• ETRI Journal
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• v.39 no.4
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• pp.605-613
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• 2017

Simulated fault injection (SFI) is widely used to assess the effectiveness of fault tolerance mechanisms in safety-critical embedded systems (SCESs) because of its advantages such as controllability and observability. However, the long test time of SFI due to the large number of test cases and the complex simulation models of modern SCESs has been identified as a limiting factor. We present a method that can accelerate an SFI tool using a checkpoint forwarding (CF) technique. To evaluate the performance of CF-based SFI (CF-SFI), we have developed a CF mechanism using Verilog fault-injection tools and two systems under test (SUT): a single-core-based co-simulation model and a triple modular redundant co-simulation model. Both systems use the Verilog simulation model of the OpenRISC 1200 processor and can execute the embedded benchmarks from MiBench. We investigate the effectiveness of the CF mechanism and evaluate the two SUTs by measuring the test time as well as the failure rates. Compared to the SFI with no CF mechanism, the proposed CF-SFI approach reduces the test time of the two SUTs by 29%-45%.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.16 no.1
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• pp.683-690
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• 2015

Two basic FFT(Fast Fourier Transform) algorithms are the DIT(Decimation-In-Time) and the DIF (Decimation-In-Frequency). In spite of the advantage of the DIT algorithm is to generate a sequential output, various structures have not been made. In this paper, a new DIT Radix-4 FFT butterfly structure are proposed and implemented using Verilog coding. Through synthesis, it is shown that the 64-point FFT is implemented by 6.78 million gates. Since the proposed FFT structure has the advantage of a sequential output, it can be used in OFDM communication SoC(System on a Chip) which need a high speed FFT output.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.27 no.1A
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• pp.66-72
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• 2002

In this paper, we implemented the GenJTAG, a CAD tool, which generates a code of boundary scan circuit supporing a board level testing and d BIST(Built-In Self Test) written in verilog-HDL. A boundary scan circuit code that supports user's own BIST instructions is generated based on the informations from the users. Most CAD tools hardly allow users to add their own BIST instructions because the generated code described in gate-level. But the GenJTAG generates a behavioral boundary scan circuit code so users can easily make a change on the generated code.

• Nuclear Engineering and Technology
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• v.45 no.4
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• pp.477-488
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• 2013

The PLC (Programmable Logic Controller) has been widely used to implement real-time controllers in nuclear RPSs (Reactor Protection Systems). Increasing complexity and maintenance cost, however, are now demanding more powerful and cost-effective implementation such as FPGA (Field-Programmable Gate Array). Abandoning all experience and knowledge accumulated over the decades and starting an all-new development approach is too risky for such safety-critical systems. This paper proposes an RPS software development process with a platform change from PLC to FPGA, while retaining all outputs from the established development. This paper transforms FBD designs of the PLC-based software development into a behaviorally-equivalent Verilog program, which is a starting point of a typical FPGA-based hardware development. We expect that the proposed software development process can bridge the gap between two software developing approaches with different platforms, such as PLC and FPGA. This paper also demonstrates its effectiveness using an example of a prototype version of a real-world RPS in Korea.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.6 s.360
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• pp.34-41
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• 2007

We popose a programmed on-line to FSM-based Programmable BIST(Buit-In Self-Test) with selected command, to select a test algorithm from a predetermined set of algorithms that are built in the Flash memory BIST. Thus, the proposed scheme greatly simplifies the testing process. Besides, the proposed FSM-based Programmable BIST is more efficient in terms of circuit size and test data to be applied, and it requires less time to configure the Flash memory BIST. We also will develop a programmable Flash memory BIST generator that automatically produces Verilog code of the proposed BIST architecture for a given set of test algorithms. If experiment the proposed method, the proposed method will achieves a good flexibility with smaller circuit size compared with previous methods.

• Journal of IKEEE
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• v.18 no.3
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• pp.305-312
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• 2014

IIt takes a lot of time and needs the workloads to verify the RTL code used in complex system like a nuclear control system which is required high level reliability using simple testbench. UVM has a layered testbench architecture and it is easy to modify the testbench to improve the code coverage. A test vector can be easily constructed in the UVM, since a constrained random test vector can be used even though the construction of testbench using UVM. We showed that the UVM testbench is easier than the verilog testbench for the analysis and improvement of code coverage.

• Journal of Electrical Engineering and Technology
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• v.12 no.5
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• pp.2014-2020
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• 2017

A compact current model applicable to both single-gate (SG) and double-gate (DG) tunneling field-effect transistors (TFETs) is presented. The model is based on Kane's band-to-band tunneling (BTBT) model. In this model, the well-known and previously-reported quasi-2-D solution of Poisson's equation is used for the surface potential and length of the tunneling path in the tunneling region. An analytical tunneling current expression is derived from expressions of derivatives of local electric field and surface potential with respect to tunneling direction. The previously reported correction factor with three fitting parameters, compensating for superlinear onset and saturation current with drain voltage, is used. Simulation results of the proposed TFET model are compared with those from a technology computer-aided-design (TCAD) simulator, and good agreement in all operational bias is demonstrated. The proposed SG/DG-TFET model is developed with Verilog-A for circuit simulation. A TFET inverter is simulated with the Verilog-A SG/DG-TFET model in the circuit simulator; the model exhibits typical inverter characteristics, thereby confirming its effectiveness.

• Journal of Korea Multimedia Society
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• v.1 no.2
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• pp.154-161
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• 1998

This paper proposes a parallel processor system which processes cultural assets image recognition and retrieval algorithm in real time. A serial algorithm which is developed for the parallel processor system is parallellized. The parallel processor system consists of a control unit, 100 PE(Processing Elements), and 10 Park's multi-access memory systems which has 11 memory modules per each one. The parallel processor system is simulated by CADENCE Verilog-XL which is a package for the hardware simulation. With the same simulated results as that of the serial algorithm, the speed ratio of the parallel algorithm to the serial one is 81. The parallel processor system we proposed is quite effective for cultural assets image processing.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.7 no.3
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• pp.384-389
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• 2003

A new two-step soft-output Viterbi algorithm (SOVA) decoder architecture is presented. A significant reduction in the decoding latency can be achieved through the use of the dual-port RAM in the survivor memory structure of the trace-back unit. The system complexity can be lowered due to the determination of the absolute value of the path metric differences inside the add-compare-select (ACS) unit. The proposed SOVA architecture was verified successfully by the functional simulation of Verilog HDL modeling and the FPGA prototyping. The SOVA decoder achieves a data rate very close to that of the conventional Viterbi Algorithm (VA) decoder and the resource consumption of the realized SOVA decoder is only one and a half times larger than that of the conventional VA decoder.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.27 no.10C
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• pp.980-986
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• 2002

In the fast data communication system, synchronized by a clock source, the loss of data will often occur due to several reasons as a differential routing path between data and clock, a differential propagation delay of components or an unstable phase of clock and data by external noise. In this paper, we describe the ASIC implementation of the data compensation circuit which can detect the data loss from above problems and recovery to original data with stable synchronization. Especially it supports a strong stability and a good BER in the communication system for fast data transfer as optic area. This circuit is implemented by Verilog HDL and available to the digital ASIC implementations related to fast data transfer.