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http://dx.doi.org/10.3807/JOSK.2012.16.4.457

Real-time Measurement of Full Field Retardation Near Quarter Wavelength  

Liu, Longhai (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences)
Zeng, Aijun (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences)
Yuan, Qiao (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences)
Zhu, Linglin (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences)
Fang, Ruifang (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences)
Huang, Huijie (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences)
Publication Information
Journal of the Optical Society of Korea / v.16, no.4, 2012 , pp. 457-461 More about this Journal
Abstract
A real-time method to measure full field retardation near quarter wavelength is proposed. The circularly polarized beam passes through a sample with a large aperture. The measuring beam then goes through a quarter-wave plate and is then split by a Wollaston prism. An image with two sub-images is then detected by a high-speed image sensor. The full field retardation near quarter wavelength can be obtained in real time by processing the image. The measured retardation is independent of the fast axis angle of the sample and the fluctuation of the initial intensity. In experiments, a wedge waveplate is measured with different fast axis angle and initial intensity, and the full field retardations are acquired. The maximum and standard deviation of the full field retardation is $1.5^{\circ}$ and $0.4^{\circ}$. The validity of the method is verified.
Keywords
Retardation; Birefringence; Real-time measurement; Waveplate; Wollaston prism;
Citations & Related Records
Times Cited By KSCI : 3  (Citation Analysis)
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