• Proceedings of the Korean Society of Near Infrared Spectroscopy Conference
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• 2001.06a
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• pp.1182-1182
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• 2001

In this study, the newly constructed optical measurement system, which was mainly composed of a parametric tunable laser and a near infrared photoelectric multiplier, was introduced to clarify the optical characteristics of wood as discontinuous body with anisotropic cellular structure from the viewpoint of the time-of-flight near infrared spectroscopy (TOF-NIRS). The combined effects of the cellular structure of wood sample, the wavelength of the laser beam λ, and the detection position of transmitted light on the time resolved profiles were investigated in detail. The variation of the attenuance of peak maxima At, the time delay of peak maxima Δt and the variation of full width at half maximum Δw were strongly dependent on the feature of cellular structure of a sample and the wavelength of the laser beam. The substantial optical path length became about 30 to 35 times as long as sample thickness except the absorption band of water. Δt ${\times}$ Δw representing the light scattering condition increased exponentially with the sample thickness or the distance between the irradiation point and the end of sample. Around the λ=900-950 nm, there may be considerable light scattering in the lumen of tracheid, which is multiple specular reflection and easy to propagate along the length of wood fiber. Such tendency was remarkable for soft wood with the aggregate of thin layers of cell walls. When we apply TOF-NIRS to the cellular structural materials like wood, it is very important to give attention to the difference in the light scattering within cell wall and the multiple specular-like reflections between cell walls. We tried to express the characteristics of the time resolved profile on the basis of the optical parameters for light propagation determined by the previous studies, which were absorption coefficient K and scattering coefficient S from Kubelka-Munk theory and n from nth power cosine model of radiant intensity. The wavelength dependency of the product of K/S and n, which expressed the light-absorbing and -scattering condition and the degree of anisotropy, respectively, was similar to that of the time delay of peak maxima Δt. The variation of the time resolved profile is governed by the combination of these parameters. So, we can easily find the set of parameters for light propagation synthetically from Δt.

• Journal of Korean Ophthalmic Optics Society
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• v.9 no.1
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• pp.35-41
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• 2004

This study investigated the crystal growth, crystalline structure and the basic optical properties of $PbSnSe/BaF_2$ epilayers. The PbSnSe epilayer was grown on $BaF_2$(111) insulating substrates using a hot wall epitaxy (HWE) technique. It was found from the analysis of X-ray diffraction patterns that $PbSnSe/BaF_2$ epilayer was grown single crystal with a rock-salt structure oriented along [111] the growth direction. Using Rutherford back scattering, the atomic ratios of the PbSnSe was found to be proper stoichiometric. The best values for the full width at half maximum (FWHM) of the DCXRD was 162 arcsec for PbSnSe epilayer. The epilayer-thickness dependence of the FWHM of the DCXRD shows that the quality of the $PbSnSe/BaF_2$ is as expected. The dielectric function ${\varepsilon}(E)$ of a semiconductor is closely related to its electronic energy band structure and such relation can be drawn from features around the critical points(CPs) in the optical spectra. The real and imaginary parts(${\varepsilon}1$ and ${\varepsilon}2$) of the dielectric function ${\varepsilon}$ of PbSe were measured, and the observed spectra reveal distinct structures at energies of the E1, E2 and E3 CPs. These data are analyzed using a theoretical model known as the model dielectric function (MDF). The optical constants related to dielectric function such as the complex refractive index ($n^*=n+ik$), absorption coefficient (${\alpha}$) and normal-incidence reflectivity (R) are also presented for $PbSnSe/BaF_2$.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.6 no.3
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• pp.351-359
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• 1996

