• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.18 no.6
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• pp.37-44
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• 2004

This paper represents a new approach for the protective relay of power transmission lines using a Artificial Neural Network(ANN). A different fault m transmission lines need to be detected classified and located accurately and cleared as fast as possible. However, The protection range of the distance relay is always designed on the basis of fixed settings, and unfortunately these approach do not have the ability to adapt dynamically to the system operating condition. ANN is suitable for the adaptive relaying and the detection of complex faults. The backpropagation algerian based multi-layer protection is utilized for the teaming process. It allows to make control to various protection functions. As expected, the simulation result demonstrate that this approach is useful and satisfactory.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.29 no.8
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• pp.98-103
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• 2015

Power plant is that very high reliability when industrial and economic impact on the overall electric power system is required, it is essential to improve the reliability, especially the fault prediction diagnosis. Since an accident caused by the partial discharge in the power plant is above state has a faster response characteristic than the other indications in the case of any, the partial discharge generated in the power plant immediately detect the deterioration of insulation due to the accident of the power plant and the non-drawn It should prevent or reduce. Partial Discharge Measuring Systems for UHV SF6 Gas Insulated Switchgear and power transformer on site installed has some probability of abnormal recognition in case of non-flexible deal with on site noise. Many methode to eliminate these kinds of noises, UHF Detection System is chosen as purchase description in Korea, but this system having a bandwidth between 500MHz 1.5GHz wide band. Initial install periods(about 20 years ago), this band had no strong signal source, but in these days this wide band have strong signals, such as LTE. So, module described in this paper is designed as simultaneously use with wide and narrow band for solve this noise problem, and introduce this system.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.413-413
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• 2010

In semiconductor manufacturing field, all equipments have various sensors to diagnosis the situations of processes. For increasing the accuracy of diagnosis, hundreds of sensors are emplyed. As sensors provide millions of data, the process diagnosis from them are unrealistic. Besides, in some cases, the results from some data which have same conditions are different. We want to find some information, such as data and knowledge, from the data. Nowadays, fault detection and classification (FDC) has been concerned to increasing the yield. Certain faults and no-faults can be classified by various FDC tools. The uncertainty in semiconductor manufacturing, no-faulty in faulty and faulty in no-faulty, has been caused the productivity to decreased. From the uncertainty, the rough set theory is a viable approach for extraction of meaningful knowledge and making predictions. Reduction of data sets, finding hidden data patterns, and generation of decision rules contrasts other approaches such as regression analysis and neural networks. In this research, a RGB sensor was used for diagnosis plasma instead of optical emission spectroscopy (OES). RGB data has just three variables (red, green and blue), while OES data has thousands of variables. RGB data, however, is difficult to analyze by human's eyes. Same outputs in a variable show different outcomes. In other words, RGB data includes the uncertainty. In this research, by rough set theory, decision rules were generated. In decision rules, we could find the hidden data patterns from the uncertainty. RGB sensor can diagnosis the change of plasma condition as over 90% accuracy by the rough set theory. Although we only present a preliminary research result, in this paper, we will continuously develop uncertainty problem solving data mining algorithm for the application of semiconductor process diagnosis.

• Journal of the Semiconductor & Display Technology
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• v.18 no.4
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• pp.30-34
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• 2019

We analyzed how the features in plasma information based virtual metrology (PI-VM) for SiO₂ etching depth with variation of 5% contribute to the prediction accuracy, which is previously developed by Jang. As a single feature, the explanatory power to the process results is in the order of plasma information about electron energy distribution function (PI_EEDF), equipment, and optical emission spectroscopy (OES) features. In the procedure of stepwise variable selection (SVS), OES features are selected after PI_EEDF. Informative vector for developed PI-VM also shows relatively high correlation between OES features and etching depth. This is because the reaction rate of each chemical species that governs the etching depth can be sensitively monitored when OES features are used with PI_EEDF. Securing PI_EEDF is important for the development of virtual metrology (VM) for prediction of process results. The role of PI_EEDF as an independent feature and the ability to monitor variation of plasma thermal state can make other features in the procedure of SVS more sensitive to the process results. It is expected that fault detection and classification (FDC) can be effectively developed by using the PI-VM.

• Current Photovoltaic Research
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• v.8 no.4
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• pp.114-119
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• 2020

In this study, Mitigation of Potential-induced degradation (PID) for PERC solar cells using SiO2 Structure of ARC layer. The conventional PID test was conducted with a cell-level test based on the IEC-62804 test standard, but a copper PID test device was manufactured to increase the PID detection rate. The accelerated aging test was conducted by maintaining 96 hours with a potential difference of 1000 V at a temperature of 60℃. As a result, the PERC solar cell of SiO2-Free ARC structure decreased 22.11% compared to the initial efficiency, and the PERC solar cell of the Upper-SiO2 ARC structure decreased 30.78% of the initial efficiency and the PID reliability was not good. However, the PERC solar cell with the lower-SiO2 ARC structure reduced only 2.44%, effectively mitigating the degradation of PID. Na+ ions in the cover glass generate PID on the surface of the PERC solar cell. In order to prevent PID, the structure of SiNx and SiO2 thin films of the ARC layer is important. SiO2 thin film must be deposited on bottom of ARC layer and the surface of the PERC solar cell N-type emitter to prevent surface recombination and stacking fault defects of the PERC solar cell and mitigated PID degradation.

