• Proceedings of the Korean Society of Precision Engineering Conference
• /
• 2010.05a
• /
• pp.471-472
• /
• 2010

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
• /
• v.19 no.8
• /
• pp.1-7
• /
• 2005

We introduced the method to obtain four speckle patterns with relative phase shift of ${\pi}/2$ by the polarizing elements, and calculate the phase at each point of the speckle pattern in shearography using Wollaston prism and polarizing elements. Ant we analyzed the phase error caused by the azimuth angles of wave plates used in the proposed method by Jones matrix.

• Journal of the Optical Society of Korea
• /
• v.8 no.3
• /
• pp.122-126
• /
• 2004

The method to obtain four speckle patterns with relative phase shift of ${\pi}/2$ by passive devices such as two waveplates and a linear polarizer, awl to calculate the phase at each point of the speckle pattern in shearography with a Wollaston prism is presented, and the feasibility of the proposed method is theoretically demonstrated by Jones vector.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
• /
• v.18 no.6
• /
• pp.8-13
• /
• 2004

We presented the method to obtain four speckle interferograms with relative phase shift of $\pi$/2 by passive devices such as waveplate and polarizer, calculate the phase at each point of the speckle interferogram in shearography using Wollaston prism, and theoretically demonstrated the feasibility of the unposed method by Jones matrix.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
• /
• v.19 no.1
• /
• pp.34-39
• /
• 2005

We presented the method to obtain four speckle patterns with relative phase shift of ${\pi}/2$ by passive devices such as wave plate and polarizer, and calculate the phase at each point of the speckle pattern in shearography using Wollaston prism. And, we analyzed the phase error caused by wave plates used in the proposed method by Jones matrix.

• Journal of the Optical Society of Korea
• /
• v.9 no.4
• /
• pp.145-150
• /
• 2005

The method to obtain four speckle patterns with relative phase shift of $\pi$/2 by passive devices such as two waveplates and a linear polarizer, and to calculate the phase at each point of the speckle pattern in shearography with a Wollaston prism is described. In this paper, we analyze its potential error sources caused by wave plates.

• Journal of the Semiconductor & Display Technology
• /
• v.4 no.1 s.10
• /
• pp.17-21
• /
• 2005

We presented a new method to obtain four speckle interferograms with relative phase shift of $\pi$/2 by passive devices such as waveplate and polarizer, calculate the phase at each point of the speckle interferogram in shearography using Wollaston prism, which can be applied to the deformation evaluation of semiconductor devices, and theoretically demonstrated the feasibility of the proposed method by Jones matrix.

• Journal of the Optical Society of Korea
• /
• v.16 no.4
• /
• pp.457-461
• /
• 2012

A real-time method to measure full field retardation near quarter wavelength is proposed. The circularly polarized beam passes through a sample with a large aperture. The measuring beam then goes through a quarter-wave plate and is then split by a Wollaston prism. An image with two sub-images is then detected by a high-speed image sensor. The full field retardation near quarter wavelength can be obtained in real time by processing the image. The measured retardation is independent of the fast axis angle of the sample and the fluctuation of the initial intensity. In experiments, a wedge waveplate is measured with different fast axis angle and initial intensity, and the full field retardations are acquired. The maximum and standard deviation of the full field retardation is $1.5^{\circ}$ and $0.4^{\circ}$. The validity of the method is verified.

• Journal of the Korean Society for Precision Engineering
• /
• v.22 no.9 s.174
• /
• pp.69-76
• /
• 2005

The laser interferometer system such as HP5529A is one of the most powerful equipment fur measurement of the straightness error in precision stages. The straightness measurement system, HP5529A is composed of a Wollaston prism and a reflector. In this system, the straightness error is defined as relative lateral motion change between the prism and the reflector and computed from optical path difference of two polarized laser beams between these optics. However, rotating motion of the prism or the reflector used as a moving optic causes unwanted straightness error. In this paper, a compensation method is proposed for removing the unwanted straightness error generated by rotating the moving optic and an experiment is carried out for theoretical verification. The result shows that the unwanted straightness error becomes very large when the reflector is used as the moving optic and the distance between the reflector and the prism is far. Therefore, the prism must be generally used as the moving optic instead of the reflector so as to reduce the measurement error. Nevertheless, the measurement error must be compensated because it's not a negligible error if a rotating angle of the prism is large. In case the reflector must be used as the moving optic, which is unavoidable when the squareness error is measured between two axes, this compensation method can be applied and produces a better result.

• Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
• /
• 2005.11a
• /
• pp.185-188
• /
• 2005

We present the method to obtain four speckle patterns with relative phase shift of ${\pi}/2$ by passive devices such as wave plate and polarizer, and calculate the phase at each point of the speckle pattern in shearographic system using Wollaston prism. And, we analyzed the phase error caused using wave plates by Jones matrix.