• 제목/요약/키워드: amorphous Si

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VHF-CVD를 이용한 a-Si:H/c-Si 이종접합태양전지 표면 패시배이션 연구 (Surface passivation study of a-Si:H/c-Si heterojunction solar cells using VHF-CVD)

  • 송준용;정대영;김경민;박주형;송진수;김동환;이정철
    • 한국신재생에너지학회:학술대회논문집
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    • 한국신재생에너지학회 2011년도 춘계학술대회 초록집
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    • pp.128.1-128.1
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    • 2011
  • In amorphous silicon and crystalline silicon(a-Si:H/c-Si) heterojuction solar cells, intrinsic hydrogenated amorphous silicon(a-Si:H) films play an important role to passivate the crystalline silicon wafer surfaces. We have studied the correlation between the surface passivation quality and nature of the Si-H bonding at the a-Si:H/c-Si interface. The samples were obtained by VHF-CVD under different deposition conditions. The passivation quality and analysis of all structures studied was performed by means of quasi steady state photoconductance(QSSPC) methods and fourier transform infrared spectrometer(FTIR) measurements respectively.

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Thermal Conductivity Analysis of Amorphous Silicon Formed by Natural Cooling: A Molecular-dynamics Study

  • Lee, Byoung Min
    • 한국세라믹학회지
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    • 제53권3호
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    • pp.295-300
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    • 2016
  • To investigate the thermal conductivity and the structural properties of naturally cooled excimer-laser annealed Si, molecular-dynamics (MD) simulations have been performed. The thermal conductivity of crystalline Si (c-Si) was measured by direct method at 1000 K. Steady-state heat flow was measured using a stationary temperature profile; significant deviations from Fourier's law were not observed. Reliable processes for measuring the thermal conductivity of c-Si were presented. A natural cooling process to admit heat flow from molten Si (l-Si) to c-Si was performed using an MD cell with a size of $48.9{\times}48.9{\times}97.8{\AA}^3$. During the cooling process, the temperature of the bottom $10{\AA}$ of the MD cell was controlled at 300 K. The results suggest that the natural cooling system described the static structural property of amorphous Si (a-Si) well.

Ni added Si-Al Alloys with Enhanced Li+ Storage Performance for Lithium-Ion Batteries

  • Umirov, Nurzhan;Seo, Deok-Ho;Jung, Kyu-Nam;Kim, Hyang-Yeon;Kim, Sung-Soo
    • Journal of Electrochemical Science and Technology
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    • 제10권1호
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    • pp.82-88
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    • 2019
  • Here, we report on nanocrystalline Si-Al-M (M = Fe, Cu, Ni, Zr) alloys for use as an anode for lithium-ion batteries, which were fabricated via a melt-spinning method. Based on the XRD and TEM analyses, it was found that the Si-Al-M alloys consist of nanocrystalline Si grains surrounded by an amorphous matrix phase. Among the Si-Al-M alloys with different metal composition, Ni-incorporated Si-Al-M alloy electrode retained the high discharge capacity of 2492 mAh/g and exhibited improved cyclability. The superior $Li^+$ storage performance of Si-Al-M alloy with Ni component is mainly responsible for the incorporated Ni, which induces the formation of ductile and conductive inactive matrix with crystalline Al phase, in addition to the grain size reduction of active Si phase.

초미세결정립 $ Fe_{73.5}Cu_{1}Nb_{3}Si_{16.5}B_6$ 합금의 $M\""{o}ssbauer$ 효과 연구 ($M\""{o}ssbauer$ Effet Studies on Nanocrystalline $Fe_{73.5}Cu_{1}Nb_{3}Si_{16.5}B_6$ Alloy)

