• International Journal of Reliability and Applications
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• 제13권1호
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• pp.19-35
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• 2012

This paper presents an optimum design of step-stress partially accelerated life test (PALT) plan which allows the test condition to be changed from use to accelerated condition on the occurrence of fixed number of failures. Various life distribution models such as exponential, Weibull, log-logistic, Burr type-Xii, etc have been used in the literature to analyze the PALT data. The need of different life distribution models is necessitated as in the presence of a limited source of data as typically occurs with modern devices having high reliability, the use of correct life distribution model helps in preventing the choice of unnecessary and expensive planned replacements. Truncated distributions arise when sample selection is not possible in some sub-region of sample space. In this paper it is assumed that the lifetimes of the items follow Truncated Logistic distribution truncated at point zero since time to failure of an item cannot be negative. Optimum step-stress PALT plan that finds the optimal proportion of units failed at normal use condition is determined by using the D-optimality criterion. The method developed has been explained using a numerical example. Sensitivity analysis and comparative study have also been carried out.

• 폴리머
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• 제32권5호
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• pp.440-445
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• 2008

정수압 상태의 선형저밀도 폴리에틸렌 튜빙의 파손 메커니즘과 파손 모폴로지를 연구하였다. 비디오현미경과 주사전자현미경을 이용한 관찰 결과, 선형저밀도 폴리에틸렌 튜빙의 파손모드는 내면에서 외면으로 진전되는 크랙을 수반하는 취성파괴임을 확인하였다. 또한 산화유발시간과 적외선분광분석을 통하여, 파손된 선형저밀도 플리에틸렌 튜빙의 단면상에 열화에 의한 발열 피크와 카르보닐 피크의 증가를 관찰하였다. 열 가속에 의한 음력과 수명특성 사이의 관계를 고려한 선형저밀도 폴리에틸렌 튜빙의 가속수명시험법 및 시험장치를 개발하였다. 선형저밀도 폴리에틸렌 튜빙의 장기 정수압 상태의 수명을 예측하기 위해 아레니우스 모델과 와이블 분포를 적용한 통계학적 기법을 도입하였다. 그 결과, 사용온도 $25^{\circ}C$에서의 선형저밀도 폴리에틸렌 튜빙의 장기수명을 평가/분석하였다.

• International Journal of Reliability and Applications
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• 제3권4호
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• pp.185-198
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• 2002

In the traditional life testing model, it is assumed that a certain number of identical items are tested under identical condition. This is due to statistical rather than practical considerations. The proportional hazards model can be used to develop a realistic approach to determine the performance of an item. That is also capable of modeling the failure rates of accelerated life testing when the covariates are applied stresses. The proportional hazards model is typically applied for a group of items to assess the importance of factors that may influence the reliability of an item. In this paper we considered the interarrival times of an item rather than the time to first failure for grouped items and provided the availability estimation for the determination of maintenance policy and overhaul time. In order to demonstrate the proposed approach, an example is presented.

• 한국군사과학기술학회지
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• 제15권2호
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• pp.215-223
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• 2012

A violet smoke hand grenade(KM18) is used to generate signals. The grenade is considered to fail when its smoke emission time is longer than the specified one so that its smoke concentration becomes lighter. Accelerated degradation test for the grenade was performed, and then failure in smoke emission time was reproduced from the test. Stress for the degradation test was selected as temperature/humidity from the pre-test results. Degraded data of emission time from the accelerated test were analyzed through applying a distibution-based degradation model. Then, Peck Model was applied to predict the storage life under field conditions. In addition, the predicted storage life was compared with that of ASRP(Ammunition Stockpile Reliability Program).

• 한국신뢰성학회지:신뢰성응용연구
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• 제8권2호
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• pp.75-85
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• 2008

In this paper, we compared domestic with foreign pilot lamps installed on the instrument board or electronic modules (car audio, air-conditional system, etc.) of an automotive vehicle by an accelerated life test in order to estimate the life of domestic pilot lamps. An accelerated life test method was developed and the relation of the life and voltage stress was analyzed. The main results are as follows; i) $B_{10}$ life of pilot lamp is above 5,000 hours, vehicle travel time for 10 years. ii) the life of domestic pilot lamp is longer than that of foreign thing. iii) the life distribution of domestic pilot lamp is wider than that of foreign thing. iv) it is possible to promote import replacement of automobile pilot lamp.

• 품질경영학회지
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• 제41권4호
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• pp.659-672
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• 2013

Purpose: The purpose of this study was to estimate life time of halogen lamps and acceleration factors using accelerated life test. Methods: Voltage was selected as an accelerating variable through the technical review about failure mechanism. The test was performed at 14.5V, 15.5V and 16.5 for 4,471 hours. It was assumed that the lifetime of Halogen lamps follow Weibull distribution and the inverse power life-stress relationship models. Results: Mean lifetimes of pin and screw types were 19,477 hours and 6,056 hours, respectively. In addition, acceleration factor of two items are calculated as 4.8 and 2.2 based on 15.5V, respectively. Conclusion: The life-stress relationship, acceleration factor, and MTTF at design condition are estimated by analyzing the accelerated life test data. These results suggest that voltage was very important factor to accelerate life time in the case of halogen lamps and the life time of pin type is three times longer than screw type lamps.