We have investigated the effect of hydrogen plasma on the formation of InAs QDs (quantum dots) structure by using a CBE (chemical beam epitaxy)system equipped with ECR (electron cyclotron resonance) plasma source. It is confirmed that the formation of self-organized InAs-QDs on GaAs is started after the growth of InAs layer up to 2.6 ML (monolayer) with the irradiation of hydrogen plasma while it is started after 1.9 ML without hydrogen gas and hydrogen plasma through the observation of RHEED patterns. Density and size of the QDs formed at $T_{sub}=370^{\circ}C$ are $1.9{\times}10^{11}cm^{-2}$ and 17.7 nm without hydrogen plasma, and $1.3{\times}10^{11}cm^{-2}$ and 19.4 nm with hydrogen plasma, respectively. It is also observed from the PL(photoluminescence) measurement on InAs-QDs that red shift in PL peak energy and broadening in FWHM (full width at half maximum)of PL peak caused by the effects of hydrogen plasma on the increment of size and its distribution. These effects of hydrogen plasma are considered as a act of atomic hydrogen which enhances the layer-growth of InAs on GaAs resulted from the relief of misfit strain between GaAs substrate and InAs.

• Nuclear Engineering and Technology
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• v.47 no.4
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• pp.479-487
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• 2015

The thallium-doped sodium iodide [NaI(Tl)] scintillation detector is preferred as a gamma spectrometer in many fields because of its general advantages. A silicon photomultiplier (SiPM) has recently been developed and its application area has been expanded as an alternative to photomultiplier tubes (PMTs). It has merits such as a low operating voltage, compact size, cheap production cost, and magnetic resonance compatibility. In this study, an array of SiPMs is used to develop an NaI(Tl) gamma spectrometer. To maintain detection efficiency, a commercial NaI(Tl) $2^{\prime}{\times}2^{\prime}$ scintillator is used, and a light guide is used for the transport and collection of generated photons from the scintillator to the SiPMs without loss. The test light guides were fabricated with polymethyl methacrylate and reflective materials. The gamma spectrometer systems were set up and included light guides. Through a series of measurements, the characteristics of the light guides and the proposed gamma spectrometer were evaluated. Simulation of the light collection was accomplished using the DETECT 97 code (A. Levin, E. Hoskinson, and C. Moison, University of Michigan, USA) to analyze the measurement results. The system, which included SiPMs and the light guide, achieved 14.11% full width at half maximum energy resolution at 662 keV.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.5
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• pp.15-20
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• 2007

We fabricated ZnO thin films on quartz substrate using pulsed laser deposition method and investigated structural and optical properties of ZnO thin films with various substrate temperatures. Regardless of the substrate temperature variation, all ZnO thin films had grown to (002) and the thin film deposited at 400 $^{\circ}C$ exhibited an excellent crystallinity having 0.24$^{\circ}$ of Full-Width-Half-Maximum (FWHM). In the result of photoluminescence property, UV and deep-level emission peaks were observed in all ZnO films and the emission peaks were changed with various substrate temperatures. An highest UV emission was exhibited on the specimen deposited at 400 $^{\circ}C$ and the FWHM of UV peak was 14 nm. The optical transmittance was about 85 % in visible region regardless of the substrate temperature. The comparison result of the bandgap energies obtained from optical transmittance and UV emission centers, the two values were about the same. From these results, it is found that UV emission center has close relationship with near band edge emission of ZnO thin film.

• Journal of the Korean Vacuum Society
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• v.21 no.6
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• pp.348-353
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• 2012

We investigated chemical states of a $Sb_2Te_3$ thin film with the polycrystalline phase by using high-resolution x-ray photoelectron spectroscopy with synchrotron radiation. The $Sb_2Te_3$ thin film was formed by sputtering. The rhombohedral phase was confirmed by x-ray diffraction. To remove the surface oxide, we performed $Ne^+$ ion sputtering for 1 hour with the beam energy of 1 kV and post-annealing at $100^{\circ}C$ for 5 min in ultra-high vacuum. We obtained the Te and Sb 4d core-levels spectra with the peaks at the binding energies of 40.4 and 33.0 eV, respectively. The full-width of half maximum of both the Te and Sb $4d_{5/2}$ core-levels is 0.9 eV. The Te and Sb core-levels only show a single chemical state, and we also confirmed the stoichiometry of approximately 2 : 3.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.37 no.12
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• pp.11-17
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• 2000

We investigated the growth of InGaN/GaN multiple quantum wells (MQWs) structures which emit blue light. The samples were grown in a low pressure metalorganic chemical vapor deposition system. We examined InGaN/GaN MQWs by varying growth temperatures and thicknesses of InGaN well and GaN barrier layers in MQWs. Especially, the thickness of GaN barrier in InGaN/GaN MQWs was found to severely affect the interfacial abruptness between InGaN well and GaN barrier layers. The higher order satellite peaks in the high resolution x-ray diffraction spectra and the high resolution cross sectional transmission electron microscope image of MQW structrues revealed that the interface between InGaN and GaN layers was very abrupt. Room-temperature photoluminescence spectra also showed a blue emission from InGaN/GaN MQWs at the wavelength of 463.5nm with a narrow full width at half maximum of 72.6meV.

