• Journal of Applied Reliability
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• v.7 no.3
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• pp.127-136
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• 2007

The accelerated life tests(ALTs) and degradation characteristics of image intensifier assembly(KIT-7) under low illuminance and high temperature were investigated. The accelerated life tests were carried out at $5{\times}10^5\;fc-40^{\circ}C,\;10{\times}10^5\;fc-40^{\circ}C,\;5{\times}10^5\;fc-50^{\circ}C,\;10{\times}10^5\;fc-50^{\circ}C$ and relationship related to illuminance and temperature was used as an accelerated life test model. An ALTA program[6] was used to calculate an acceleration factor and the test of life distribution fit, and estimate three parameters of an life test model. To sum up, MTTF 10,000 h at $5{\times}10^{-5}\;fc-40^{\circ}C$ of image intensifier assembly was certificated.

• Proceedings of the KIEE Conference
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• 2003.10b
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• pp.116-118
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• 2003

This paper describes a Accelerated Life Test (ALT) with the electrical contact erosion suitable to the evaluations of high-reliability and durability devices such as magnetic contactor. Recently, an electrical devices company was interested in accelerated life test (ALT), the product liability (PL) and the short-term testing model of electrical life test (ELT). In order to estimate a model for testing fee and period, need to the statistical analysis method with the acceleration factor(AF). Usually customer/manufacturer regard their device failure to the over-current or heavy duty condition, while devices view shape of contact erosion owing to operational duty problem. In this paper, additional method of evaluation estimated the operated cycles by weight of contact erosion with a used of regression analysis by MINITAB.

• International Journal of Reliability and Applications
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• v.4 no.3
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• pp.113-129
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• 2003

Based on moments inequalities new testing procedures are derived for testing exponentiality against new renewal better than used (NRBU) and renewal new better than used (RNBU). These classes play an important role in formulating repair or replacement policies. The asymptotic Pitman efficiency of (NRBU) and (RNBU) testes are studied. Selected critical values are tabulated for sample sizes n=5(1) 50. The power estimates for some commonly used life distributions in reliability are also calculated. Some set of real data is used as an example to elucidate the use of the proposed test statistic for practical reliability analysis. The problem in case of right-censored data is also handled.

• Communications for Statistical Applications and Methods
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• v.23 no.4
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• pp.269-285
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• 2016

In this paper, a simple step-stress accelerated life test (ALT) under progressive type-II censoring is considered. Progressive type-II censoring and accelerated life testing are provided to decrease the lifetime of testing and lower test expenses. The cumulative exposure model is assumed when the lifetime of test units follows an extension of the exponential distribution. Maximum likelihood estimates (MLEs) and Bayes estimates (BEs) of the model parameters are also obtained. In addition, a real dataset is analyzed to illustrate the proposed procedures. Approximate, bootstrap and credible confidence intervals (CIs) of the estimators are then derived. Finally, the accuracy of the MLEs and BEs for the model parameters is investigated through simulation studies.

• International Journal of Reliability and Applications
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• v.8 no.2
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• pp.175-182
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• 2007

In this note, some comments concerning the testing procedures for the problems of stochastic comparison, testing IFR and testing NBU ageing properties are presented showing that the tests proposed in Belzunce, Candel and Ruiz(1998) are cumbersome to calculate and do not have as good asymptotic Pittman efficacies as simpler others already in the literature. This is done via new presentations of the measures on which Belzunce et al. base their tests.

• Proceedings of the Korean Society of Life Science Conference
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• 2007.10a
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• pp.46.2-46.2
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• 2007

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• International Journal of Reliability and Applications
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• v.15 no.2
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• pp.85-98
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• 2014

Accelerated life testing (ALT) is a well famous technique in life testing and reliability studies, this is particularly used to induce so high stress leading to failure of the highly reliable units quickly under stipulated duration of time. The step-stress ALT is one of the systematic experimental strategy of ALT applied to fail the units in steps. In this article we focus on two important issues (i) necessity of life tests at higher steps with relevant causes (ii) to develop a new optimum test plan for 3-step SSALT under the modified cumulative exposure model proposed by Khamis and Higgins (1998). It is assumed that the lifetime of test units follows Rayleigh distribution and its scale parameter at constant stress level is assumed to be a log-linear function of the stress. The maximum likelihood estimates of the parameters involved in the step-stress ALT model are obtained. A simulation study is performed for numerical investigation of the proposed new optimum plan 3-step, step-stress ALT. The necessity of the life test units at 3-step step-stress is also numerically examined in comparison to simple step-stress setup.

• Journal of the Korean Data and Information Science Society
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• v.7 no.1
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• pp.21-35
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• 1996

In this paper, estimation and prediction procedures are discussed for grneral situation in which the failure time follows the independent density $f_{i}({\varepsilon}_{i})$ for the accelerated life testing under Type II censoring. In the context of accelerated life test experiment, procedures are given for estimating the parameters in the Eyring model, and for estimating mean life at a given future stress level. The procedures given are conditional confidence interval procedures, obtained by conditioning on ancillary statistics. A comparison is made of these procedures and procedures based on asymptotic properties of the maximum, likelihood estimates.

• International Journal of Reliability and Applications
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• v.7 no.1
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• pp.1-11
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• 2006

The better mean residual life at $t_0\;(BMRL-t_0)$ class of life distribution is introduced by Kulasekara and Park (1987). They proved that the $BMRL-t_0$ class contains the DMRL class, but it is a proper subclass of the NBUE class. In this paper we develop a new family of tests for testing exponentiality against the $BMRL-t_0\;(WMRL-t_0)$ alternatives based on the goodness of fit approach. It is shown that the suggested test is better than the one introduced by Kulasekara and Park (1987) in the sense of Pitman asymptotic efficiency values.

• Journal of Korean Society for Quality Management
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• v.26 no.2
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• pp.27-38
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• 1998

Consider a life testing experiment in which multiple two-component shared parallel systems are put on test, and the test is terminated at a specified number of system failures. The bivariate data obtained from such a system-level life testing can be classified into three classes: 1) the case of failed two components with known failure times, 2) the case of censored two components, and 3) the case of one censored component and the other failed component of which the failure time might be known or unknown. Under this censoring scheme and the assumption of Freund's bivariate exponential life distribution, the maximum likelihood estimators are obtained. Results of comparative studies based on Monte Carlo simulation are presented.