• International Journal of Reliability and Applications
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• 제18권2호
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• pp.21-44
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• 2017

Accelerated life tests (ALTs) are frequently used in manufacturing industries to evaluate the reliability of products within a reasonable amount of time and cost. Test units are subjected to elevated stresses which yield quick failures. Most of the previous works on designing ALT plans are focused on tests that involve a single stress. Many times more than one stress factor influence the product's functioning. This paper deals with the design of optimum modified ramp-stress ALT plan for Burr type XII distribution with Type-I censoring under two stress factors, viz., voltage and switching rate each at two levels- low and high. It is assumed that usage time to failure is power law function of switching rate, and voltage increases linearly with time according to modified ramp-stress scheme. The cumulative exposure model is used to incorporate the effect of changing stresses. The optimum plan is devised using D-optimality criterion wherein the ${\log}_{10}$ of the determinant of Fisher information matrix is maximized. The method developed has been explained using a numerical example and sensitivity carried out.

• 한국산학기술학회논문지
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• 제19권8호
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• pp.239-245
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• 2018

최근 무기체계의 개발에서 핵심부품 구성품의 신뢰성 시험이 국방전력발전 업무훈령 규정에 반영되고 각 종 부품의 복잡도의 증가로 인하여서 신뢰성의 중요도가 강조되고 있고 그에 따라서 신뢰성 시험의 중요성 또한 강조되고 있다. 또한 핵심 구성품의 수명시험 비용과 기간을 단축하기 위해서는 가속수명시험 기법의 적절한 적용이 요구되어 있다. 그러므로 본 논문에서는 헬기에 장착되는 블래더형 축압기를 대상으로 한 신뢰성시험 설계 방법을 연구하고 신뢰성 시험 설계에 필요한 프로세스를 제시 하였다. 축압기의 신뢰성 시험을 설계하기 위해 고장률예측, 고장모드 영향 분석, 고장나무분석 등의 기법을 이용하여 주요 고장모드와 고장 메커니즘을 조사하고 2-Stage QFD를 통하여서 각 고장모드의 우선순위 및 중요도를 체크함과 동시에 주요 스트레스 인자를 분석하여 적절한 가속 모델을 선택했다. 그리고 필요 시료 수와 신뢰도 수준 및 각각의 스트레스 조건에 따라서 무고장 시험 설계법을 참고하여 정상상태의 신뢰성시험을 설계하였고 또한 선택한 가속 모델을 사용하여 계산한 가속계수에 따라 가속 수명시험시간을 계산하였다.

• International Journal of Reliability and Applications
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• 제15권1호
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• pp.23-50
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• 2014

This paper deals with formulation of optimum multi-objective modified step-stress accelerated life test (ALT) plan for Burr type-XII distribution under type-I censoring. Since it is impractical to estimate only one objective parameter after conducting costly ALT tests; also, it is not desirable to assume instantaneous changes in stress levels because of limited capacity of test equipments and the presence of undesirable failure modes, therefore, an optimum multi-objective modified step-stress ALT plan has been designed. The optimal test plan consists in determining the optimum low stress level and optimal time at which stress starts linearly increasing from low stress by minimizing the weighted sum of the asymptotic variances of the maximum likelihood estimator of quantile lifetimes at design constant stress. The method developed has been illustrated using an example. Sensitivity analysis has been carried out. Comparative study has also been done to highlight the merits of the proposed model.

• 한국신뢰성학회:학술대회논문집
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• 한국신뢰성학회 2004년도 정기학술대회
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• pp.239-246
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• 2004

가속열화시험은 가속수명시험시에 고장 개수가 적거나 심지어 고장이 발생하지 않는 경우에도 부품의 신뢰성을 평가할 수 있는 유용한 수단이 되고 있다. 본 연구에서는, 능동소자로 높은 유전용량을 갖는 적층 세라믹 콘덴서(X7R -55$^{\circ}C$~1$25^{\circ}C$)에 대한 가속열화시험을 실시하고, 정격온도의 최대치에서 다른 배율의 전압을 인가하여 단순선형회귀에 의한 특성치의 경시변화를 설명한다고 가정하였다. 최소제곱법을 적용하여 시료가 대수정규분포를 따를 때의 열화량을 설명한 후, 특성치-시간간의 선형관계 및 대수정규분포의 독립성을 검정하여 가정의 적절성을 검정하였다. 마지막으로 아이링모델에 의한 평균수명을 평가하였다.