• Title/Summary/Keyword: circuit-level model

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An Accurate Gate-level Stress Estimation for NBTI

  • Han, Sangwoo;Lee, Junho;Kim, Byung-Su;Kim, Juho
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.13 no.2
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    • pp.139-144
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    • 2013
  • Negative bias temperature instability (NBTI) has become a major factor determining circuit reliability. The effect of the NBTI on the circuit performance depends on the duty cycle which represents the stress and recovery conditions of each device in a circuit. In this paper, we propose an analytical model to perform more accurate duty cycle estimation at the gate-level. The proposed model allows accurate (average error rate: 3%) computation of the duty cycle without the need for expensive transistor-level simulations Furthermore, our model estimates the waveforms at each node, allowing various aging effects to be applied for a reliable gate-level circuit aging analysis framework.

Analytic Model of Spin-Torque Oscillators (STO) for Circuit-Level Simulation

  • Ahn, Sora;Lim, Hyein;Shin, Hyungsoon;Lee, Seungjun
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.13 no.1
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    • pp.28-33
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    • 2013
  • Spin-torque oscillators (STO) is a new device that can be used as a tunable microwave source in various wireless devices. Spin-transfer torque effect in magnetic multilayered nanostructure can induce precession of magnetization when bias current and external magnetic field are properly applied, and a microwave signal is generated from that precession. We proposed a semi-empirical circuit-level model of an STO in previous work. In this paper, we present a refined STO model which gives more accuracy by considering physical phenomena in the calculation of effective field. Characteristics of the STO are expressed as functions of external magnetic field and bias current in Verilog-A HDL such that they can be simulated with circuit-level simulators such as Hspice. The simulation results are in good agreement with the experimental data.

CMOS Current Sum/Subtract Circuit

  • Parnklang, Jirawath;Manasaprom, Ampual
    • 제어로봇시스템학회:학술대회논문집
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    • 2001.10a
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    • pp.108.6-108
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    • 2001
  • The basic circuit block diagram of CMOS current mode sum and subtract circuit is present in this paper. The purpose circuit consists of the invert current circuit and the basic current mirror. The outputs of the circuit are the summing of the both input current [lx+ly] and also the subtract of the both input current [lx+(-ly)]. The SPICE simulation results of the electrical characteristics with level 7 (BSIM3 model version 3.1) MOSFET transistor model of the circuit such as the input dynamic range, the frequency response and some system application have been shown and analyzed.

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Advanced Circuit-Level Model of Magnetic Tunnel Junction-based Spin-Torque Oscillator with Perpendicular Anisotropy Field

  • Kim, Miryeon;Lim, Hyein;Ahn, Sora;Lee, Seungjun;Shin, Hyungsoon
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.13 no.6
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    • pp.556-561
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    • 2013
  • Interest in spin-torque oscillators (STOs) has been increasing due to their potential use in communication devices. In particular the magnetic tunnel junction-based STO (MTJ-STO) with high perpendicular anisotropy is gaining attention since it can generate high output power. In this paper, a circuit-level model for an in-plane magnetized MTJ-STO with partial perpendicular anisotropy is proposed. The model includes the perpendicular torque and the shift field for more accurate modeling. The bias voltage dependence of perpendicular torque is represented as quadratic. The model is written in Verilog-A, and simulated using HSPICE simulator with a current-mirror circuit and a multi-stage wideband amplifier. The simulation results show the proposed model can accurately replicate the experimental data such that the power increases and the frequency decreases as the value of the perpendicular anisotropy gets close to the value of the demagnetizing field.

An Integrated System for Macromodel Development (마크로모델 개발을 위한 통합 시스템)

  • 박진규;정의영;김경호
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.31A no.9
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    • pp.146-155
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    • 1994
  • In this paper, we desribe a new system, called BEST, that is used to develop a macromodel or behavioral model easily. It automatically calculates the component values of macromodel represented by equations to satisfy the given specification. Also, it gives the way to analyze both the behavioral model and transistor level circuit, and then compare the analysis results of them to check the correspondence under specific temperature and bias condition, and BEST optimizes the component values of macromodel. Other feature is to characterize MOSFET as switch model which consists of PWL-RC network. Finally, it is possible to generage multi-level netlist which consists of macro/switch/transistor level circuits, and user can determine the trade-off between simulation speed and accuracy. With the graphic user interface form of macromodel development system described above. BEST enable designers to make macromodel by themselves and to uas it. We applied BEST to develop the macromodel for the test circuit and got the 18.6 times simulation speed up with preserving the accuracy within 10% compared to the conventional transistor level circuit simulation. Also, applicability of optimization capability was verified.

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Parameterized Simulation Program with Integrated Circuit Emphasis Modeling of Two-level Microbolometer

  • Han, Seung-Oh;Chun, Chang-Hwan;Han, Chang-Suk;Park, Seung-Man
    • Journal of Electrical Engineering and Technology
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    • v.6 no.2
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    • pp.270-274
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    • 2011
  • This paper presents a parameterized simulation program with integrated circuit emphasis (SPICE) model of a two-level microbolometer based on negative-temperature-coefficient thin films, such as vanadium oxide or amorphous silicon. The proposed modeling begins from the electric-thermal analogy and is realized on the SPICE modeling environment. The model consists of parametric components whose parameters are material properties and physical dimensions, and can be used for the fast design study, as well as for the co-design with the readout integrated circuit. The developed model was verified by comparing the obtained results with those from finite element method simulations for three design cases. The thermal conductance and the thermal capacity, key performance parameters of a microbolometer, showed the average difference of only 4.77% and 8.65%, respectively.

