• Journal of the Korean Professional Engineers Association
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• v.20 no.3
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• pp.15-25
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• 1987

Statistical control charts are useful tools to monitor and control the manufacturing processes and are widely used in most Korean industries. Many Korean companies, however, do not always obtain desired results from the traditional control charts by Shewhart such as the X-chart, X-chart, X-chart, etc. This is partly because the quality charterstics of the process are not distributed normally but are skewed due to the intermittent production, small lot size, etc. In Shewhart X-chart, which is the most widely used one in Korea, such skewed distributions make the plots to be inclined below or above the central line or outside the control limits although no assignable causes can be found. To overcome such shortcomings in nonnormally distributed processes, a distribution-free type of confidence interval can be used, which should be based on order statistics. This thesis is concerned with the design of control chart based on a sample median which is easy to use in practical situation and therefore properties for nonnormal distributions may be easily analyzed. Control limits and central lines are given for tile more famous nonnormal distributions, such as Gamma, Beta, Lognormal, Weibull, Pareto, Truncated-normal distributions. Robustness of the proposed median control chart is compared with that of the X-chart, the former tends to be superior to the latter as the probability distribution of the process becomes more skewed. The average run length to detect the assignable cause is also compared when the process has a Normal or a Gamma distribution for which the properties of X are easy to verify, the proposed chart is slightly worse than the X-chart for the normally distributed product but much better for Gamma-distributed products. Average Run Lengths of the other distributions are also computed. To use the proposed control chart, the probability distribution of the process should be known or estimated. If it is not possible, the results of comparison of the robustness force us to use the proposed median control chart based on a normal distribution. To estimate the distribution of the process, Sturge's formula is used to graph the histogram and the method of probability plotting, $X^2$-goodness of fit test and Kolmogorov-Smirnov test, are discussed with real case examples. A comparison of the propose4 median chart and the X chart was also performed with these examples and the median chart turned out to be superior to the X-chart.

• Proceedings of the Korean Society for Quality Management Conference
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• 2004.04a
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• pp.64-69
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• 2004

This research investigates statistical characteristics of variable sampling size & interval(VSSI) X charts under two assignable causes. Algorithms for calculating the average run length(ARL) and average time to signal(ATS) of the VSSI X chart are proposed by employing Markov chain method. Extensive sensitivity analysis shows that the VSSI. X chart is superior to the VSS or VSI X chart as well as to the Shewhart X chart in statistical sense, even under two assignable causes.

• Journal of Korean Society for Quality Management
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• v.40 no.3
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• pp.327-336
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• 2012

Purpose: In this study, we research the hurdle rate method to suggest the robust control chart for a contaminated process less vulnerable to fault values than existing control charts. Methods: We produce the results of p, ARL values to compare the performance of two control charts, $\bar{x}-s$ that has been used typically and TM-TS that is suggested by this paper. We implement the simulation focusing on three cases, change of deviation, mean and both of them. Results: We draw a conclusion that the TM-TS control chart has better efficiency than $\bar{x}-s$ control chart over the three cases. Conclusion: We insist that applying TM-TS control chart for a polluted process is more effective than $\bar{x}-s$ control chart.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.10 no.16
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• pp.101-106
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• 1987

Statistical control charts are useful tools to monitor and control the manufacturing processes and are widely used in most Korean industries. Many Korean companies, however, do not always obtain desired results from the traditional control charts by Shewhart such as the $\bar{X}$-chart, $\bar{X}$-chart, $\bar{X}$-chart, etc. This is partly because the quality charterstics of the process are not distributed normally but are skewed due to the intermittent production, small lot size, etc. In Shewhart $\bar{X}$-chart. which is the most widely used one in Kora, such skewed distributions make the plots to be inclined below or above the central line or outside the control limits although no assignable causes can be found. To overcome such shortcomings in nonnormally distributed processes, a distribution-free type of confidence interval can be used, which should be based on order statistics. This thesis is concerned with the design of control chart based on a sample median which is easy to use in practical situation and therefore properties for nonnormal distributions may be easily analyzed. Control limits and central lines are given for the more famous nonnormal distributions, such as Gamma, Beta, Lognormal, Weibull, Pareto, Truncated-normal distributions. Robustness of the proposed median control chart is compared with that of the $\bar{X}$-chart; the former tends to be superior to the latter as the probability distribution of the process becomes more skewed. The average run length to detect the assignable cause is also compared when the process has a Normal or a Gamma distribution for which the properties of X are easy to verify, the proposed chart is slightly worse than the $\bar{X}$-chart for the normally distributed product but much better for Gamma-distributed products. Average Run Lengths of the other distributions are also computed. To use the proposed control chart, the probability distribution of the process should be known or estimated. If it is not possible, the results of comparison of the robustness force us to use the proposed median control chart based oh a normal distribution. To estimate the distribution of the process, Sturge's formula is used to graph the histogram and the method of probability plotting, $\chi$$^2$-goodness of fit test and Kolmogorov-Smirnov test, are discussed with real case examples. A comparison of the proposed median chart and the $\bar{X}$ chart was also performed with these examples and the median chart turned out to be superior to the $\bar{X}$-chart.

