• Title/Summary/Keyword: column-parallel ADC

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Capacitor Ratio-Independent and OP-Amp Gain-Insensitive Algorithmic ADC for CMOS Image Sensor (커패시터의 비율과 무관하고 OP-Amp의 이득에 둔감한 CMOS Image Sensor용 Algorithmic ADC)

  • Hong, Jaemin;Mo, Hyunsun;Kim, Daejeong
    • Journal of IKEEE
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    • v.24 no.4
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    • pp.942-949
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    • 2020
  • In this paper, we propose an improved algorithmic ADC for CMOS Image Sensor that is suitable for a column-parallel readout circuit. The algorithm of the conventional algorithmic ADC is modified so that it can operate as a single amplifier while being independent of the capacitor ratio and insensitive to the gain of the op-amp, and it has a high conversion efficiency by using an adaptive biasing amplifier. The proposed ADC is designed with 0.18-um Magnachip CMOS process, Spectre simulation shows that the power consumption per conversion speed is reduced by 37% compared with the conventional algorithmic ADC.

High Frame Rate VGA CMOS Image Sensor using Three Step Single Slope Column-Parallel ADCs

  • Lee, Junan;Huang, Qiwei;Kim, Kiwoon;Kim, Kyunghoon;Burm, Jinwook
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.15 no.1
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    • pp.22-28
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    • 2015
  • This paper proposes column-parallel three step Single Slope Analog-to-Digital Converter (SS-ADC) for high frame rate VGA CMOS Image Sensors (CISs). The proposed three step SS-ADC improves the sampling rate while maintaining the architecture of the conventional SS-ADC for high frame rate CIS. The sampling rate of the three-step ADC is increased by a factor of 39 compared with the conventional SS-ADC. The proposed three-step SS-ADC has a 12-bit resolution and 200 kS/s at 25 MHz clock frequency. The VGA CIS using three step SS-ADC has the maximum frame rate of 200 frames/s. The total power consumption is 76 mW with 3.3 V supply voltage without ramp generator buffer. A prototype chip was fabricated in a $0.13{\mu}m$ CMOS process.

A Single-Bit 2nd-Order Delta-Sigma Modulator with 10-㎛ Column-Pitch for a Low Noise CMOS Image Sensor (저잡음 CMOS 이미지 센서를 위한 10㎛ 컬럼 폭을 가지는 단일 비트 2차 델타 시그마 모듈레이터)

  • Kwon, Min-Woo;Cheon, Jimin
    • The Journal of Korea Institute of Information, Electronics, and Communication Technology
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    • v.13 no.1
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    • pp.8-16
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    • 2020
  • In this paper, a single-bit 2nd-order delta-sigma modulator with the architecture of cascaded-of-integrator feedforward (CIFF) is proposed for column-parallel analog-to-digital converter (ADC) array used in a low noise CMOS image sensor. The proposed modulator implements two switched capacitor integrators and a single-bit comparator within only 10-㎛ column-pitch for column-parallel ADC array. Also, peripheral circuits for driving all column modulators include a non-overlapping clock generator and a bias circuit. The proposed delta-sigma modulator has been implemented in a 110-nm CMOS process. It achieves 88.1-dB signal-to-noise-and-distortion ratio (SNDR), 88.6-dB spurious-free dynamic range (SFDR), and 14.3-bit effective-number-of-bits (ENOB) with an oversampling ratio (OSR) of 418 for 12-kHz bandwidth. The area and power consumption of the delta-sigma modulator are 970×10 ㎛2 and 248 ㎼, respectively.

Design and Evaluation of a CMOS Image Sensor with Dual-CDS and Column-parallel SS-ADCs

  • Um, Bu-Yong;Kim, Jong-Ryul;Kim, Sang-Hoon;Lee, Jae-Hoon;Cheon, Jimin;Choi, Jaehyuk;Chun, Jung-Hoon
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.17 no.1
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    • pp.110-119
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    • 2017
  • This paper describes a CMOS image sensor (CIS) with dual correlated double sampling (CDS) and column-parallel analog-to-digital converter (ADC) and its measurement method using a field-programmable gate array (FPGA) integrated module. The CIS is composed of a $320{\times}240$ pixel array with $3.2{\mu}m{\times}3.2{\mu}m$ pixels and column-parallel 10-bit single-slope ADCs. It is fabricated in a $0.11-{\mu}m$ CIS process, and consumes 49.2 mW from 1.5 V and 3.3 V power supplies while operating at 6.25 MHz. The measured dynamic range is 53.72 dB, and the total and column fixed pattern noise in a dark condition are 0.10% and 0.029%. The maximum integral nonlinearity and the differential nonlinearity of the ADC are +1.15 / -1.74 LSB and +0.63 / -0.56 LSB, respectively.

Low-Power CMOS image sensor with multi-column-parallel SAR ADC

  • Hyun, Jang-Su;Kim, Hyeon-June
    • Journal of Sensor Science and Technology
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    • v.30 no.4
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    • pp.223-228
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    • 2021
  • This work presents a low-power CMOS image sensor (CIS) with a multi-column-parallel (MCP) readout structure while focusing on improving its performance compared to previous works. A delta readout scheme that utilizes the image characteristics is optimized for the MCP readout structure. By simply alternating the MCP readout direction for each row selection, additional memory for the row-to-row delta readout is not required, resulting in a reduced area of occupation compared to the previous work. In addition, the bias current of a pre-amplifier in a successive approximate register (SAR) analog-to-digital converter (ADC) changes according to the operating period to improve the power efficiency. The prototype CIS chip was fabricated using a 0.18-㎛ CMOS process. A 160 × 120 pixel array with 4.4 ㎛ pitch was implemented with a 10-bit SAR ADC. The prototype CIS demonstrated a frame rate of 120 fps with a total power consumption of 1.92 mW.