• Journal of the Korean Magnetics Society
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• v.16 no.2
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• pp.136-139
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• 2006

The tunneling magnetoresistance (TMR) ratios of magnetic tunnel junctions (MTJs), in general, decrease abruptly above 250$^{\circ}C$ due to Mn interdiffusion from an antiferromagnet IrMn layer to a ferromagnetic CoFe and/or a tunnel barrier. To improve thermal stability, we prepared MTJs with nano-oxide layers. Using a MTJ structure consisting of underlayer CoNbZr 4/bufferlayer CoFe 10/antiferromaget IrMn 7.5/pinned layer CoFe 3/tunnel barrier AlO/freelayer CoFe 3/capping CoNbZr 2 (nm), we placed a nano-oxide layer (NOL) into the underlayer or bufferlayer. Then, the thermal, structural and magneto-electric properties were measured. The TMR ratio, surface flatness, and thermal stability of the MTJs with NOLs were promoted.

• Journal of the Korean Magnetics Society
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• v.12 no.2
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• pp.68-72
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• 2002

In this research, the effects of capacitance to the access time were studied at the junction area of tunneling magnetoresistance when these were used as memory devices. These results were obtained by applying electric signal input and magnetic field was not used. We applied bipolar square waves of 1MHz to the MTJ samples to obtain the results and time constant ($\tau$) calculated by observing wave responses utilizing an oscilloscope. And time constant was compared with junction area. Each part of MTJ sample, such as electrical pad, lead and contact area, was modeled as an electrical equivalent circuit based on experimental results. For the 200㎛$\times$200㎛ cell, junction capacitance was 90 pF. Also, measurement and simulation results were compared, which showed those similarity.

• Journal of the Korean Magnetics Society
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• v.9 no.5
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• pp.245-250
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• 1999

The effect of substrate and oxidization time on $substrate /Py/Al_2O_3/Co\;(Py=Ni_{81}Fe_{19})$ tunnel junction was studied. Samples were prepared without breaking vacuum by changing shadow masks in-situ. The resistance of tunnel junctions increased, but measured MR decreased with oxidization time. Negative MR observed for samples of tunnel resistivity lower than 0.17 M$\Omega$ $({\mu}m)^2$. MR resistivity decreased with the change of substrates in the order of thermally oxidized Si(111), Si(100), Coring Glass 2948, Corning Glass 7059. Sign change and the variation of MR was explained with non uniform current effect.

• Journal of Magnetics
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• v.7 no.3
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• pp.98-100
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• 2002

Tunnel magnetoresistive devices using an individual multi-walled carbon nanotube were fabricated and their low-temperature electrical transport propertiers were investigated. With the ferromagnetic Co electrodes, the multi-walled carbon nanotube exhibited hysteretic magnetoresistance curve at low temperatures. Depending on the temperature and the bias current, the magnetoresistance ratio can be as high as 16% at the temperature of 2.2 K. Such high magnetoresistance ratio indicates a long diffusion length of the multi-walled carbon nanotube.

• Proceedings of the Korean Magnestics Society Conference
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• 2003.12a
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• pp.98-98
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• 2003

• Proceedings of the Korean Magnestics Society Conference
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• 2006.11a
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• pp.38-38
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• 2006

• Proceedings of the Korean Magnestics Society Conference
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• 2007.05a
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• pp.24.2-24.2
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• 2007

• Proceedings of the Korean Magnestics Society Conference
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• 2007.05a
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• pp.128.2-128.2
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• 2007

• Proceedings of the Korean Magnestics Society Conference
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• 2007.05a
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• pp.132.2-132.2
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• 2007

• Proceedings of the Korean Vacuum Society Conference
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• 2009.08a
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• pp.254-254
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• 2009