• 대한전기학회논문지:전기물성ㆍ응용부문C
• /
• 제55권6호
• /
• pp.313-316
• /
• 2006

A method for evaluation of the linearity of both the ratio error and phase angle error in the current transformer(CT) comparison measurement equipment has been developed by employing the standard resistors with negligible AC-DC resistance difference less than $10^{-5}$. The non-reactive standard resistors for the linearity check of the system are used as the external burden connected with the secondary of CT under test. These burdens consist of nine standard resistors, with the nominal resistance of $0.01{\Omega},\;0.1{\Omega},\;0.2{\Omega},\;0.4{\Omega},\;0.6{\Omega},\;1{\Omega},\;2{\Omega},\;4{\Omega}$, and $10{\Omega}$. For linearity check, the developed method has been applied in the CT comparison measurement equipment belonging to the industry.

• Nuclear Engineering and Technology
• /
• 제55권2호
• /
• pp.484-492
• /
• 2023

Time-to-digital converters (TDCs) based on the tapped delay line (TDL) architecture have been widely used in various applications requiring a precise time measurement. However, the poor uniformity of the propagation delays in the TDL implemented on FPGA leads to bubble error and large nonlinearity of the TDC. The purpose of this study was to develop an advanced TDC architecture capable of minimizing the bubble errors and improving the linearity. To remove the bubble errors, the decimated delay line (DDL) architecture was implemented on the UltraScale + FPGA; meanwhile, to improve the linearity of the TDC, a histogram uniformization (HU) and multi-chain TDL (MCT) methods were developed and implemented on the FPGA. The integral nonlinearities (INLs) and differential nonlinearities (DNLs) of the plain TDCs with the 'HU method' (HU TDC) and with 'both HU and MCT methods' (HU-MCT TDC) were measured and compared to those of the TDC with 'DDL alone' (plain TDC). The linearity of HU-MCT TDC were superior to those of the plain TDC and HU TDC. The experiment results indicated that HU-MCT TDC developed in this study was useful for improving the linearity of the TDC, which allowed for high timing resolution to be achieved.

• 제어로봇시스템학회:학술대회논문집
• /
• 제어로봇시스템학회 1989년도 한국자동제어학술회의논문집; Seoul, Korea; 27-28 Oct. 1989
• /
• pp.943-946
• /
• 1989

The channel irregularity of Successive Approximation ADC is very large in comparison with other type of ADCs. This characteristic makes it impossible to apply the Successive Approximation ADC to the field of radiation pulse height analysis or the measurement of probability density function. In this paper, an analysis of differential non-linearity of this ADC-is presented. It is made clear that the small deviation of resistance causes very large differential non-linearity.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 2002년도 학술대회 논문집 전문대학교육위원
• /
• pp.161-165
• /
• 2002

The paper presents a diagnostic tool for analyzing the bit intermodulation in D/A converter. Bit intermodulation cause linearity errors which degrade the performance of the converter. A linear transformation of the Walsh transform of the integrated non-linearity diagram is shown to be sufficient to extract the bit intermodulation terms and their noise sensitivity. Practical applicability of the proposed method is shown by measurement.

• 전기화학회지
• /
• 제17권2호
• /
• pp.119-123
• /
• 2014

Here I report on how Fourier Transform Electrochemical Impedance Spectroscopy (FTEIS) overcomes the potential-current linearity problem encountered in the impedance calculation process. FTEIS was first invented to solve the time-related drawback of the conventional impedance technique. The dramatic time reduction of FTEIS enabled the real-time impedance measurement but brought about the linearity problem at the same time. While the conventional method circumvents the problem using the steady-state made by a sufficiently long measurement time, FTEIS cannot because of its real-time function. However, according to the mathematical development reported in this article, the potential step used in FTEIS is proved to avoid the linearity problem. During the step period, the potential and the current are linearized by the electrochemical impedance. Also, Fourier transform of the differentiated potential and current is proved to give the same result of the original ones.

• ETRI Journal
• /
• 제35권3호
• /
• pp.546-549
• /
• 2013

A Ka-band 6-W high power microwave monolithic integrated circuit amplifier for use in a very small aperture terminal system requiring high linearity is designed and fabricated using commercial 0.15-${\mu}m$ GaAs pHEMT technology. This three-stage amplifier, with a chip size of 22.1 $mm^2$ can achieve a saturated output power of 6 W with a 21% power-added efficiency and 15-dB small signal gain over a frequency range of 28.5 GHz to 30.5 GHz. To obtain high linearity, the amplifier employs a class-A bias and demonstrates an output third-order intercept point of greater than 43.5 dBm over the above-mentioned frequency range.

• Wind and Structures
• /
• 제9권6호
• /
• pp.457-471
• /
• 2006

This paper is devoted to the non linear quasi-steady aerodynamic loading. A linear approximation is often used to compute the response of structures to buffeting forces. Some researchers have however shown that it is possible to account for the non linearity of this loading. This non linearity can come (i) from the squared velocity or (ii) from the shape of the aerodynamic coefficients (as functions of the wind angle of attack). In this paper, it is shown that this second origin can have significant implications on the design of the structure, particularly when the non linearity of the aerodynamic coefficient is important or when the transverse turbulence is important.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2001년도 춘계학술대회 논문집 센서 박막재료
• /
• pp.43-46
• /
• 2001

The ZnO devices using semiconductor properties, to include $MnO_2$, $Y_2O_3$ and other material, was fabricated by $Sb_2O_3$ mol ratio from 1 to 4 [mol%]. The non-linearity factor was calculated by setting current to be $1[mA/cm^2]$ and $10[mA/cm^2]$. The spinel structure was fonned by $Sb_2O_3$ addition and it was depressed the ZnO grain formation. The grain growing was controlled by spinel structure that has improved the non-linearity factors. The breakdown voltage characteristics of semiconductor devices to increase with $Sb_2O_3$ was increased in voltage-current. The non-linearity value of ZnO semiconductor devices was 45 over.

• 전자공학회지
• /
• 제2권2호
• /
• pp.37-42
• /
• 1975

램프형 A/D 변환기의 직선도의 정밀도에 영향을 미치는 여러 가지 원인들을 실험적으로 고찰하였다. 아울러 램프형 A/D 변환기의 직선도, 정밀도, 및 상계오차를 개선하기 위한 회로소자의 결정방법을 제안하였다. Various factors which affect the linearity and accuracy of the ramp type analog-to-digital converter have been investigated experimentally. A suggestion hav been made in the determination of circuit parameters with the emphasis on the improvement of the linearity and accuracy in the ramp type analog-to-digital conveter.

• Steel and Composite Structures
• /
• 제23권3호
• /
• pp.263-271
• /
• 2017

A theoretical study was carried-out of mode II delamination fracture behavior of the End Loaded Split (ELS) functionally graded beam configuration with considering the material non-linearity. The mechanical response of ELS was modeled analytically by using a power-law stress-strain relation. It was assumed that the material is functionally graded transversally to the beam. The non-linear fracture was investigated by using the J-integral approach. Equations were derived for the crack arm curvature and zero axes coordinate that are needed for the J-integral solution. The analysis developed is valid for a delamination crack located arbitrary along the beam height. The J-integral solution was verified by analyzing the strain energy release rate with considering material non-linearity. The effects of material gradient, non-linear material behavior and crack location on the fracture were evaluated. The solution derived is suitable for parametric analyses of non-linear fracture. The results obtained can be used for optimization of functionally graded beams with respect to their mode II fracture performance. Also, such simplified analytical models contribute for the understanding of delamination fracture in functionally graded beams exhibiting material non-linearity.