A Study on Improvement Latch-up immunity and Triple Well formation in Deep Submicron CMOS devices (Deep Submicron급 CMOS 디바이스에서 Triple Well 형성과 래치업 면역 향상에 관한 연구)
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- Journal of the Korean Institute of Telematics and Electronics D
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- v.35D no.9
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- pp.54-61
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- 1998