  • 신영남;김재경;양재석;조익한;강신규
    • 한국자기학회지
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    • 제4권1호
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    • pp.12-19
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    • 1994
  • 비정질 $Fe_{73.5}Cu_{1}Nb_{3}Si_{16.5}B_{6}$ 합금의 $552^{\circ}C$에서 등온열처리시간에 따른 결정화 거동을 $M\"{o}ssbauer$ 분광법으로 연구하였다. 열처리된 시료는 $Do_{3}-FeSi$ 초미세결정립, Cu-cluster 및 비정질이 공존함이 $M\"{o}ssbauer$ spectrum 분석에 의해 확인되었다. 결정화 초기단계에 Cu-cluster가 형성되기 때문에 FeSi 초미세결정립의 Si함량은 높아지며, 열처리시간이 60분이 될 때까지 Si함량은 감소하는데 이는 FeSi 초미세결정립의 평균초미세자기장의 증가를 일으키며, 이후 Si함량은 거의 일정하다. 60분 이후의 열처리에서 FeSi 초미세결정립과 잔류비정질의 체적분율이 미소하게 변화함에도 잔류비정질의 평균초미세자기장이 감소하는 것은 잔류비정질에서의 Nb, B원자의 존재비의 증가에 기인된다. $552^{\circ}C$에서 60분 열처리 할 경우 FeSi 초미세결정립과 잔류비정질의 초미세자기장의 방향이 모두 무질서하게 분포된다. FeSi 초미세결정립과 Cu-cluster의 Avrami지수는 각각 0.51, 0.65, 잠복기는 각각 2.4분, 0.8분, 활성화에너지는 각각 2.35 eV, 2.44 eV이며, Cu-cluster가 FeSi 초미세결정립보다 먼저 생성된다는 것은 Cu 원자가 FeSi 초미세결정립의 생성을 촉진시킨다는 해석과 부합한다.

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비정질 CoFeSiB 자유층을 갖는 자기터널접합의 스위칭 특성 (Switching Characteristics of Magnetic Tunnel Junction with Amorphous CoFeSiB Free Layer)

  • 황재연;이장로
    • 한국자기학회지
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    • 제16권6호
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    • pp.276-278
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    • 2006
  • 스위칭 특성을 향상시키기 위하여 비정질 강자성 CoFeSiB 자유층을 갖는 자기터널접합 (MTJ)의 스위칭 특성을 연구하였다. 자기터널접합의 구조는 $Si/SiO_{2}/Ta$ 45/Ru 9.5/IrMn 10/CoFe 10/CoFe $7/AlO_{x}/CoFeSiB\;(t)/Ru\;60\;(nm)$이다. CoFeSiB는 $560\;emu/cm^{3}$의 낮은 포화자화도와 $2800\;erg/cm^{3}$의 높은 이방성 상수를 가졌다. 이러한 특성이 자기터널접합의 낮은 보자력($H_{c}$)과 높은 자장민감도를 갖게 한다. 이것은 또한 Landau-Lisfschitz-Gilbert 방정식에 근거한 미세자기 전산시뮬레이션을 통하여 submicrometersized elements에서도 확인하였다. CoFeSiB 자유층 두께를 증가함으로서 스위칭 특성은 반자화 자기장의 증가로 인하여 더욱더 나빠졌다.

반도체 메모리 소자 응용을 위한 TaSiN 확산 방지층의 산화 저항성 (Oxidation resistnace of TaSiN diffusion barrier layers for Semiconductor memory device application)

  • 신웅철;이응민;최영심;최규정;최은석;전영아;박종봉;윤순길
    • 한국재료학회지
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    • 제10권11호
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    • pp.749-764
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    • 2000
  • 약 90 nm 두께의 비정질 TaSiN박막을 poly-Si and $SiO_2/Si$ 기판 위에 rf magnetron sputtering법으로 증착하였다. TaSiN박막은 산소부위기에서 열처리 시 $ 900^{\circ}C$까지 결정화되지 않는 비정질 상을 보였다. 산소의 확산 깊이는 산소분위기 열처리 온도가 증가함에 따라 증가하였으며 $650^{\circ}C$, 30분 열처리시 $Ta_{23}Si_{29}N_{48}$의 경우 약 20 nm의 깊이까지 확산되었다. $Ta_{23}Si_{29}N_{48}$ 박막의 증착 후 비저항은 약 $1,300{\mu}{\Omega}-cm$의 값을 보였지만 산소분위기 열처리시 $700^{\circ}C$ 이상에서 급격히 증가하였다.

