• Title/Summary/Keyword: channel barrier

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Design on Optimum Control of Subthreshold Current for Double Gate MOSFET (DGMOSFET에서 최적의 서브문턱전류제어를 위한 설계)

  • Jung, Hak-Kee;Na, Young-Il;Lee, Jong-In
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • v.9 no.2
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    • pp.887-890
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    • 2005
  • The double gate(DG) MOSFET is a promising candidate to further extend the CMOS scaling and provide better control of short channel effect(SCE). DGMOSFETs, having ultra thin updoped Si channel for SCEs control, are being validated for sub-20nm scaling, A channel effects such as the subthreshold swing(SS), and the threshold voltage roll-off(${\Delta}V_{th}$). The propsed model includes the effects of thermionic emission and quantum tunneling of carriers through the source-drain barrier. The proposed model is used to design contours for gate length, channel thickness, and gate oxide thickness.

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Co-Deposition법을 이용한 Yb Silicide/Si Contact 및 특성 향상에 관한 연구

  • Gang, Jun-Gu;Na, Se-Gwon;Choe, Ju-Yun;Lee, Seok-Hui;Kim, Hyeong-Seop;Lee, Hu-Jeong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.438-439
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    • 2013
  • Microelectronic devices의 접촉저항의 향상을 위해 Metal silicides의 형성 mechanism과 전기적 특성에 대한 연구가 많이 이루어지고 있다. 지난 수십년에 걸쳐, Ti silicide, Co silicide, Ni silicide 등에 대한 개발이 이루어져 왔으나, 계속적인 저저항 접촉 소재에 대한 요구에 의해 최근에는 Rare earth silicide에 관한 연구가 시작되고 있다. Rare-earth silicide는 저온에서 silicides를 형성하고, n-type Si과 낮은 schottky barrier contact (~0.3 eV)를 이룬다. 또한, 비교적 낮은 resistivity와 hexagonal AlB2 crystal structure에 의해 Si과 좋은 lattice match를 가져 Si wafer에서 high quality silicide thin film을 성장시킬 수 있다. Rare earth silicides 중에서 ytterbium silicide는 가장 낮은 electric work function을 갖고 있어 낮은 schottky barrier 응용에서 쓰이고 있다. 이로 인해, n-channel schottky barrier MOSFETs의 source/drain으로써 주목받고 있다. 특히 ytterbium과 molybdenum co-deposition을 하여 증착할 경우 thin film 형성에 있어 안정적인 morphology를 나타낸다. 또한, ytterbium silicide와 마찬가지로 낮은 면저항과 electric work function을 갖는다. 그러나 ytterbium silicide에 molybdenum을 화합물로써 높은 농도로 포함할 경우 높은 schottky barrier를 형성하고 epitaxial growth를 방해하여 silicide film의 quality 저하를 야기할 수 있다. 본 연구에서는 ytterbium과 molybdenum의 co-deposition에 따른 silicide 형성과 전기적 특성 변화에 대한 자세한 분석을 TEM, 4-probe point 등의 다양한 분석 도구를 이용하여 진행하였다. Ytterbium과 molybdenum을 co-deposition하기 위하여 기판으로 $1{\sim}0{\Omega}{\cdot}cm$의 비저항을 갖는 low doped n-type Si (100) bulk wafer를 사용하였다. Native oxide layer를 제거하기 위해 1%의 hydrofluoric (HF) acid solution에 wafer를 세정하였다. 그리고 고진공에서 RF sputtering 법을 이용하여 Ytterbium과 molybdenum을 동시에 증착하였다. RE metal의 경우 oxygen과 높은 반응성을 가지므로 oxidation을 막기 위해 그 위에 capping layer로 100 nm 두께의 TiN을 증착하였다. 증착 후, 진공 분위기에서 rapid thermal anneal(RTA)을 이용하여 $300{\sim}700^{\circ}C$에서 각각 1분간 열처리하여 ytterbium silicides를 형성하였다. 전기적 특성 평가를 위한 sheet resistance 측정은 4-point probe를 사용하였고, Mo doped ytterbium silicide와 Si interface의 atomic scale의 미세 구조를 통한 Mo doped ytterbium silicide의 형성 mechanism 분석을 위하여 trasmission electron microscopy (JEM-2100F)를 이용하였다.

