• 제목/요약/키워드: degradation reliability

검색결과 541건 처리시간 0.023초

가속 모델에 기초한 열화 데이터의 신뢰성 해석 -가정용 영상 재생기에 사용되는 광센서를 중심으로- (Reliability Analysis of Degradation Data Based on Accelerated Model -With Photointerrupter Used in Home VCR(Video Cassette Recorder)-)

  • 권수호;허양현;임태진
    • 산업공학
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    • 제12권3호
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    • pp.448-457
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    • 1999
  • Accelerated degradation is concerned with models and data analyses for degradation of product performance over time at overstress and design conditions. Although there have been numerous studies with accelerated degradation theory in reliability, very few actually apply to parametric statistical analyses. This paper shows how to analyze degradation data, provides tests for how well the assumptions hold. Reel sensors, a sort of photointerrupters in home VCR, hive been tested, and least-square analyses are used to illustrate our approach. Tests for linearity of the performance-time relationship, dependence of the lognormal distribution, and the standard deviation on time are performed. The mean life of tested sensors is assessed at about 414,000 hours, and the Arrhenius activation energy of this reaction is concluded to be 0.39 eV as results.

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비선형 확률계수모형을 고려한 최적 열화시험 설계 (Optimal Degradation Experimental Design in Non-Linear Random Coefficients Models)

  • 김성준;배석주
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제9권1호
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    • pp.13-28
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    • 2009
  • In this paper we propose a method for designing optimum degradation test based on nonlinear random-coefficients models. We use the approximated expression of the Fisher information matrix for nonlinear random-coefficients models. We apply the simplex algorithm to the inverse of the determinant of Fisher information matrix to satisfy the D-optimal criterion. By comparison of the results from PDP degradation data, we suggest a general guideline to obtain optimum experimental design for determining inspection intervals and number of samples in degradation testing.

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Design of bivariate step-stress partially accelerated degradation test plan using copula and gamma process

  • Srivastava, P.W.;Manisha, Manisha;Agarwal, M.L.
    • International Journal of Reliability and Applications
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    • 제17권1호
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    • pp.21-49
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    • 2016
  • Many mechanical, electrical and electronic products have more than one performance characteristics (PCs). For example the performance degradation of rubidium discharge lamps can be characterized by the rubidium consumption or the decreasing intensity the lamp. The product may degrade due to all the PCs which may be independent or dependent. This paper deals with the design of optimal bivariate step-stress partially accelerated degradation test (PADT) with degradation paths modelled by gamma process. The dependency between PCs has been modelled through Frank copula function. In partial step-stress loading, the unit is tested at usual stress for some time, and then the stress is accelerated. This helps in preventing over-stressing of the test specimens. Failure occurs when the performance characteristic crosses the critical value the first time. Under the constraint of total experimental cost, the optimal test duration and the optimal number of inspections at each intermediate stress level are obtained using variance optimality criterion.

OLED TV Panel의 전류가속열화시험 설계 (Electric Current Accelerated Degradation Test Design for OLED TV)

  • 유지선;이득중;오창석;장중순
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제17권1호
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    • pp.22-27
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    • 2017
  • Purpose: The purpose of this study is to estimate the life time of OLED TV panel through electric current ADT(Accelerated Degradation Test). Methods: We performed accelerated degradation test for OLED TV Panel at the room temperature to avoid high temperature impact on the luminance. Results: we got more accurately the life time of the OLED TV when we applied ADT without temperature factor than including both current and temperature. Conclusion: Until now, the ADT of the OLED TV has been conducted with temperature and current at the same time for reducing test time and costs. We estimate incorrect life time when the temperature is adopted as an accelerated factor. Due to the high temperature impact on the luminance of the OLED TV panel. So as to solve this problem, we discard temperature and use electric current only.

열화가 Wiener process를 따르는 경우의 비용을 고려한 가속열화시험 계획 (Optimal Design of Accelerated Degradation Tests under the Constraint of Total Experimental Cost in the Case that the Degradation Characteristic Follows a Wiener Process)

  • 임헌상
    • 품질경영학회지
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    • 제40권2호
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    • pp.117-125
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    • 2012
  • For the highly reliable products, an accelerated degradation test (ADT) is a useful tool which has been employed in industry to obtain reliability-related information within an affordable amount of time and cost. In an ADT, as all other reliability tests, it is important to carefully design the ADT beforehand to obtain estimates of the quantities of interest as precisely as possible. In this paper, optimal ADTs are developed assuming that the constant-stress loading method is employed and the degradation characteristic follows a Wiener process. Under the constraint that the total cost does not exceed a pre-specified budget, the stress levels, the number of test units allocated to each stress level and the number of measurement (termination time) are determined such that the asymptotic variance of the maximum likelihood estimator of the q-th quantile of the lifetime distribution at the use condition is minimized.

