• 한국전자파학회논문지
• /
• 제14권5호
• /
• pp.458-465
• /
• 2003

본 논문에서는 3차원 유전체로부터의 전자기 과도 응답을 해석하기 위하여 시간 영역 전장 적분방정식을 이용한 새로운 해법을 제안한다. 이를 위하여 공간 및 시간 시험 과정으로 분리한 갤러킨 방법을 적용한다. 3차원임의 형태의 유전체 표면을 삼각형으로 분할한 다음, 공간에 대한 등가 전류의 전개 및 시험 함수로서 삼각형 벡터 함수를 사용한다. 시간 영역의 미지 계수를 라게르 함수로부터 유도된 기저함수로 근사하며, 이 함수를 시간 영역의 시험 함수로도 사용한다 제안된 방법에 의하여 계산된 등가 전류 및 원거리장의 수치 결과들을 제시한다.

• 한국전기전자재료학회논문지
• /
• 제31권2호
• /
• pp.80-84
• /
• 2018

In this study, we investigated plasmon effects to maximize the sterilization of dielectric discharge. We predicted the effect using the finite difference time domain (FDTD) method as a function of electrode shape, size, and period. The structure of the electrode was designed with a thickness of 100 nm of silver nanoparticles on a glass substrate, and was varied according to the shape, size, and period of the electrode hole. Based on the results, it was confirmed that the effect of plasmons was independent of the shape of the electrode hole. It was thus confirmed that the plasmon effect depended only on the size and period of the holes. Further, the plasmon effect was affected by the size rather than period of the holes. Because the absorption of light by the metal varied according to the size of the hole, the plasmon effect generated by the absorption of light also varied. The best results were obtained when the radius and period of the electrode holes were $0.1{\mu}m$ and $0.4{\mu}m$, respectively.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2001년도 하계학술대회 논문집
• /
• pp.689-692
• /
• 2001

In this paper, the pizoelectric and dielectric properties of 0.95Pb(ZrxTil-x)O$_3$- 0.05Pb(Mn$\_$0.2/Fe$\_$0.4/W$\_$0.4/)O$_3$piezoelectric ceramics is investigated as a function of Zr/Ti mole ratio. Also, MPB(Morphotropic Phase Boundary) and optimal sintering temperature is studied using XRD and SEM. As a results, when Zr/Ti mole ratio is 52/48, electromechanical coupling factor, k$\_$p/, is 58[%], permittivity, $\varepsilon$$\^$T/$\_$33//$\varepsilon$0, is 1360 and piezoelectric strain constant, d$\_$33/ is 265[pC/N] and the piezoelectric and dielectric properties become maximum. Phase transition temperature of its ternary piezoelectric system is about 350[$^{\circ}C$]. From the XRD analysis, when Zr/Ti mole ratio is 52/48, tetragonal phase transits to rhombohedral phase. Also, From measuring results of the sintering density, when sintering temperature is 1050[$^{\circ}C$], sintering density become maximum and is about 7930[kg/㎥], and average grain size is about 2-3[$\mu\textrm{m}$].

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2002년도 하계학술대회 논문집 Vol.3 No.2
• /
• pp.597-600
• /
• 2002

Electrical properties of $\{(Sr_xCa_{1-x})_{0.95-y-z}Bi_2Pb_{0.05+y}\})Ti_{1.02}O_3$ ceramic were studied as a function of Sr/Ca ratio and Bi, Pb contents. Dielectric properties of specimens with different x, y, z values were explained in terms of ionic polarizability with Molecular Additionally Rules and Clausius-Mosotti equation. For the composition of $\{(Sr_{0.62}Ca_{0.38})_{0.90}Bi_{0.01}Pb_{0.09}\})Ti_{1.02}O_3$ and $\{(Sr_{0.62}Ca_{0.38})_{0.905}Bi_{0.015}Pb_{0.08}\})Ti_{1.02}O_3$, dielectric constant$({\varepsilon}_r)$, quality factor(Q) and temperature coefficient(TC) were 389, 3048, -1490 and 394, 1869, -1340 at 1MHz, respectively.

• 한국세라믹학회지
• /
• 제29권1호
• /
• pp.29-34
• /
• 1992

Phase transition, dielectric properties, and leakage current characteristics of Ta2O5 thin film fabricated by sol-gel process with tantalum penta-n-butoxide were studied as a function of annealing temperature in O2 atmoshpere. Although Ta2O5 thin film annealed at temperatures below 700$^{\circ}C$ for 1 hr was amorphous, it was crystallized to ${\beta}$-Ta2O5 of orthorhombic phase by annealing at temperatures higher than 750$^{\circ}C$. With increasing annealing temperature from 500$^{\circ}C$ to 900$^{\circ}C$, dielectric constant of sol-gel processed Ta2O5 thin film was changed from 17.6 to 15.3 due to the increase of SiO2 thickness at Ta2O5/Si interface. For Ta2O5 thin film annealed at 500$^{\circ}C$ to 800$^{\circ}C$ for 1 hr in O2 atmosphere, leakage current was remarkably reduced and breakdown strength was increased with higher annealing temperature. For Ta2O5 film annealed at 800$^{\circ}C$, breakdown did not occur even at electric field strength of 30${\times}$105V/cm and leakage current was maintained lower than 10-8A/$\textrm{cm}^2$.

