• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2004년도 춘계학술대회 논문집 방전 플라즈마 유기절연재료 초전도 자성체연구회
• /
• pp.76-81
• /
• 2004

This paper presents the results of spectral analysis of leakage current waveforms on contaminated insulators under various fog and environment conditions(salt fog, clean fog, rain) The larger the leakage current during 200ms, the higer the power spectrum at 60Hz. For almost equal maximum current during 200ms, however, the spectrum at 60hz and the odd order harmonics increase emphatically when discharges occur continuously for several half-waves. If contaminated insulators suffers from high salt-density fog, the leakage current occurs with high crest value intermittently, results in the low spectrum. Analysis of leakage current data showed that this electrical activity was characterized by transient arcing behavior contaminants are deposited on the insulator surface during salt fog tests. This provides a path for the leakage current to flow along the surface of the insulator. It is important to have an indication of the pollution accumulation in order to evulate the test performance of a particular insulator. If the drop in surface resistivity is severe enough, then the leakage current may escalate into s service interrupting flashover that degrade power quality.

• 한국전기전자재료학회논문지
• /
• 제22권6호
• /
• pp.470-475
• /
• 2009

We deposited $Al_2O_3$ thin films on GaN by remote plasma atomic layer deposition (RPALD) technique, trimethylaluminum(TMA) and oxygen were used as precursors, at fixed process condition, the number of cycle were changed. Growth rate per cycle was $1.2\;{\AA}$/cycle. and Growth rate was in proportion to a number of cycle, the GaN MIS capacitors that $Al_2O_3$ thin film were deposited above 12 nm, have excellent electrical properties, a low electrical leakage current density(${\sim}10^{-10}\;A/cm^2$ at 1.5 MV), but below 12 nm, we can see the degradation of the leakage current density. After post deposition annealing, Dielectric constant was estimated by 1 MHz high-frequency C-V method, it was varied with the anealing temperature from 6.9 at no post anealed to 7.6 at $800^{\circ}C$, and we can see a improvement of the leakage current density and breakdown voltage by post deposition anealing below $700^{\circ}C$, but, after anealed at $800^{\circ}C$, we can see the degradation of the leakage current density and breakdown voltage.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 2004년도 하계학술대회 논문집 A
• /
• pp.527-529
• /
• 2004

This paper researched leakage current characteristics of EHW insulators(36,000lbs) to artificially contaminated clay and kaolin through construction of long-periods testing facility. Insulators were contaminated and classified into the ESDD level(B, C and D) under IEC Pub. 60507 standards method. As a result of tests, leakage current of the heavily contaminated D level to clay was approximately 2,260 $[\muA]$, which is contaminated to kaolin was approximately 3,200 $[\muA]$, during initial rainfall. However after raining, leakage current of naturally washed contamination insulators was lower at approximately 300 $[\muA]$. As regular temperature $20^{\circ}C$, leakage current increased greatly in case humidity density was over $72\%$. But, leakage current was not influenced by temperature variation in case of regular $\%$ humidity.

• 대한전기학회논문지:전기물성ㆍ응용부문C
• /
• 제53권7호
• /
• pp.364-369
• /
• 2004

In this Paper, a flashover prediction method using the leakage current in the contaminated EPDM distribution polymer insulator is proposed. The leakage currents on the insulator were measured simultaneously with the different salt fog application such as 25g, 50g, and 75g per liter of deionized water. Then, the measured leakage currents were enveloped and transformed as the CDFS using the Hilbert transform and the level crossing rate, respectively. The obtained CDFS having different gradients(angles) were used as a important factor for the flashover prediction of the contaminated polymer insulator. Thus, the average angle change with an identical salt fog concentration was within a range of 20 degrees, and the average angle change among the different salt fog concentrations was 5 degrees. However, it is hard to be distinguished each other because the gradient differences among the CDFS were very small. So, the new weighting value was defined and used to solve this problem. Through simulation, it Is verified that the proposed method has the capability of the flashover prediction.

• 한국전기전자재료학회논문지
• /
• 제21권12호
• /
• pp.1090-1095
• /
• 2008

The SiOCH films that low dielectric interlayer dielectric materials were deposited on p-type Si(100) substrates through the dissociation of BTMSM precursors with oxygen gas by using PECVD method. BTMSM precursor was introduced with the flow rates from 42 sccm to 60 sccm by 2 sccm step in the constant flow rate of 60 sccm $O_2$. SiOCH thin films were annealed at $450^{\circ}C$ for 30 minutes. The electrical property of SiOCH thin films was studied by MIS, Al/SiOCH/p-Si(100), structure. Annealed samples showed even greater reductions of the maximum capacitance and the dielectric constant of the SiOCH samples, owing to reductions of surface charge density. we confirmed this result with derivative of C-V characteristic, leakage current density. The maximum capacitance and leakage current density were respectively decreased about 4 pF, 60% after annealing. The average of low-k value is approximatly 2.07 after annealing.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2010년도 하계학술대회 논문집
• /
• pp.23-23
• /
• 2010