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Advanced Amorphous Silicon TFT Backplane for AMOLED Display

  • Han, Min-Koo;Shin, Hee-Sun
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2007년도 7th International Meeting on Information Display 제7권2호
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    • pp.1673-1676
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    • 2007
  • We have investigated the degradation mechanism of hydrogenated amorphous silicon (a- Si:H) thin film transistors (TFTs) The threshold voltage of driving a-Si:H TFT is shifted severely by electrical bias due to a charge trapping and defect state creation. And the short channel TFTs exhibit less threshold voltage degradation than long channel TFTs. We propose the pixel circuits employing negative bias annealing scheme in order to suppression of threshold voltage shift of a-Si:H TFT.

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PECVD 방법으로 증착한 Si박막의 SPC 성장 (SPC Growth of Si Thin Films Preapared by PECVD)

  • 문대규;임호빈
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 1992년도 춘계학술대회 논문집
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    • pp.42-45
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    • 1992
  • The poly silicon thin films were prepared by solid phase crystallization at 600$^{\circ}C$ of amorphous silicon films deposited on Corning 7059 glass and (100) silicon wafer with thermally grown SiO$_2$substrate by plasma enhanced chemical vapor deposition with varying rf power, deposition temperature, total flow rate. Crystallization time, microstructure, absorption coefficients were investigated by RAMAN, XRD analysis and UV transmittance measurement. Crystallization time of amorphous silicon films was increased with increasing rf power, decreasing deposition temperature and decreasing total flow rate.

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Investigations on Microcrystalline Silicon Films for Solar Cell Application

  • Hwang, Hae-Sook;Park, Min-Gyu;Ruh, Hyun;Yu, Hyun-Ung
    • Bulletin of the Korean Chemical Society
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    • 제31권10호
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    • pp.2909-2912
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    • 2010
  • Hydrogenated microcrystalline silicon (${\mu}c$-Si:H) thin film for solar cells is prepared by plasma-enhanced chemical vapor deposition and physical properties of the ${\mu}c$-Si:H p-layer has been investigated. With respect to stable efficiency, this film is expected to surpass the performance of conventional amorphous silicon based solar cells and very soon be a close competitor to other thin film photovoltaic materials. Silicon in various structural forms has a direct effect on the efficiency of solar cell devices with different electron mobility and photon conversion. A Raman microscope is adopted to study the degree of crystallinity of Si film by analyzing the integrated intensity peaks at 480, 510 and $520\;cm^{-1}$, which corresponds to the amorphous phase (a-Si:H), microcrystalline (${\mu}c$-Si:H) and large crystals (c-Si), respectively. The crystal volume fraction is calculated from the ratio of the crystalline and the amorphous phase. The results are compared with high-resolution transmission electron microscopy (HR-TEM) for the determination of crystallinity factor. Optical properties such as refractive index, extinction coefficient, and band gap are studied with reflectance spectra.

에어로졸 데포지션 법을 이용하여 제조한 SiO2 후막의 구조 및 광학 특성 (Structural and Optical Properties of SiO2 Thick Films by Aerosol Deposition Process)

  • 장찬익;고중혁
    • 한국전기전자재료학회논문지
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    • 제26권1호
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    • pp.6-12
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    • 2013
  • Aerosol deposition(AD) coating that enable fabricate films at low temperature have begun to be widely researched for the integration of ceramics as well to realize high-speed deposition rates. For application of ceramic thick film by AD to display and electronic ceramic industry, fabrication of dense structure with a no cracking is required. In this study, to fabricate dense ceramic thick film, the effect of crystal phase of starting powder was investigated. For this study, amorphous and crystalline $SiO_2$ powders were used as starting powders. Two types of $SiO_2$ powders were deposited on glass substrate by AD. In the case of amorphous $SiO_2$ powder, the deposited films had extremely incompact and opaque layer, irrespective of particle size. In contrast to amorphous powder, in the case of crystalline powder, porous structure layer and dense microstructure with no cracking layer were fabricated depending on the particle size. The optimized starting powder size for dense coating layer was $1{\sim}2{\mu}m$. The transmittance of film reached a maximum of 76% at 800 nm.