• The Transactions of The Korean Institute of Electrical Engineers
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• v.65 no.10
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• pp.1712-1720
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• 2016

AC and DC insulation breakdown voltage was studied for magnet wire coated with double layers of high flexural PAI layer and high anti-corona PAI/nanosilica (15 wt%) layer. The specimens were prepared at various drying temperatures (T/D): $22^{\circ}C$, $240^{\circ}C$, and $260^{\circ}C$, respectively. The increase effects of nanosilica on AC and DC insulation breakdown voltage were not so significant compared to that of magnet wire coil coated with original PAI. And the AC and DC insulation breakdown voltage was improved by decreasing diameter of winding coil. As T/D temperature increased, AC and DC insulation breakdown voltage decreased.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.68 no.1
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• pp.52-60
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• 2019

In this paper, four types of insulation coils were fabricated by adding various kinds of glycols to improve the flexibility and adhesion of insulating coils in varnish dispersed with PAI / Nano Silica_15wt%. The applied voltage and frequency were 1.5 kV / 20 kHz for accelerated life evaluation. Through the 6th temperature stress level, the cause of the insulation breakdown of the coil was ignored and only the breakdown time was measured. The Arrhenius model was chosen based on the theoretical relationship between chemical reaction rate and temperature for estimating the insulation life of the coil due to accelerated thermal stress. Three types of distributions (Weibull, Lognormal, Exponential) were selected as the relationship between thermal stress model and distribution. The average insulation lifetime was estimated under the temperature stress of four types of insulation coils through the relationship between one kind of model and three kinds of distributions.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.7
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• pp.162-170
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• 1996

A breakdown model of gate oxides under constant current stresses is proposed. This model directly relates the oxide lifetime to the stress current density, and includes statistical nature of oxide breakdown using the concept of "effective oxide thinning". It is shown tha this model can reliably predict the TDDB characteristics for any current stress levels and oxide areas.

• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.16 no.4
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• pp.173-179
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• 2023

This paper analyzes the time-dependent dielectric breakdown(TDDB) degradation mechanism for each stress region of Peri devices manufactured by 4th generation VNAND process, and presents a complementary lifetime prediction model that improves speed and accuracy in a wider reliability evaluation region compared to the conventional model presented. SiON dielectric nMOSFETs were measured 10 times each under 5 constant voltage stress(CVS) conditions. The analysis of stress-induced leakage current(SILC) confirmed the significance of the field-based degradation mechanism in the low electric field region and the current-based degradation mechanism in the high field region. Time-to-failure(TF) was extracted from Weibull distribution to ascertain the lifetime prediction limitations of the conventional E-model and 1/E-model, and a parallel complementary model including both electric field and current based degradation mechanisms was proposed by extracting and combining the thermal bond breakage rate constant(k) of each model. Finally, when predicting the lifetime of the measured TDDB data, the proposed complementary model predicts lifetime faster and more accurately, even in the wider electric field region, compared to the conventional E-model and 1/E-model.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.20 no.9
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• pp.1771-1777
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• 2016

In this thesis, the breakdown voltage characteristics of silicon nanowire N-channel GAA MOSFETs were analyzed through experiments and 3-dimensional device simulation. GAA MOSFETs with the gate length of 250nm, the gate dielectrics thickness of 6nm and the channel width ranged from 400nm to 3.2um were used. The breakdown voltage was decreased with increasing gate voltage but it was increased at high gate voltage. The decrease of breakdown voltage with increasing channel width is believed due to the increased current gain of parasitic transistor, which was resulted from the increased potential in channel center through floating body effects. When the positive charge was trapped into the gate dielectrics after gate stress, the breakdown voltage was decreased due to the increased potential in channel center. When the negative charge was trapped into the gate dielectrics after gate stress, the breakdown voltage was increased due to the decreased potential in channel center. We confirmed that the measurement results were agreed with the device simulation results.

