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FSM-based Programmable Built-ln Self Test for Flash Memory  

Kim, Ji-Hwan (Computer, Soongsil University)
Chang, Hoon (Computer, Soongsil University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.44, no.6, 2007 , pp. 34-41 More about this Journal
Abstract
We popose a programmed on-line to FSM-based Programmable BIST(Buit-In Self-Test) with selected command, to select a test algorithm from a predetermined set of algorithms that are built in the Flash memory BIST. Thus, the proposed scheme greatly simplifies the testing process. Besides, the proposed FSM-based Programmable BIST is more efficient in terms of circuit size and test data to be applied, and it requires less time to configure the Flash memory BIST. We also will develop a programmable Flash memory BIST generator that automatically produces Verilog code of the proposed BIST architecture for a given set of test algorithms. If experiment the proposed method, the proposed method will achieves a good flexibility with smaller circuit size compared with previous methods.
Keywords
플래시 메모리;외란 고장;FSM 기반의 프로그래머블 BIST;
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