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Thermo-structural Effects of Thermal Barrier Coating on Regenerative Cooling Chamber (열차폐 코팅이 재생냉각 챔버에 미치는 열/구조적인 영향)

  • Ryu, Chul-Sung;Lee, Keum-Oh;Kim, Hong-Jip;Choi, Hwan-Seok
    • Proceedings of the Korean Society of Propulsion Engineers Conference
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    • 2009.11a
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    • pp.421-425
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    • 2009
  • A study has been performed to investigate the thermo-mechanical effects of thermal barrier coating on liquid rocket regenerative cooling chamber using finite element analysis. Two kinds of thermal barrier coatings were studied on the same loading condition: first, NiCrAlY-$ZrO_2$, coating which is currently applied to the developing combustion chamber and second, Ni-Cr coating which might be applied in the future. Analysis results showed that NiCrAlY-$ZrO_2$ coating has better decreasing effect of temperature than the Ni-Cr coating. As a results, temperature and deformation of the cooling channel in the NiCrAlY-$ZrO_2$ coating were also less than those of the Ni-Cr coating. The Ni-Cr coating has no effect on a structural stability of the outer jacket but the NiCrAlY-$ZrO_2$ coating reduced the effective stress of the outer jacket and enhanced the structural stability of the chamber.

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Reduction of Barrier Height between Ni-silicide and p+ source/drain for High Performance PMOSFET (고성능 PMOSFET을 위한 Ni-silicide와 p+ source/drain 사이의 barrier height 감소)

  • Kong, Sun-Kyu;Zhang, Ying-Ying;Park, Kee-Young;Li, Shi-Guang;Zhong, Zhun;Jung, Soon-Yen;Yim, Kyoung-Yean;Lee, Ga-Won;Wang, Jin-Suk;Lee, Hi-Deok
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.11a
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    • pp.157-157
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    • 2008
  • As the minimum feature size of semiconductor devices scales down to nano-scale regime, ultra shallow junction is highly necessary to suppress short channel effect. At the same time, Ni-silicide has attracted a lot of attention because silicide can improve device performance by reducing the parasitic resistance of source/drain region. Recently, further improvement of device performance by reducing silicide to source/drain region or tuning the work function of silicide closer to the band edge has been studied extensively. Rare earth elements, such as Er and Yb, and Pd or Pt elements are interesting for n-type and p-type devices, respectively, because work function of those materials is closer to the conduction and valance band, respectively. In this paper, we increased the work function between Ni-silicide and source/drain by using Pd stacked structure (Pd/Ni/TiN) for high performance PMOSFET. We demonstrated that it is possible to control the barrier height of Ni-silicide by adjusting the thickness of Pd layer. Therefore, the Ni-silicide using the Pd stacked structure could be applied for high performance PMOSFET.

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Current-Voltage Characteristics of Schottky Barrier SOI nMOS and pMOS at Elevated Temperature (고온에서 Schottky Barier SOI nMOS 및 pMOS의 전류-전압 특성)

  • Ka, Dae-Hyun;Cho, Won-Ju;Yu, Chong-Gun;Park, Jong-Tae
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.46 no.4
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    • pp.21-27
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    • 2009
  • In this work, Er-silicided SB-SOI nMOSFET and Pt-silicided SB-SOI pMOSFET have been fabricated to investigate the current-voltage characteristics of Schottky barrier SOI nMOS and pMOS at elevated temperature. The dominant current transport mechanism of SB nMOS and pMOS is discussed using the measurement results of the temperature dependence of drain current with gate voltages. It is observed that the drain current increases with the increase of operating temperature at low gate voltage due to the increase of thermal emission and tunneling current. But the drain current is decreased at high gate voltage due to the decrease of the drift current. It is observed that the ON/Off current ratio is decreased due to the increased tunneling current from the drain to channel region although the ON current is increased at elevated temperature. The threshold voltage variation with temperature is smaller and the subthreshold swing is larger in SB-SOI nMOS and pMOS than in SOI devices or in bulk MOSFETs.

Study on Ways of Overcoming Obstacles of University-Industry Collaboration in Terms of POB(Positive Organization Behavior) (산학협력의 장애요인 및 극복방안에 관한 연구: POB(Positive Organization Behavior) 관점에서)

  • Hong, Eun Young;Choi, Jong In
    • Asia-Pacific Journal of Business Venturing and Entrepreneurship
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    • v.10 no.5
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    • pp.185-196
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    • 2015
  • In a study of the existing Collaboration, U-I Collaboration linkage(LINK) has a width of the various channels through continuous mutual cooperation by the path-dependency. U-I Collaboration linkage(LINK) through the various channels is more powerful, whereas this increase trade-related barriers. In other words, It has been discussed in many literatures about the U-I Collaboration linkage(LINK). However, relatively a study on the factor of the barrier about U-I Collaboration linkage(LINK) is a minority. Given the importance of policies to establish an association of industry-university cooperation and support system, the lack of research on the obstacles to U-I Collaboration linkage(LINK) will be a serious obstacle for designing effective policies. This paper examines the existing literature about the width of mutual cooperation and the barrier of U-I Collaboration, analyze to lower the barrier of U-I cooperation through POB(Positive Organization Behavior) of university administration. In conclusion, we would like to suggest the policy implications.

