• Title/Summary/Keyword: electron carrier

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Hydrogen Metabolism in Clostridium acetobutylicum Fermentation

  • J.Gregory Zeikus
    • Journal of Microbiology and Biotechnology
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    • v.2 no.4
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    • pp.248-254
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    • 1992
  • The initial growth of Clostridium acetobutylicum was not inhibited by 1 atm of H$_2$ while H$_2$ reduced glucose consumption in a solventogenic culture of a phosphate limited 2-stage chemostat. Under 1 atm of H$_2$, a solventogenic culture consumed hydrogen, but an acidogenic culture produced hydrogen. H$_2$ consumption by the solventogenic culture was enhanced by the addition of 5 mM neutral red, an artificial electron carrier with a redox potential of -325 mV. Hydrogenase activity, measured in both directions of production and consumption, showed that activity coupled with methyl viologen is higher in an acidogenic culture than in a solventogenic culture, and that the two cultures have similar activities for methylene blue reduction. The solventogenic culture showed a higher activity coupled with neutral red than the acidogenic culture. From these results, it is hypothesized that hydrogen producing hydrogenase activity is high during the acidogenic phase, and decreases as solventogenesis starts, and that the solventogenic culture produces a second hydrogenase which uses an electron carrier other than ferredoxin. This hypothesis was supported by the fact that enzyme activities involved in electron flow can be coupled to neutral red, indepedent of ferredoxin, and that neutral red addition to the fermentation system increased butanol yield, with a decrease in production of less reduced fermentation products, and $H^2$.

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Study on the Trap Parameters according to the Nitridation Conditions of the Oxide Films (산화막의 질화 조건에 따른 트랩 파라미터에 관한 연구)

  • Yoon, Woon-Ha;Kang, Seong-Jun;Joung, Yang-Hee
    • The Journal of the Korea institute of electronic communication sciences
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    • v.11 no.5
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    • pp.473-478
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    • 2016
  • In this paper, the MIS(: Metal-Insulator-Semiconductor) Capacitor with the nitrided-oxide by RTP are fabricated to investigate the carrier trap parameters due to avalanche electron injection. Two times turn-around phenomenon of the flatband voltage shift generated by the avalanche injection are observed. This shows that electron trapping occurs in the oxide film at the first stage. As the electron injection increases, the first turn-around occures due to a positive charge in the oxide layer. After further injection, the curves turns around once again by electron captured. Based on the experimental results, the carrier trapping model for system having multi-traps is proposed and is fitting with experimental data in order to determine trap parameter of nitrided-oxide.

Analysis of Facilitied Transport through Fixed Site Carrier Membranes

  • Kang, Yong-Soo;Hong, Jae-Min;Kim, Un-Young
    • Proceedings of the Membrane Society of Korea Conference
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    • 1995.09a
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    • pp.57-71
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    • 1995
  • A simple mathematical model for gacilitated mass transport with a fixed site carrier membrane was derived by assuming an instantaneous, microscopic concentration (activity) fluctuation, The concentration fluctuation, developed due to reversible chemical reaction between carrier and solute, could acuse the higher chemical potential gradient and the facilitated transport. For mathematical formulation, an analogy was employed between the mass transfer for the facilitated transport with fixed site carrier membrane and the electron transfer in a parallel resistor-capacitor (RC) circuit. For the single RC model, it was assumed that a single capacitor represented the total carrier and a solute could not inter-diffuse between matrix and carrier, allowing only two diffusional pathways, This assumption was relaxed by adopting a serial combination of the parallel RC circuit. Here, a solute diffuses in two elements (matrix or carrier) can exchange its pathway, exhibiting four diffusional pathways. The current models were examined against experimental data and the agreement was exceptional.

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The analysis on TMA gas-sensing characteristics of ZnO thin film sensors (ZnO 막막 센서의 TMA 가스 검지 특성 분석)

  • 류지열;박성현;최혁환;김진섭;이명교;권태하
    • Journal of the Korean Institute of Telematics and Electronics D
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    • v.34D no.12
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    • pp.46-53
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    • 1997
  • The TMA gas sensors are fabricated with the ZnO-based thin films grown by a RF magnetron sputtering method. The hall effect measurement and AES analysis are carried out to investigate the effects of the sputtering gases and dopants which effect on the electrical resistivity and sensitivity to TMA gas. We measure the cfhanges of the surface carrier concentration, haall electron mobility, electrical resistivity, surface condition, and depth profile of the films. The ZnO-based thin film sensors sputtered in oxygen, or added with dopants showed a high sruface carrier concentration, film sensors sputtered in oxygen and doped with 4.0 wt.% $Al_{2}$O$_{3}$, 1.0 wt.% TiO$_{2}$, and 0.2 wt% v$_{2}$O$_{5}$ showed the highest surface carrier concentration of 5.952 * 10$^{20}$ cm$^{-3}$ , hall electron mobility of 176.7 cm$^{2}$/V.s, lowest electrical resistivity of 6*10$^{-5}$ .ohm.cm and highest sensitivity of 12. These results were measured at a working temperature of 300.deg. C to 8 ppm TMA gas.

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Hot carrier effects and device degradation in deep submicrometer PMOSFET (Deep submicrometer PMOSFET의 hot carrier 현상과 소자 노쇠화)

  • 장성준;김용택;유종근;박종태;박병국;이종덕
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.33A no.4
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    • pp.129-135
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    • 1996
  • In this paper, the hot carrier effect and device degradation of deep submicrometer SC-PMOSFETs have been measured and characterized. It has been shown that the substrate current of a 0.15$\mu$m PMOSFET increases with increasing of impact ionization rate, and the impact ionization rate is a function of the gate length and gate bias voltage. Correlation between gate current and substrate current is investigated within the general framework of the lucky-electron. It is found that the impact ionization rate increases, but the device degradation is not serious with decreasing effective channel length. SCIHE is suggested as the possible phusical mechanism for enhanced impact ionization rate and gate current reduction. Considering the hot carrier induced device degradation, it has been found that the maximum supply voltage is about -2.6V for 0.15$\mu$m PMOSFET.

