required. For this purpose, an optical OMM system has been studied using the Shach-Hartmann test, which is very robust to the practical polishing environment. The wavefront has been reconstructed from the measured data using the primary aberration polynomial function by the least squares fitting. The measured result of the OMM system shows that the maximum deviation is less than 200 nm for the one of commercial Fizeau interferometer Wyko 6000.

• Journal of the Korean Physical Society
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• 제73권11호
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• pp.1657-1662
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• 2018

A null test method which relies on a computer generated hologram (CGH) is widely used to measure a large aspheric surface. For precise measurements of the surface shape of an aspheric optics, the CGH must precisely generate a wavefront that can fit on the ideal surface shape of the aspheric optics. If fabrication errors arise in the CGH, an unwanted wavefront will be generated and the measuring result will lack trustworthiness. Thus far, there has been limited research on wavefronts generated by CGH using only linear-type binary grating models. In this study, a theoretical error model of a circular-type zone plate, the most commonly used types for CGH patterns, is suggested. The proposed error model is checked by simulations and experiments.

• 한국공작기계학회:학술대회논문집
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• 한국공작기계학회 2002년도 추계학술대회 논문집
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• pp.474-480
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• 2002

Aspheric optical lenses and mirrors are widely used in recent. It is more difficult to manufacture and measure the aspherical optics compared to conventional spherical ones. The interferometric optical test is common for the measurement of spherical optical surface. But the application of the interferometry to the measurement of aspheric surface is difficult because it needs a precise null corrector and very careful environmental conditions such as keeping constant temperature, humidity, atmospheric pressure and vibrations. To enhance productivity of optics manufacturing on-machine measurement and correction has been developed in this study. For practical applications, robustness of the measurement method to environments is more important. For the purpose an optical OMM(On-Machine Measurement) system has been developed using Shack-Hartmann test which has robustness to the environment. The wavefront has been reconstructed from the measured data using the primary aberration polynomial function by least square fitting. The measured result of the developed only system gives the maximum deviation only in 200 nm from the result measured by a commercial Fizeau interferometer Wyko 6000.

• 한국광학회지
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• 제15권4호
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• pp.313-320
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• 2004

위상편이 회절격자 간섭계와 이진 컴퓨터 형성 홀로그램을 제작하여 널 시스템을 구성하고 비구면형상 측정 시스템을 구축하였다. 제안하는 시스템은 비구면형상에 맞게 제작된 이진 컴퓨터 형상 홀로그램과 가시도가 조정된 위상편이 회절격자간섭계로 이루어져있다. 위상편이 회절격자간섭계는 회절격자의 홈 형상이나 간섭을 일으킬 측정광과 기준광을 바꿈으로써 가시도를 쉽게 조절할 수 있고, 높은 수준의 측정 정확도를 가지는 장점을 가지고 있다. 이진 컴퓨터 형성 홀로그램은 비구면의 정보를 통하여 컴퓨터로 수치모사한 후 전자-빔 리토그래피 장비로 제작할 수 있고, 위상편이 회절격자 간섭계, 비구면과 함께 자동곡률측정 방식으로 설치된다. 간섭계와 홀로그램을 제작한 후 비구면을 측정, 실험을 수행하고 시스템을 평가하였다.

• 한국광학회지
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• 제18권2호
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• pp.130-134
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• 2007

광역의 자유곡면 형상을 나노미터 정밀도로 측정하기 위한 새로운 형상 측정법으로서 곡률에 근거한 형상 측정법을 제안한다. 곡률 형상 측정기는 피측정물을 일정간격으로 스캔하는 간섭계로써 각 국부영역의 형상으로부터 곡률을 획득하여, 이로부터 전 영역의 형상을 복원한다. 제안된 곡률 형상 측정기는 비구면 형상 측정을 위해 개발된 보상 광학계(Null optics)나 국부영역의 형상을 측정하고 결합하는 subaperture-slicking 법에 비해 측정 장비로부터 발생하는 시스템 오차를 근본적으로 제거하는 특징을 가진다. $80mm\times80mm\times25mm$ 작동구간을 갖는 Stewart Platform과 상용 트와이만 그린 간섭계를 이용하여 곡률간섭계를 구성하였으며, 자유곡면의 형상측정을 위한 첫 단계로서 잘 알려진 구면형상을 측정하고, 기존 장비의 측정값과 비교한 결과 32 mm영역에서 최대 56 nm의 차를 보임을 확인하였다.

• 한국정밀공학회지
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• 제26권1호
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• pp.57-62
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• 2009

Recently, with the increasing lightness and miniaturization of high resolution camera phones, the demand for aspheric glass lens has increased because plastic and spherical lens are unable to satisfy the required performance. An aspheric glass lens is fabricated by the high temperature and pressure molding using a tungsten carbide molding core, so precision grinding technology for the molding core surface are required. This paper reports a development of feedrate control grinding method for aspherical molding core using parallel grinding method. A plane molding core was ground using conventional and feedrate control grinding method. The performance of the feedrate control method was evaluated by measurement of surface roughness. The result indicated that the average surface roughness was reduced to 1.5 nm, which is more efficient than the conventional grinding method.

• Journal of the Optical Society of Korea
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• 제6권2호
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• pp.21-26
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• 2002

Interferometric metrology with a null CGH(computer-generated hologram) is presented for measuring highly aspheric surfaces used in a large screen projection television system with high accuracy. The cubic spline surface model which works in a single-pass configuration with a refractive index of object space 0 is used for designing a null CGH. A hybrid null corrector with plano-concave lens in front of a CGH is presented to make the CGH easier to fabricate. Experimental results are presented to demonstrate the validity of the proposed technique.

• International Journal of Precision Engineering and Manufacturing
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• 제8권2호
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• pp.26-31
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• 2007

A novel scanning probe measurement system was developed to enable precise profile measurements of microaspheric surfaces. An air-bearing stylus with a microprobe was used to perform the surface profile scanning. The new system worked in a contact mode and had the capability of measuring micro-aspheric surfaces with large tilt angles and complex profiles. Due to limitations resulting from the contact mode, such as possible damage caused by the contact force and lateral resolution restrictions from the curvature of the probe tip, several system improvements were implemented. An air bearing was used to suspend the shaft of the probe to reduce the contact force, enabling fine adjustments of the contact force by changing the air pressure. The movement of the shaft was measured by a linear encoder with a scale attached to the actual shaft to avoid Abbe errors. A $50-{\mu}m-diameter$ glass sphere was bonded to the tip of the probe to improve the lateral resolution of the system. The maximum contact force of the probe was 10 mN. The shaft was capable of holding the probe continuously if the contact force was less than 40 mN, and the resolution of the probe could be as high as 10 nm, The performance of the new scanning probe measurement system was verified by experimental data.