• The Journal of the Korea Contents Association
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• v.12 no.7
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• pp.255-260
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• 2012

This study aims to examine the generation of scatter rays by dividing it into the presence of the subject at the chest X-ray examination, the X-ray tube and detector in the X-ray room, the front of the patient window, the outside of the entrance door of the patient waiting room, opening of the entrance door, the outside of the radiological technologist's entrance door, and the opening of the radiological technologist's entrance door, etc. When there is a subject, as the subject is thicker, more scatter rays occur at each of the spots for measurement. And when the entrance door is closed at the measurement, fewer scatter rays are generated.

• Journal of the Korean Society of Radiology
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• v.15 no.3
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• pp.345-353
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• 2021

Digital radiography imaging systems can also help diagnose lesions in patients, but if x-rays that enter the human body cause scatter x-ray due to interaction with substances, they affect the signal and noise characteristics of digital x-ray images. To regard the human body as polymethyl methacrylate (PMMA) and observe the properties of scattered x-ray generated from PMMA on x-ray images, we analyze signal and noise in the spatial domain as well as noise-power spectrum (NPS), and detective quantum efficiency (DQE) at zero frequency. As PMMA thickness increased, signals decreased, the noise increased, and NPS degradation was identified in overall spatial frequencies. Based on these characteristics, zero-frequency performance was also shown to be degraded. Comparative analysis with Monte-carlo simulations will need to be made to analyze the zero-frequency performance by scattered x-ray of indirect conversion-type x-ray detectors more quantitatively.

• Progress in Medical Physics
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• v.26 no.4
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• pp.215-222
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• 2015

In this work, we performed a proof-of-concept experiment for phase-contrast x-ray imaging (PCXI) based on a single antiscatter grid and a polychromatic x-ray source. We established a table-top setup which consists of a focused-linear grid having a strip density of 200 lines/inch, a microfocus x-ray tube having a focal-spot size of about $5{\mu}m$, and a CMOS-type flat-panel detector having a pixel size of $48{\mu}m$. By using our prototype PCXI system and the Fourier demodulation technique, we successfully obtained attenuation, scattering, and differential phase-contrast images of improved visibility from the raw images of several selected samples at x-ray tube conditions of $90kV_p$ and 0.1 mAs. Further, fusion image (e.g., the attenuation+the scattering) may have an advantage in displaying details of the sample's structures that are not clearly visible in the conventional attenuation image. Our experimental results indicate that single-grid-based approach seems a useful method for PCXI with great simplicity and minimal requirements on the setup alignment.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.18 no.10
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• pp.97-101
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• 2017

X-ray diffractometers are used to characterize material properties, such as the phase, texture, lattice constant and residual stress, based on the diffracted beams obtained from specimens. Quantitative analyses using X-rays are typically conducted by measuring the peak positions of the diffracted beams. However, the long-term use of the diffractomer, like any other machine, results in errors associated with the mechanical parts, which can deteriorate the accuracy of the quantitative analyses. In this study, the process of correcting systematic errors in the $2{\theta}$ range of $30{\sim}90^{\circ}$ is discussed, for which strain-free Si powders from NIST were used as the standard specimens. For the evaluation of the impact of such error correction, we conducted a quantitative analysis of the true lattice constant for tungsten thin films.

• Journal of the Korean Magnetics Society
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• v.3 no.2
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• pp.101-107
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• 1993

The crystallographic properties of the polycrystalline materials $Fe_{1+X}Eu_{1-X}O_{3}$(X = -0.06, 0.0, 0.1, 0.2, 0.3, 0.4) have been studied by the methods of X-ray diffraction and $M\"{o}ssbauer$ spectroscopy. The results showed that the samples with the composition range of $0.2{\leq}x{\leq}0.3$ had the garnet crystal phase, while those with $-0.06{\leq}x{\leq}0.0$ had the orthoferrite phase. However, with the tendency for the orthoferrite phase to convert into the trigonal phase via garnet phase as increasing the composition x, the orthoferrite-garnet and garnet-trigonal phase coexisted dominantly in the range of 0.0 < x < 0.2 and $0.4{\geq}x$, respectively. The analyzed results of $M\"{o}ssbauer$ spectrum indicated existence of some vacancies in the d-site of garnet phase, which can be related to the change of intensity in X-ray diffraction patterns.

• Journal of Radiation Protection and Research
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• v.40 no.2
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• pp.110-117
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• 2015

Recently, Due to the increased industry using radiation inspection equipment in the semiconductor, this demand of technology research is increasing. Although semiconductor inspection equipment is using low energy X-ray from 40 keV to 120 keV, Studies of radiation damage about the low energy X-ray are lacking circumstance in our country. Therefore, It is study that BJT (bipolar junction transistor) of one type of semiconductor elements are received radiation damage by low energy X-ray. BJT were used to the NXP semiconductor company's BC817-25 (NPN type), and Used the X-ray generator for the irradiation. Radiation damage of BJT was evaluated that confirm to analyse change of collector-emitter voltage of before and after X-ray irradiation when current gain fixed to 10. X-ray generator of tube voltage was setting 40 kVp, 60 kVp, 80 kVp, 100 kVp, 120 kVp and irradiation time was setting 180s, 360s, 540s into 180s intervals. As the result, We confirmed radiation damage in BJT by low energy X-ray under 120 keV energy, and Especially the biggest radiation damage was appeared at the 80 kVp. It is expected that ELDRS (enhanced low dose rate sensitivity) phenomenon occurs on the basis of 80 kVp. This studies expect to contribute effective dose administration of semiconductor inspection equipment using low energy X-ray, Also Research and Development of X-ray filter.