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The Fabrication and Characterization of CODE MOSFET (CODE MOSFET 소자의 제작 및 특성)

  • 송재혁;김기홍;박영준;민홍식
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.27 no.6
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    • pp.895-900
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    • 1990
  • With the MOS device scailing down, the substrate concentration must increase in order to avoid punchthrough leakage current due to the DIBL(Drain Induced Barrier Lowering) effect. However the enhancement of the substrate concentration increases source, drain juntion capacitances and substrate current due to hot elelctron, degrading the speed characteristics and reliability of the MOS devices. In this paper, a new device, called CODE(Channel Only Dopant Enhancement) MOS, an its fabrication are proposed. By comparing the fabricated CODE MOSFET with the conventional device, the improvements on DIBL, substrate current and source, drain juntion capacitances are realized.

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Implementation of Active Noise Barriers Using Active Noise Control Techniques (능동소음제어 기법을 이용한 Active Noise Barrier구현)

  • Kwon Hyok;Seo Sung-Dae;Nam Hyun-Do
    • Proceedings of the KIPE Conference
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    • 2002.07a
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    • pp.730-733
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    • 2002
  • In this paper, implementation of active noise barriers using active noise control techniques is presented. Multi-channel FX-LMS algorithms and Leaky LMS algorithms are used for adaptive filters to attenuate noise which is propagated from the outside of experimental enclosures. Experiments have done to show the effectivene a proposed active noise barriers.

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Size Scaling에 따른 Gate-All-Around Silicon Nanowire MOSFET의 특성 연구

  • Lee, Dae-Han;Jeong, U-Jin
    • Proceeding of EDISON Challenge
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    • 2014.03a
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    • pp.434-438
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    • 2014
  • CMOS의 최종형태로써 Gate-All-Around(GAA) Silicon Nanowire(NW)가 각광받고 있다. 이 논문에서 NW FET(Field Effect Transistor)의 채널 길이와 NW의 폭과 같은 size에 따른 특성변화를 실제 실험 data와 NW FET 특성분석 simulation을 이용해서 비교해보았다. MOSFET(Metal Oxide Semiconductor Field Effect Transistor)의 소형화에 따른 쇼트 채널 효과(short channel effect)에 의한 threshold voltage($V_{th}$), Drain Induced Barrier Lowering(DIBL), subthreshold swing(SS) 또한 비교하였다. 이에 더하여, 기존의 상용툴로 NW를 해석한 시뮬레이션 결과와도 비교해봄으로써 NW의 size scaling에 대한 EDISON NW 해석 simulation의 정확도를 파악해보았다.

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A landform change of barrier islands around the Nakdong River Estuary (낙동강 하구의 연안사주 지형변화)

  • Ban, Yong-Boo
    • Proceedings of the Korean Institute of Navigation and Port Research Conference
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    • 2009.06a
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    • pp.452-455
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    • 2009
  • The Nakdong Delta can be identified by two different geomorphic units. The first one is the upper delta. This is mostly composed of inter-distributary islands that are largely influenced by fluvial processes and attributed to the development of these islands along the river. The other one is the lower delta which is mostly composed of beach ridges. Barrier islands are largely effected by wave processes promoted by the development almost at a right angle to the river. Influenced by the longshore current which flows to the same direction, barrier islands located in the Nakdong river estuary are developing from east to west direction. As a result, the eastern end of the barrier islands are growing toward the north-west direction effected by tidal current which moves toward the same direction. Barrier islands include the Sinho Island, the Jinwoo Island, the Daema deung, the Janga Island, the Baghap deung, the Sae deung, and the Chulsae deung(Doyeo deung). They have orderly emerged from the sea since 1861. Since 2008, a new Deung, a sand dune growing under sea, has been developing rapidly from Chulsae deung to the Dadaepo beach. It made the sailing of small fisher boats impossible. Tidal currents transported a lot of sand and silt around the barrier islands. The landscape of Nakdong river estuary where many barrier islands are distributed will change rapidly affecting land environment.

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