Measurements of Interface States In a MOS Capacitor by DLTS System Using Wideband Monophase Lock-in Amplifier (광대역 단상 Lock-in 증폭기 DLTS 시스템을 이용한 MOS Capacitor 계면상태 측정)
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- Journal of the Korean Institute of Telematics and Electronics
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- v.23 no.6
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- pp.807-813
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- 1986