• Communications for Statistical Applications and Methods
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• v.19 no.5
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• pp.685-696
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• 2012

These days the interest of quality leads to the necessity of control charts for monitoring the process in various fields of practical applications. The $\overline{X}$ chart is one of the most widely used tools for quality control that also performs well under the normality of quality characteristics. However, quality characteristics tend to have nonnormal properties in real applications. Numerous recent studies have tried to find and explore the performance of $\overline{X}$ chart due to non-normality; however previous studies numerically examined the effects of non-normality and did not provide any theoretical justification. Moreover, numerical studies are restricted to specific type of distributions such as Burr or gamma distribution that are known to be flexible but can hardly replace other general distributions. In this paper, we approximate the false alarm rate(FAR) of the $\overline{X}$ chart using the Edgeworth expansion up to 1/n-order with the fourth cumulant. This allows us to examine the theoretical effects of nonnormality, as measured by the skewness and kurtosis, on $\overline{X}$ chart. In addition, we investigate the effect of skewness and kurtosis on $\overline{X}$ chart in numerical studies. We use a skewed-normal distribution with a skew parameter to comprehensively investigate the effect of skewness.

• Journal of the Korea Safety Management & Science
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• v.14 no.3
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• pp.167-174
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• 2012

In the manufacturing process the most widely used $\bar{X}$ chart has been applied to control the process mean. Also, Accelerated Life Test(ALT) is commonly used for efficient assurance of product life in development phases, which can be applied in production reliability acceptance test. When life data has lognormal distribution, through censored ALT design so that censored ALT data has asymptotic normal distribution, $ALT\bar{X}$ control chart integrating $\bar{X}$ chart and ALT procedure could be applied to control the mean of process in the manufacturing process. In the situation that process variation is controlled, $Z_p$ control chart is an effective method for the very small fraction nonconforming of quality characteristic. A simultaneous control scheme with $ALT\bar{X}$ control chart and $Z_p$ control chart is designed for the very small fraction nonconforming of product lifetime.

• Journal of the Korean Data and Information Science Society
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• v.22 no.1
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• pp.29-35
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• 2011

In statistical process control, the primary method used to monitor the number of nonconformities is the c-chart. The conventional c-chart is based on the assumption that the occurrence of nonconformities in samples is well modeled by a Poisson distribution. When the Poisson assumption is not met, the X-chart is often used as an alternative charting scheme in practice. And CUSUM-chart is used when it is desirable to detect out of control situations very quickly because of sensitive to a small or gradual drift in the process. In this paper, I compare CUSUM-chart to X-chart for the Katz family covering equi-, under-, and over-dispersed distributions relative to the Poisson distribution.

• Korean Journal of Air-Conditioning and Refrigeration Engineering
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• v.10 no.6
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• pp.666-673
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• 1998

Solubilities (LiBr+$CaC1_2$) in water were measured at temperatures form 267.51 to 306.17K for $CaC1_2$ (LiBr+$CaC1_2$)=0.24 by mole. Experimental data were correlated with polynomial equations. Average absolute deviations between the measured and calculated values were 0.31% at concentration smaller than 60wt% and 0.41% at concentration larger than 60wt%, respectively. Vapor pressures were measured at temperatures from 296.75 to 436.75K and concentrations from 40 to 70wt%. Vapor pressure data were fitted to a Antoine-type equation and average absolute deviation was 2.98%. The P-T-X chart and H-T-X chart of $H_2O$/(LiBr+$CaC1_2$) system were constructed by using the correlation equations of solubility, vaper pressure, and heat capacity. The P-T-X chart indicates that $H_2O$/(LiBr+$CaC1_2$) system has potential as a possible working fluid for air-cooled absorption chillers.

• Industrial Engineering and Management Systems
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• v.8 no.3
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• pp.139-147
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• 2009

Control charts are used to distinguish between chance and assignable causes in the variability of quality characteristics. When a control chart signals that an assignable cause is present, process engineers must initiate a search for the assignable cause of the process disturbance. Identifying the time of a process change could lead to simplifying the search for the assignable cause and less process down time, as well as help to reduce the probability of incorrectly identifying the assignable cause. The change point estimation by likelihood theory and the built-in change point estimation in a control chart have been discussed until now. In this article, we discuss two kinds of process change point estimation when the CUSUM ($\bar{x}$, s) control chart for monitoring process mean and variance simultaneously is operated. Throughout some numerical experiments about the performance of the change point estimation, the change point estimation techniques in the CUSUM ($\bar{x}$, s) control chart are considered.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.38 no.1
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• pp.15-20
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• 2015

Control charts are generally used for process control, but the role of traditional control charts have been limited in case of a non-contaminated process. Traditional ${\bar{x}}$-s control chart has not been activated well for such a problem because of trying to control processes as center line and control limits changed by the contaminated value. This paper suggests modified ${\bar{x}}$-s control chart based on robust estimation. In this paper, we consider the trimmed mean of the sample means and the trimmed mean of the sample standard deviations. By comparing with ARL value, the responding results are decided. The comparison resultant results of traditional control chart and modified control chart are contrasted.