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A Preparation of Copper Phthalocyanine Photoreceptor by an Aqueous Coating Method and Study of Dark Decay and Photoinjection Efficiency (신규 제작법을 이용한 Copper Phthalocyanine 전자사진 감광체의 개발과 Dark Decay와 Photoinjection Efficiency에 관한 연구)

  • 이상남
    • Journal of the Korean Graphic Arts Communication Society
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    • v.11 no.1
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    • pp.103-122
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    • 1993
  • A cause and counterplan of the increase in dark decay rate of$\varepsilon$-CuPc/PVCz photoreceptor which is consist of the carrier generation layer (CGL) of$\varepsilon$type copper phthalocyanine ($\varepsilon$-CuPc) thin film by an aqueous coating method and the carrier transport layer (CTL) of polyvinylcarbazol (PVCz) by spin coating, are studied in this paper. Electrochemical deposition of CGL was accompanied by an increase in work function of the aluminium substrate during the processes and the enhanced work function 5.3 eV rose above the ionization potential 5.16 eV of $\varepsilon$-CuPc. This resulted in the increased injection of holes from substrate into CGL and a fast dark decay rate. Improved photoreceptor, an electron-transport $\varepsilon$-CuPc/TNF photoreceptor, led to lowing of dark decay rate and increasing of photosensitivity. The carrier generation efficiency (ηg), carrier injection efficiency (ηi) and xerographic gain (G) of the $\varepsilon$-CuPc/TNF photoreceptor were obtained by XTOF method and PIDC.

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Numerical Analysis of OLED Luminescence Efficiency by Hole Transport Layer Change (유기발광 소자의 수송층 두께 변화에 따른 수치적 해석)

  • Lee, Jung-Ho
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.17 no.12
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    • pp.1341-1346
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    • 2004
  • The OLED research is gone for two directions. One is material development research, and another one is structural improvement part. All two are thing to heighten luminescence efficiency of OLED. n other to improve luminescence efficiency of OLED Electron - hole pairs must consist much more in the device Their profiles are sensitive to mobility velocity of electrons and holes. In this paper, we demonstrate the difference of velocity between hole and electron by experiments, and compare with a data of simulation and experiment changing hole carrier transport layer thickness, so we get the optimal we improve luminescence efficiency. We suggest improving the efficiency of OLEDS would be to balance the injection of electrons and holes into light emission layer of the device. And, we improve understanding of the various luminescence efficiency through experiments and numerical analysis of luminescence efficiency in variable hole carrier transport layer's thickness.

High Performance Thin-Film Transistors Based on Zinc Oxynitride Semiconductors: Experimental and First-Principles Studies

  • Kim, Yang-Soo;Kim, Jong Heon;Kim, Hyun-Suk
    • Korean Journal of Materials Research
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    • v.26 no.1
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    • pp.42-46
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    • 2016
  • The properties of zinc oxynitride semiconductors and their associated thin film transistors are studied. Reactively sputtered zinc oxynitride films exhibit n-type conduction, and nitrogen-rich compositions result in relatively high electron mobility. Nitrogen vacancies are anticipated to act as shallow electron donors, as their calculated formation energy is lowest among the possible types of point defects. The carrier density can be reduced by substituting zinc with metals such as gallium or aluminum, which form stronger bonds with nitrogen than zinc does. The electrical properties of gallium-doped zinc oxynitride thin films and their respective devices demonstrate the carrier suppression effect accordingly.

The moving photocarrier grating technique for the determination of transport parameters in a-Se:As films

  • Park, Chang-Hee;Lee, Kwang-Sei;Kim, Jae-Hyung;Nam, Sang-Hee
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2005.11a
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    • pp.47-48
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    • 2005
  • The moving photocarrier grating(MPG) technique for the determination of the carrier mobilities and the recombination lifetime in a-Se:As films have been studied. The electron and hole drift mobility and the recombination lifetime of a-Se films with arsenic (As) additions have been obtained. We have found an increase in hole drift mobility and recombination lifetime, especially when 0.3% As is added into a-Se film. However, the electron mobility exhibits no observable change up to 0.5% As addition in a-Se films.0.3% As added a-Se film also exhibits the maximum short circuit current densities per laser intensity of $5.29\times10^{-7}$ A/W.

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Recent Progress in Flexible Perovskite Solar Cell Development

  • Ren, Xiaodong;Jung, Hyun Suk
    • Journal of the Korean Ceramic Society
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    • v.55 no.4
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    • pp.325-336
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    • 2018
  • Perovskite solar cells (PSCs) are a new class of photovoltaic devices, which have attracted significant attention due to their remarkable optoelectrical properties, including high absorption coefficients, high carrier mobilities, long carrier diffusion lengths, tunable bandgaps, low cost, and facile fabrication. PSCs have reached efficiencies of 22.70% and 18.36% on rigid fluorine-doped tin oxide and poly(ethylene terephthalate) substrates, respectively; these are comparable to those of single-crystal silicon and copper-indium-gallium-selenium solar cells. Over the past eight years, the photo conversion efficiency of PSCs has been significantly improved by device-architecture adjustments, and absorber and electron/hole transport layer optimization. Each layer is important for the performance of PSCs; hence, we discuss achievements in flexible perovskite solar cells (FPSCs), covering electron/hole-transport materials, electrode materials. We give a comprehensive overview of FPSCs and put forward suggestions for their further development.