• Korean Journal of Optics and Photonics
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• v.24 no.4
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• pp.176-183
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• 2013

In this paper, we report the design, fabrication and characterization of the 3-Dimensional optical receiver for a Laser Detection And Ranging (LADAR) system. The optical receiver is composed of three parts; $16{\pm}16$ Geiger Mode InGaAs Avalanche Photodiode (APD) array device operated at 1560 nm wavelength, Read Out Integrated Circuit (ROIC) measuring the Time-Of-Flight (TOF) of the return signal reflected from target objects, a package and cooler maintaining the proper operational condition of the detector and control electronics. We can confirm that the LADAR system can detect the signal from a target up to 1.2 km away, and it showed low Dark Count Rate (DCR) of less than 140 kHz, and higher than 28%-Photon Detection Efficiency (PDE). This is considered to be the best performance of the $16{\pm}16$ FPA APD optical receiver for a LADAR system.

• Journal of The Korean Astronomical Society
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• v.47 no.5
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• pp.167-178
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• 2014

We search for misclassified type 1 AGNs among type 2 AGNs identified with emission line flux ratios, and investigate the properties of the sample. Using 4 113 local type 2 AGNs at 0.02 < z < 0.05 selected from Sloan Digital Sky Survey Data Release 7, we detected a broad component of the $H{\alpha}$ line with a Full-Width at Half-Maximum (FWHM) ranging from 1 700 to $19090km\;s^{-1}$ for 142 objects, based on the spectral decomposition and visual inspection. The fraction of the misclassified type 1 AGNs among type 2 AGN sample is ~3.5%, implying that a large number of missing type 1 AGN population may exist. The misclassified type 1 AGNs have relatively low luminosity with a mean broad $H{\alpha}$ luminosity, log $L_{H\alpha}=40.50{\pm}0.35\;erg\;s^{-1}$, while black hole mass of the sample is comparable to that of the local black hole population, with a mean black hole mass, log $M_{BH}=6.94{\pm}0.51\;M_{\odot}$. The mean Eddington ratio of the sample is log $L_{bol}/L_{Edd}=-2.00{\pm}0.40$, indicating that black hole activity is relatively weak, hence, AGN continuum is too weak to change the host galaxy color. We find that the O III lines show significant velocity offsets, presumably due to outflows in the narrow-line region, while the velocity offset of the narrow component of the $H{\alpha}$ line is not prominent, consistent with the ionized gas kinematics of general type 1 AGN population.

• Journal of the Korean Society of Radiology
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• v.10 no.3
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• pp.215-222
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• 2016

X-ray mammography is the most effective method for the diagnosis of calcified lesions of various breast diseases. To reduce patient dose and to obtain optimal image required for diagnosis, the performance of the mammography system should be maintained continuously. Because the target (anode) angle of the X-ray tube is measured from the central X-ray, the effective angle can be slightly different in view of the position on the detector, which can result in degrading spatial resolution of the imaging within the field of view. In this study, we measured the MTF to examine spatial resolution for positions on the detector in the digital mammography system. For a tungsten wire of $50{\mu}m$ diameter, the highest spatial frequency was obtained. It meant that a wire diameter for measuring MTF through LSF should be small compared to the pixel size of the detector used in the mammography system. The spatial resolution showed slightly different performance according to positions on the detector. The center position gave the best spatial resolution and positions away from the center showed the degraded performance although the difference of the spatial resolution was small. The effective focal spot size of the full width at half maximum also showed similar result. It concluded that the slightly increase of the effective focal spot size gave the degradation of the spatial resolution for positions on the detector.