철도차량 추진제어장치의 스트레스 분석 및 열화 메커니즘 (Stress Analysis and Degradation Mechanism of the Drive Control system for a Railway carriage)

  • 김기준;왕종배;최영찬
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2000년도 제2회 학술대회 논문집 일렉트렛트 및 응용기술전문연구회
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    • pp.21-24
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    • 2000
  • Traction motors driven by several type inverters have been subjected to increasing demands for higher operating temperature, more demands for duty cycles, higher starting current, frequent voltage transients and finally severe environmental exposure. For applications to inverter duty, traction motors needs a special insulation system, which has characteristics of increased bond strength, lower operating temperature and higher turn-to-tum insulation. Also it needs major contributors to insulation life and reliability of motors, which more considered by temperature, voltage, frequency, rise time, pulse configuration, wire thickness and insulation materials. In this paper, to evaluate of reliability and expected life, it is analyzed the several stresses and their degradation mechanism on insulation system of AC traction motor.

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휴대전자기기용 저용량 리튬이온 배터리의 충방전 열화 기구 분석 및 모니터링 (Evaluation and monitoring of degradation mechanism of Li-ion battery for portable electronic device)

  • 변재원
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제13권2호
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    • pp.129-140
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    • 2013
  • As a fundamental experimental study for reliability improvement of lithium ion secondary battery, degradation mechanism was investigated by microscopic observation and acoustic emission monitoring. Microstructural observation of the decomposed battery after cycle test revealed mechanical and chemical damages such as interface delamination, microcrack of the electrodes, and solid electrolyte interphase (SEI). Acoustic emission (AE) signal was detected during charge and discharge of lithium ion battery to investigate relationships among cumulative count, discharge capacity, and microdamages. With increasing number of cycle, discharge capacity was decreased and AE cumulative count was observed to increase. Observed damages were attributed to sources of the detected AE signals.

Wiener Process 및 D-Optimality 조건 하에서 계단형 가속열화시험 설계 (Design of Step-Stress Accelerated Degradation Test based on the Wiener Process and D-Optimality Condition)

  • 김헌길;박재훈;성시일
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제17권2호
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    • pp.129-135
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    • 2017
  • Purpose: This article provides step-stress accelerated degradation test (ADT) plans based on the Wiener process. Method: Step-stress levels and the stress change times are determined based on the D-optimality criteria to develop test plans. Further, a simple grid search method is provided for obtaining the optimal test plan. Results: Based on the solution procedure, ADT plans which include the stress levels and change times are developed for conducting the reliability test. Conclusion: Optimal step-stress ADT plans are provided for the case where the number of measurements is small.

회로 레벨의 신뢰성 시뮬레이션 및 그 응용 (Circuit-Level Reliability Simulation and Its Applications)

  • 천병식;최창훈;김경호
    • 전자공학회논문지A
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    • 제31A권1호
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    • pp.93-102
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    • 1994
  • This paper, presents SECRET(SEC REliability Tool), which predicts reliability problems related to the hot-carrier and electromigration effects on the submicron MOSFETs and interconnections. To simulate DC and AC lifetime for hot-carrier damaged devices, we have developed an accurate substrate current model with the geometric sensitivity, which has been verified over the wide ranges of transistor geometries. A guideline can be provided to design hot-carrier resistant circuits by the analysis of HOREL(HOT-carrier RFsistant Logic) effect, and circuit degradation with respect to physical parameter degradation such as the threshold voltage and the mobility can also be expected. In SECRET, DC and AC MTTF values of metal lines are calculated based on lossy transmission line analysis, and parasitic resistances, inductances and capacitances of metal lines are accurately considered when they operate in the condition of high speed. Also, circuit-level reliability simulation can be applied to the determination of metal line width and-that of optimal capacitor size in substrate bias generation circuit. Experimental results obtained from the several real circuits show that SECERT is very useful to estimate and analyze reliability problems.

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An iterative hybrid random-interval structural reliability analysis

  • Fang, Yongfeng;Xiong, Jianbin;Tee, Kong Fah
    • Earthquakes and Structures
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    • 제7권6호
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    • pp.1061-1070
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    • 2014
  • An iterative hybrid structural dynamic reliability prediction model has been developed under multiple-time interval loads with and without consideration of stochastic structural strength degradation. Firstly, multiple-time interval loads have been substituted by the equivalent interval load. The equivalent interval load and structural strength are assumed as random variables. For structural reliability problem with random and interval variables, the interval variables can be converted to uniformly distributed random variables. Secondly, structural reliability with interval and stochastic variables is computed iteratively using the first order second moment method according to the stress-strength interference theory. Finally, the proposed method is verified by three examples which show that the method is practicable, rational and gives accurate prediction.