• Journal of IKEEE
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• v.26 no.2
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• pp.257-264
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• 2022

As it takes a lot of time and money to develop an aircraft, an environment for renovating and using existing operating aircraft has been created. As a result, many old aircraft were renovated, and due to the aging of the aircraft, more demanding cable requirements were required for renovation projects, and as the number of equipment inside the aircraft gradually increased, the difficulty of system integration increased. In order to solve the difficulties of system integration through systematization of verification procedures, this paper explains VSWR, I-loss, which are the main indicators of antenna cable modification, and explains DTF, one of the problem detection methods. It also explains the elements required for cable design, the environment to be measured, and procedures, and introduces the overall process and effect of antenna cable improvement through demonstration cases.

• Geophysics and Geophysical Exploration
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• v.25 no.1
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• pp.1-13
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• 2022

For surveying shallow gas reservoirs in the Pohang basin, we proposed a seismic exploration method applicable to the transition zone in which land and marine areas are connected. We designed the seismic acquisition geometry considering both environments. We installed land nodal receivers on the ground and employed vibroseis and airgun sources in both land and marine areas. For seismic exploration in the transition zone, specific acquisition and processing techniques are required to ensure precise matching of reflectors at the boundary between the onshore and offshore regions. To enhance the continuity of reflection events on the seismic section, we performed amplitude and phase corrections with respect to the source types and applied a static correction. Following these processing steps, we obtained a seismic section showing connected reflectors around the boundary in the transition zone. We anticipate that our proposed seismic exploration method can also be used for fault detection in the transition zone.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.25 no.11
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• pp.1581-1587
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• 2021

As embedded system are used widely and variously, multi-edge system, which multiple edges gather and perform complex operations together, is actively operating. In a multi-edge system, it often occurs that an abnormal operation at one edge is transferred to another edge or the entire system goes down. It is necessary to determine and control edge anomalies in order to prevent system down, but this can be a heavy burden on the resource-limited edge. As a solution to this, we use power consumption data to check the state of the edge device and transmit it based on a QRcode to check and control errors at the server. The architecture proposed in this paper is implemented using 'chip-whisperer' to measure the power consumption of the edge and 'Raspberry Pi 3' to implement the server. As a result, the proposed architecture server showed successful data transmission and error determination without additional load appearing at the edge.

• Journal of Korea Society of Industrial Information Systems
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• v.14 no.5
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• pp.61-73
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• 2009

Many software reliability growth models(SRGM) have been proposed since the software reliability issue was raised in 1972. The technology to estimate and grow the reliability of developing S/W to target value during testing phase were developed using them. Most of these propositions assumed the S/W debugging testing efforts be constant or even did not consider them. A few papers were presented as the software reliability evaluation considering the testing effort was important afterwards. The testing effort forms which have been presented by this kind of papers were exponential, Rayleigh, Weibull, or Logistic functions, and one of these 4 types was used as a testing effort function depending on the S/W developing circumstances. I propose the methology to evaluate the SRGM using least square estimater and maximum likelihood estimater for those 4 functions, and then examine parameters applying actual data adopted from real field test of developing S/W.

• Proceedings of the Korea Information Processing Society Conference
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• 2021.05a
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• pp.505-508
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• 2021

반도체 회로의 미세화로 단위 공정이 증가하면 TAT(turn-around time) 증가에 따른 제조 비용이 늘어난다. 반도체 공정 중 포토 공정은 마스크의 회로를 웨이퍼에 전사하는 공정으로 전사를 담당하는 노광장비의 성능에 의해 회로의 정확성이 결정된다. 이런 정확성을 검증하는 계측공정은 회로의 미세화가 진행될수록 필요성은 증가하나 TAT 증가의 주된 요인으로 최근 기계학습을 사용한 다양한 예측 모형들의 개발로 계측 결과를 예측하는 실험들이 진행되고 있다. 본 논문은 노광장비 센서들의 이상값을 감지하여 분류 후 계측공정을 진행하는 LFDC(Lithography Fault Detection and Classification) 시스템의 문제인 분류 성능이 떨어지는 것을 해결하기 위해 XGBoost를 사용하여 계측공정을 진행하지 않고 노광장비 센서의 이상값을 학습된 학습기를 통해 분류하여 포토 공정을 재진행하거나 다음 공정을 진행하는 방법을 실험하였다. 실험에서 사용된 계측 결과 예측 모형은 89%의 정확도를 확보하였고 반도체 데이터 특성인 심각한 불균형의 데이터에 대해서도 같은 정확도를 얻었다. 이런 결과는 노광장비 센서들의 이상값에 대해 89%는 정상으로 판단하였고 정상으로 판단한 웨이퍼를 실제 계측 시 예측과 같은 결과를 얻었다. 계측 결과 예측 모형을 사용하면 실제 계측을 진행하지 않고 노광장비 센서들의 이상값에 대한 판정을 할 수 있어 TAT 단축으로 제조 비용감소, 계측 장비 부하 감소 및 효율 향상을 할 수 있다. 하지만 본 논문에서는 90%의 성능을 보이는 계측 결과 예측 모형으로 여전히 10%에 대해서는 실제 계측이 필요한 문제에 대해 추후 더 연구가 필요하다.