• Journal of the Korean Society of Radiology
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• v.6 no.6
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• pp.477-481
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• 2012

An X-ray diffractometer which has various X-ray optics can give qualitative and quantitative information for a sample using a nondestructive analysis method. A parallel beam optic passes the parallel beam and removes divergent beam generated from an X-ray tube. The parallel beam optic used in the X-ray diffractometer was fabricated by wire cut and grading of stainless steel plates and was evaluated its performance using an X-ray imaging system. The measured parallelization of 6.6 mrad for the fabricated the parallel beam optic was a very close to the expected value of 6 mrad. An X-ray imaging technique for evaluating the parallel beam optics can estimate parallelization for each plate and can be used to other X-ray optics.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.08a
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• pp.238-238
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• 2013

사파이어 단결정은 광학 투명도, 물리적 강도, 충격 저항, 마모 부식, 높은 압력 및 온도 내구성, 생체 호환성 등 다양한 특성을 가지고 있어 다양한 분야에서 사용되고 있으며, 특히 최근에는 백색 또는 청색 LED 소자 분야에서 기판으로 주로 활용되고 있다. 이러한 사파이어 단결정 기판은 공정에서 결정 성장 조건 및 기계적 연마 등의 다양한 요인으로 결정학적 결함이 발생한다. 이러한 결정학적 결함을 제어함으로서 좋은 품질의 단결정 기판을 생산할 수 있다. 이에 따라 각종 결함 제어를 위해서 X-선, EPD, 레이저 편광법 등 다양한 방법으로 결함들을 측정하고 있다. 그 중에서도 X-선 토포그래피는 시료를 비파괴적인 방법으로 단결정의 결함 밀도와 유형 등을 파악하는데 매우 유용한 측정법이며, Lang 토포그래피로 대표되는 X-선 회절 투과법은 기판과 같은 대구경의 시료를 우수한 분해능으로 내부 결함까지 관찰할 수 있는 장점을 지니고 있다. 본 연구에서는 대구경 사파이어 단결정 기판에 내재하는 결정 결함을 확인 및 분석하기 위해 X-선 Lang 토포그래피(X-ray Lang Topography) 장비를 구축하였다. 그리고 4, 6인치 c-면 사파이어 단결정 기판의 (110), (102) 회절면의 X-선 토포그래피 측정을 통해 전위(dislocation), 스크래치(scratch), 표면데미지(surface damage), 트윈(twin), 잔류 응력(strain) 등의 결함의 유형을 식별 및 분석하였으며, 각각의 결함들의 토포그래피 이미지 형성 메커니즘에 대해 분석하였다. 이를 통해 X-선 Lang 토포그래피(X-ray Lang Topography) 장비가 대구경 사파이어 단결정 기판의 결정 결함 평가에 폭넓은 활용이 가능할 것으로 예상된다.

• Proceedings of the Korea Multimedia Society Conference
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• 2012.05a
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• pp.30-33
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• 2012

대사성 골 질환인 골다공증(Osteoporosis)의 조기 진단을 위해 X 선 영상에서 골 밀도를 측정하는 방법이 최근 연구되고 있다. 골 밀도는 X 선 영상에서 뼈가 분리되고, 분리된 영역에서의 픽셀에 의해 BMD가 측정되는데, 개선된 영상에서의 정밀한 뼈 추출이 주요한 요소이므로 X 선 영상의 개선은 골다공증의 조기 진단을 위해 필수적이다. 본 논문에서는 sparse 표현법을 도입하여 X 선 영상을 개선시키는 방법을 제안한다. 실험을 통해 제안한 방법의 결과가 기존의 방법인 웨이블릿 BayesShrink에 비해 개선됨을 CNR(Contrast to Noise Ratio)을 통해 확인하였다.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.24 no.12
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• pp.1704-1710
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• 2020

The high-energy X-ray imaging detector used for container inspection uses a thick scintillator to effectively acquire X-rays. X-ray incident on the scintillator is generally up to 9MeV. Therefore, to effectively collect X-ray, it is necessary to use a thick scintillator. To collect the light generated by the reaction between X-ray and scintillator, an optical-sensor must be combined with the scintillator. In this study, a study on the design conditions of the detector using a CdWO4 and a small sensor is described. To calculate the collected light according to the change of the scintillator thickness and the reflectance of surface, MCNP6 and DETECT2000 were used. As a result of calculating, it was confirmed that when the reflectance of the surface was low, it was appropriate to select a scintillator with a thickness of 15 to 20-mm, but as the reflectance increased, it was confirmed that it was appropriate to select a CdWO4 with a thickness of 25 to 30-mm.