• Proceedings of the KIEE Conference
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• 1999.11d
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• pp.994-996
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• 1999

Hygrothermal aging at the elevated temperature induces the long-term degradation of the epoxy resin. We investigated the effects of hydrothermal stress on the dielectric breakdown phenomena of epoxy composite filled with natural zeolite. The cured specimens absorbed the moisture in the autoclave at $120^{\circ}C$. $T_g$ of the deteriorated composite by moisture absorption decreased. The dielectric breakdown strength decreased with the moisture absorption cycle. It was concluded that the thermal stress and the high water-vapour-pressure deteriorated the natural zeolite filled epoxy resin system, consequently and the tree growth rate increased.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.07a
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• pp.136-139
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• 2000

Epoxy materials are used as insulation material for electric power cables. In the case of a flow of excess current due to the temperature difference which occurs between the heat of the conductor and the atmosphere, heat degrades connection point of the cables. Also, the mechanical stress, which occurs due to the thermal expansion coefficient of cable connection electrode system and epoxy insulation materials along with the gap between thermal conduction based on the extra high voltage of transmitted voltage, increases possibility of cracks to occur. The relationship between mechanical stress and electrical breakdown mechanism is verified for the epoxy materials such as high toughness epoxy materials, which comes to be used contemporarily, and for the breakdown mechanism of epoxy materials on the multi-stresses (mechanical and electrical) due to the variation of the temperature.

• Journal of the Korean Ceramic Society
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• v.24 no.4
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• pp.392-396
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• 1987

Pure barium titanate was sintered at $1340^{\circ}C$ for 2, 4, 8, 16 hr to control their grain size. The measurements of breakdown strength and partial discharge characteristics were performed under rising AC voltage(60Hz). With increase of sintering time, the average grain size was increased and breakdown strength was slightly decreased. Partial discharge in pores was observed under high voltage, and a model of dielectric break down in barium titanate ceramics is proposed.

• Journal of the Earthquake Engineering Society of Korea
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• v.24 no.6
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• pp.253-266
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• 2020

The extended slip-weakening model was investigated by using a compiled set of source-spectrum-related parameters, i.e. seismic moment M_o, S-wave velocity V_s, corner-frequency f_c, and source-controlled high-cut frequency fmax, for 113 shallow crustal earthquakes (focal depth less than 25 km, M_W 3.0~7.5) that occurred in Japan from 1987 to 2016. The investigation was focused on the characteristics of stress drop, radiation energy-to-seismic moment ratio, radiation efficiency, and fracture energy release rate, G_c. The scaling relationships of those source parameters were also investigated and compared with those in previous studies, which were based on generally used singular models with the dimensionless numbers corresponding to f_c given by Brune and Madariaga. The results showed that the stress drop from the singular model with Madariaga's dimensionless number was equivalent to the breakdown stress drop, as well as Brune's effective stress, rather than to static stress drop as has been usually assumed. The scale dependence of stress drop showed a different tendency in accordance with the size category of the earthquakes, which may be divided into small-moderate earthquakes and moderate-large earthquakes by comparing to M_o = 10¹⁷~10¹⁸ Nm. The scale dependence was quite similar to that shown by Kanamori and Rivera. The scale dependence was not because of a poor dynamic range of recorded signals or missing data as asserted by Ide and Beroza, but rather it was because of the scale dependent V_r-induced local similarity of spectrum as shown in a previous study by the authors. The energy release rate G_c with respect to breakdown distance D_c from the extended slip-weakening model coincided with that given by Ellsworth and Beroza in a study on the rupture nucleation phase; and the empirical relationship given by Abercrombie and Rice can represent the results from the extended slip-weakening model, the results from laboratory stick-slip experiments by Ohnaka, and the results given by Ellsworth and Beroza simultaneously. Also the energy flux into the breakdown zone was well correlated with the breakdown stress drop, ${\tilde{e}}$ and peak slip velocity of the fault faces. Consequently, the investigation results indicate the appropriateness of the extended slip-weakening model.

• Proceedings of the KIEE Conference
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• 2004.11a
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• pp.244-247
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• 2004

The electrical insulating design is important to realize a HTS power cable because the cable is operated under the high voltage environment. For the insulation design of a HTS power cable, it is necessary to investigate the AC, impulse breakdown and partial discharge(PD) inception stress of liquid nitrogen/LPP composite insulation system. Based on these results, the electrical insulation of a HTS power cable is designed and Mini-model cables are manufactured. The manufactured Mini-model cables are evaluated that AC, impulse withstand voltage, breakdown and partial discharge inception stress and analyzed characteristics insulation of HTS cable bending condition according to this paper. From these tests, the AC, impulse withstand voltage test and partial discharge inception stress is satisfied "standard technical specification of KEPCO" in Korea and the breakdown voltage was 120kV.