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http://dx.doi.org/10.6109/jkiice.2020.24.12.1704

The Change of Collected Light According to Changing of Reflectance and Thickness of CdWO4 Scintillator for High Energy X-ray Imaging Detection  

Lim, Chang Hwy (M1 International)
Park, Jong-Won (Ocean System Engineering Research Division, KRISO)
Lee, Junghee (Ocean System Engineering Research Division, KRISO)
Publication Information
Journal of the Korea Institute of Information and Communication Engineering / v.24, no.12, 2020 , pp. 1704-1710 More about this Journal
Abstract
The high-energy X-ray imaging detector used for container inspection uses a thick scintillator to effectively acquire X-rays. X-ray incident on the scintillator is generally up to 9MeV. Therefore, to effectively collect X-ray, it is necessary to use a thick scintillator. To collect the light generated by the reaction between X-ray and scintillator, an optical-sensor must be combined with the scintillator. In this study, a study on the design conditions of the detector using a CdWO4 and a small sensor is described. To calculate the collected light according to the change of the scintillator thickness and the reflectance of surface, MCNP6 and DETECT2000 were used. As a result of calculating, it was confirmed that when the reflectance of the surface was low, it was appropriate to select a scintillator with a thickness of 15 to 20-mm, but as the reflectance increased, it was confirmed that it was appropriate to select a CdWO4 with a thickness of 25 to 30-mm.
Keywords
$CdWO_4$; MCNP6; DETECT2000; Container Inspection System; X-ray;
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Times Cited By KSCI : 2  (Citation Analysis)
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