A Novel High-speed CMOS Level-Up/Down Shifter Design for Dynamic-Voltage/Frequency-Scaling Algorithm (Dynamic-Voltage/Frequency-Scaling 알고리즘에서의 다중 인가 전압 조절 시스템 용 High-speed CMOS Level-Up/Down Shifter)

  • Lim Ji-Hoon;Ha Jong-Chan;Wee Jae-Kyung;Moon Gyu
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.43 no.6 s.348
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    • pp.9-17
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    • 2006
  • We proposed a new High-speed CMOS Level Up/Down Shifter circuits that can be used with Dynamic Voltage and Frequency Scaling(DVFS) algorithm, for low power system in the SoC(System-on-Chip). This circuit used to interface between the other voltage levels in each CMOS circuit boundary, or between multiple core voltage levels in a system bus. Proposed circuit have advantage that decrease speed attenuation and duty ratio distortion problems for interface. The level up/down shifter of the proposed circuit designed that operated from multi core voltages$(0.6\sim1.6V)$ to used voltage level for each IP at the 500MHz input frequency The proposed circuit supports level up shifting from the input voltage levels, that are standard I/O voltages 1.8V, 2.5V, 3.3V, to multiple core voltage levels in between of $0.6V\sim1.6V$, that are used internally in the system. And level down shifter reverse operated at 1Ghz input frequency for same condition. Simulations results are shown to verify the proposed function by Hspice simulation, with $0.6V\sim1.6V$ CMOS Process, $0.13{\mu}m$ IBM CMOS Process and $0.65{\mu}m$ CMOS model parameters. Moreover, it is researched delay time, power dissipation and duty ration distortion of the output voltage witch is proportional to the operating frequency for the proposed circuit.

A Mathematical Model for Asymmetrical/Heterogeneous Traffic Management in TD-CDMA System (시분할-코드분할 다중 접속 시스템에서 비대칭/불균질 트래픽 처리에 대한 수학적 모델)

  • Shin Jung chae;Lee Yutae;Kim Jeong ho;Cho Ho shin
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.30 no.4A
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    • pp.259-270
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    • 2005
  • This paper proposes a mathematical model to analyze call-and packet-level performance of the TD-CDMA/TDD system which could serve a flexible radio resource management against multi-type heterogeneous and asymmetrical traffic conditions. On call-level analysis, the mathematical model based on queueing theory performs multi-dimensional operations using random vectors or matrices to consider multiple types of traffic and also deal with asymmetrical up- and down-direction transmissions separately. Employing the mathematical model, we obtain rail blocking probability for each type of traffic and also the optimum switching-point with the smallest call flocking probability. And on packet-level analysis, employing a non-prioritized queueing scheme between circuit and packet calls, we solve 2-dimensional random vector problem composed of the queue length for packets and the number of circuit calls being served. Finally, packet-level performance is analyzed in terms of the packet loss probability and the buffer size required under mixed-traffic conditions of multiple types of circuit and packet calls.

Model on the electro-magnetic characteristics of elastic ferromagnetic materials with vibrationg gap (탄성 고투자율 자성체의 공극진동에 따른 전자기 특성에 관한 모델)

  • 김대수;김왕곤;홍진웅
    • Electrical & Electronic Materials
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    • v.9 no.9
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    • pp.891-899
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    • 1996
  • A model for predicting the characteristics of elastic ferromagnetic materials having a moving gap was presented. Based on the model parameters concerning behavior of material, such as the instantaneous field intensity, attractive force between the poles, length of gap, and the induced current/ emf in the circuit can be determined from the numerical integrations of the governing equations derived. From the results of the model it is found that when dc emf is imposed on the circuit the current sharply rise and fall for very short duration then stabilize at extremely low level which depends mainly on elasticity, permeabilities and ratio of resistivity. Subsequently output emf is shown stabilized at constant value which depends on the previous parameters as well as the resistivity ratio of primary to secondary circuit after sufficient progress of time.

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Novel Power Bus Design Method for High-Speed Digital Boards (고속 디지털 보드를 위한 새로운 전압 버스 설계 방법)

  • Wee, Jae-Kyung
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.43 no.12 s.354
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    • pp.23-32
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    • 2006
  • Fast and accurate power bus design (FAPUD) method for multi-layers high-speed digital boards is devised for the power supply network design tool for accurate and precise high speed board. FAPUD is constructed, based on two main algorithms of the PBEC (Path Based Equivalent Circuit) model and the network synthesis method. The PBEC model exploits simple arithmetic expressions of the lumped 1-D circuit model from the electrical parameters of a 2-D power distribution network. The circuit level design based on PBEC is carried with the proposed regional approach. The circuit level design directly calculates and determines the size of on-chip decoupling capacitors, the size and the location of off-chip decoupling capacitors, and the effective inductances of the package power bus. As a design output, a lumped circuit model and a pre-layout of the power bus including a whole decoupling capacitors are obtained after processing FAPUD. In the tuning procedure, the board re-optimization considering simultaneous switching noise (SSN) added by I/O switching can be carried out because the I/O switching effect on a power supply noise can be estimated over the operation frequency range with the lumped circuit model. Furthermore, if a design changes or needs to be tuned, FAPUD can modify design by replacing decoupling capacitors without consuming other design resources. Finally, FAPUD is accurate compared with conventional PEEC-based design tools, and its design time is 10 times faster than that of conventional PEEC-based design tools.