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Current-Voltage Characteristics of Schottky Barrier SOI nMOS and pMOS at Elevated Temperature  

Ka, Dae-Hyun (Department of Electronics Engineering, University of Incheon)
Cho, Won-Ju (Department of Electronics Materials Engineering, Kwangwoon University)
Yu, Chong-Gun (Department of Electronics Engineering, University of Incheon)
Park, Jong-Tae (Department of Electronics Engineering, University of Incheon)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.46, no.4, 2009 , pp. 21-27 More about this Journal
Abstract
In this work, Er-silicided SB-SOI nMOSFET and Pt-silicided SB-SOI pMOSFET have been fabricated to investigate the current-voltage characteristics of Schottky barrier SOI nMOS and pMOS at elevated temperature. The dominant current transport mechanism of SB nMOS and pMOS is discussed using the measurement results of the temperature dependence of drain current with gate voltages. It is observed that the drain current increases with the increase of operating temperature at low gate voltage due to the increase of thermal emission and tunneling current. But the drain current is decreased at high gate voltage due to the decrease of the drift current. It is observed that the ON/Off current ratio is decreased due to the increased tunneling current from the drain to channel region although the ON current is increased at elevated temperature. The threshold voltage variation with temperature is smaller and the subthreshold swing is larger in SB-SOI nMOS and pMOS than in SOI devices or in bulk MOSFETs.
Keywords
Schottky barrier MOSFET; SOI MOSFET; Temperature effects on SB MOSFET;
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