• 세라미스트
• /
• 제23권1호
• /
• pp.101-109
• /
• 2020

In this study, the phase transition behaviors of lead-free (Na_1/2Bi_1/2TiO₃)_(1-x)-(BaTiO₃)_x (NBT-BT) are investigated by using Brillouin spectroscopy. The elastic properties, sound velocity and absorption coefficient of NBT-BT are characterized as a function of temperature along different crystallographic axes. The temperature dependences of the elastic constants of NBT-BT near the morphotropic phase boundary are determined for the first time. The unpoled NBT-BT single crystals exhibits the typical relaxor behaviors, presenting broad acoustic and dielectric anomalies. The application of electric field induced discontinuous changes in the elastic properties at ~110℃, which indicates field-induced phase transition occurred. The electric field also changes the dielectric constant from more relaxor-like to ferroelectric-like dielectric behavior.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2002년도 하계학술대회 논문집
• /
• pp.362-365
• /
• 2002

Hf thin films were deposited on bottom metal using a RF magnetron sputtering method followed by oxidation and annealing in O$_2$ and N$_2$ ambient, respectively. Various top metal electrodes (i.e., Al, Au, and Cu) were deposited by evaporation, and their roles on physical and electrical properties were investigated. Using the XRD, SEM and AFM techniques, we confirmed that the grain size of HfO$_2$ thin films enlarges as a function of oxidation temperature, increasing dielectric constant. However, other electrical properties (e.g., tan) deteriorateas a consequence. The dielectric constant and tan of HfO$_2$ thin films oxidized at 500 $^{\circ}C$ were 17-25 and 3${\times}$10-3 - 2x10-2, respectively, in the frequency range of 1 Hz to 1 MHz. The leakage current density was less than 1${\times}$10-8A/cm2 up to 0.7 MV/cm. In addition, electrical properties of HfO$_2$ thin films (e.g., the dielectric constant, leakage current and tan $\delta$) depend on top metal electrode. We showed that Al top metal electrode results in the best result.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 2001년도 하계학술대회 논문집 C
• /
• pp.1439-1441
• /
• 2001

In this paper, the piezoelectric and dielectric properties as a function of x and r in $yPbZr_xTi_{1-x}O_3-(1-y)Pb(Mn_{1/3}Nb_{2/3})O_3$ piezoelectric ceramics is investigated. As a results, when y is 0.95 and x is 0.505, electromechanical coupling factor($k_p$), permittivity(${{\varepsilon}_{33}}^T/{\varepsilon}_0$), piezoelectric strain constant($d_{33}$) and mechanical quality factor($Q_m$) are 58[%], 1520, 272 [pC/N] and 1550, respectively. From XRD analysis, when x is 0.505, it is MPB which present rhombohedral and tetragonal phase in same quantity. Also, From SEM observation. when sintering temperature is 1150[$^{\circ}C$], grain size is about 2 [${\mu}m$]. As y decreases, piezoelectric and dielectric properties and curie temperature decreases, but mechanical quality factor and sintering temperature increases.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 2001년도 하계학술대회 논문집 C
• /
• pp.1493-1495
• /
• 2001

$(Ba_{0.6-x}Sr_{0.4}Ca_x)TiO_3+yAl_2O_3$ wt% (x=0.10, 0.15, 0.20, y=0.5 $\sim$ 3.0) specimens were fabricated by the mixed-oxide method and then the structural properties as a function of the composition ratio and $Al_2O_3$ contents were studied. All BSCT specimens showed dense and homogeneous structure without the presence of the seconds phase. The sintered density was decreased with increase ad $Al_2O_3$ content. The Curie temperature and dielectric constant at room temperature decreased with increasing $Al_2O_3$ content. The dielectric constant and dielectric loss of the doped-0.5 wt% $Al_2O_3$ BSCT(50/40/10) specimen were about 3131 and 0.932% at 1KHz, respectively.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 1998년도 하계학술대회 논문집 D
• /
• pp.1453-1455
• /
• 1998

$Ba(Mg,Ta)O_3-Ba(Co,Nb)O_3$ ceramics were prepared by the conventional mixed oxide method. The ceramics were sintered at the temperature of 1500-$1575^{\circ}C$ for 5[hr.] in air. The crystal structure was investigated by the XRD. The microstructure of the ceramics were observed by SEM. The microwave properties of dielectric resonators were investigated as a function of composition and sintering temperature. $Ba(Mg,Ta)O_3-Ba(Co,Nb)O_3$ ceramics have a structure of complex perovskite type, and have peaks of (101),(102),(201),(202) and (212). In the case of the $0.7Ba(Mg,Ta)O_3-0.3Ba(Co,Nb)O_3$ ceramic resonator, dielectric constant, quality factor and temperature coefficient of resonant frequency(TCRF, ${\tau}_l$) were a good value of 26.5, 11.500 at 10[GHz] and -1.3[ppm/$^{\circ}C$] from $25^{\circ}C$ to $60^{\circ}C$, respectively.