The $Bi_2Mg_{2/3}Nb_{4/3}O_7$ (BMNO)-Bi composite films sandwiched by an $Al_2O_3$ protection layer exhibited a linear increase of a dielectric constant with increasing thickness and the 1000nm-thick BMNO-Bi composite films showed a dielectric constant (~220) higher than that of its bulk material (~210), keeping a low leakage current density of about $0.1{\mu}A/cm^2$. An enhancement of the dielectric constant in the BMNO-Bi composite films was attributed to the hybrid model combined by a space charge polarization, dipolar response, and nano-capacitors. On the other hand, 1000nm-thick BMNO-Bi composite films sandwiched by 40nm-thick BMNO layer exhibited a dielectric constant of about 450 at 100 kHz and a leakage current density of $0.1{\mu}A/cm^2$ at 6V.

• 한국전기전자재료학회논문지
• /
• 제16권6호
• /
• pp.460-464
• /
• 2003

The barium strontium titannate ((Ba,Sr)TiO$_3$:BST) thin films were etched in an inductively coupled plasma (ICP) as a function of CF$_4$/Ar gas mixing ratio. Under CF$_4$(20%)/Ar(80%), the maximum etch rate of the BST films was 400 $\AA$/min. Etching products were redeposited on the surface of BST and then the nature of crystallinity were varied. Therefore, we investigated the etched surface of BST by X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). The plasma damages were evaluated in terms of leakage current density by Agilent 4145C and dielectric constant by HP 4192 impedance analyzer. After the BST thin films exposed in the plasma, the leakage current density and roughness increases. After annealing at 600 $^{\circ}C$ for 10 min in $O_2$ ambient, the leakage current density, roughness and nonvolatile etch byproducts reduced. From this results, the plasma induced damages were recovered by annealing process owing to the relaxation of lattice mismatches by Ar ions and the desorption of metal fluorides in high temperature.

• 한국전기전자재료학회논문지
• /
• 제22권9호
• /
• pp.724-727
• /
• 2009

We have fabricated (Ba,Sr)TiO3$TiO_3$ thick films doped with various amount of ZnBO dopants (1, 3, and 5 wt%) by screen printing method on the alumina substrates, which were sintered at the temperature below $1200^{\circ}C$. With increasing the amount of ZnBO dopants, the relative dielectric permittivity of ZnBO doped (Ba,Sr)$TiO_3$ was decreased, while loss tangent was increased. 1 wt% ZnBO doped (Ba,Sr)$TiO_3$ thick film has relative dielectric permittivity of 759 at 1 MHz, while 3 and 5 wt% of ZnBO doped (Ba,Sr)$TiO_3$ thick films have 624 and 554, respectively. By introducing ZnBO dopants to the (Ba,Sr)$TiO_3$ thick films, leakage current densities were decreased. The decreased leakage current with increasing ZnBO dopants can be explained by increased density and grain size of thick film on alumina substrate. We believe this decreased leakage current density probably come from the increased grain size and increased density.

• Current Applied Physics
• /
• 제18권11호
• /
• pp.1415-1421
• /
• 2018

Unlike ordinary organic field-effect transistors (OFETs), saturation current is hardly to be found in vertical OFETs (VOFETs). Moreover, the fabrication process of patterned sourced for VOFETs is quite complex. In this current work, a simple solution processed VOFET with directly deposited intermediate silver source electrode has been demonstrated. The VOFET exhibits a high leakage current that induces an inversion polarity of its transistor behavior. Interestingly, a well-defined saturation current was observed in the linear scale of transfer characteristic. The VOFET operated with high-current density > $280mA/cm^2$ at $V_d=5V$. Overview potential of the fabricated device in display application is also presented. This preliminary work does open-up a new direction in VOFET fabrication and their application.

• 전기학회논문지
• /
• 제61권10호
• /
• pp.1461-1470
• /
• 2012

This paper reports the contamination performance of transmission line porcelain insulators tested under five different contaminant conditions - clean and ESDD (equivalent salt deposit density) level (A, B, C, and D) through measurement of their leakage current under drop of potential method. To estimate the contamination for transmission line porcelain insulators, leakage current waveform and its maximum value were measured under step-up power test. In the clean insulators test, % distortion factors decreased with increasing step-up power, and as the ESDD level increased, some characteristics such as frequency analysis, harmonics and % distortion facotor could be used for contamination diagnosis of the transmission line porcelain insulators.