• 한국철도학회:학술대회논문집
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• 한국철도학회 2003년도 추계학술대회 논문집(III)
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• pp.606-610
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• 2003

The 200 class insulation system which adopted to traction motor have excellent dielectric strength but weaken to thermal stress therefore deterioration phenomena analysis according to thermal stress is necessary. Accelerated thermal aging tests have been used to determine thermal reliability of stator coils used as traction motor in electric multiple unit. The conventional aging test is carried on according to IEC 60034-18-31 and IEEE Std. 275-1992. Variation in insulation resistance, P.I, capacitance, dielectric loss($tan{\delta}$) and partial discharge are measured during the aging cycle. Sample coils for traction motor were tested by accelerated aging test which composed of heat, vibration and moisture. Reliability and expected life were evaluated on the insulation system for traction motor.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2000년도 추계학술대회 논문집 학회본부 C
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• pp.431-433
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• 2000

In this paper, we evaluated the dielectric properties and thermal analysis on sliced XLPE sheet from 154kV power cable and compared with 22kV XLPE sheet. As the result, dielectric constant was not applied voltage dependance but trended to increase with temperature. Test result presented that tan$\delta$ of XLPE with Interface was trend to increased.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2007년도 추계학술대회 논문집
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• pp.242-242
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• 2007

To verify the applicability of High Temperature Superconducting (HTS) cable system into the real grid, the HTS cable system with the specification of 22.9 kV, 1250 A, 100 m long was installed in the second quarter of 2006, and the long term field test has been in progress at the KEPCO's Gochang power testing yard. Apart from the conventional power cable, HTS cable system requires sufficient thermo-mechanical strength to endure a large temperature difference. To date, the KEPCO HTS cable system was cooled down and warmed to the room temperature several times to investigate the influence of thermal cycles experimentally. Dielectric properties, critical current dependance and heat losses were evaluated at each step of thermal cycle. The test results showed that thermal cycle did not induce the degradation of dielectric properties, and the critical current decreased to 5 % of the initial value.

• 폴리머
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• 제27권3호
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• pp.183-188
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• 2003

유전체 분광계를 사용하여 불소함유 에폭시 수지, 벤조트리플루오라이드의 다이글리시딜 에테르(FER)/다이아미노다이페닐메탄 (DDM)과 비스페놀 A의 다이글리시딜 에테르 (DGEBA)DDM 시스템의 유전상수를 측정하였으며, DMA와 TGA에 의한 열분석을 통하여 유리 전이 온도 및 열분해 개시온도, 최대 무게 감량시 온도, 그리고 분해 활성화 에너지 등 열안정성 인자를 고찰하였다. 경화된 시편의 기계적 물성은 파괴 인성, 굴곡강도 및 충격강도 실험을 통하여 알아보았으며, 주사전자 현미경을 사용하여 시편의 파단 특성을 조사하였다. 실험 결과, DGEBA/DDM 시스템에 비해 FER/DDM 시스템은 낮은 유전 상수를 나타내었으며, 경화된 시편의 기계적 물성은 높은 값을 나타내었다. 이는 trifluoromethyl (CF$_3$) 기의 도입으로 인하여 전기적 특성과 기계적 물성이 증가한 것으로 사료된다.

• Transactions on Electrical and Electronic Materials
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• 제10권2호
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• pp.49-52
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• 2009

Barium strontium calcium titanate powders were prepared with the sol-gel method. Ferroelectric $(Ba_{0.54}Sr_{0.36}Ca_{0.1})TiO_3$(BSCT) thick films were fabricated by the screen-printing method on alumina substrate. Then we investigated the structural and dielectric properties of the BSCT thick films at different sintering temperatures. The thermal analysis showed that the BSCT polycrystalline perovskite phase formed at around $660^{\circ}C$. The X-ray diffraction analysis showed a cubic perovskite structure with no second phase present in all of the BSCT thick films. The average grain size and the thickness of the specimens sintered at $1450^{\circ}C$ were about $1.6{\mu}m$ and $45{\mu}m$, respectively. The relative dielectric constant increased and the dielectric loss decreased as the sintering temperature was increased; for BSCT thick films sintered at $1450^{\circ}C$ the values of the dielectric constant and the dielectric loss were 5641 and 0.4%, respectively, at 1 kHz.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1996년도 추계학술대회 논문집
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• pp.421-424
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• 1996

Effects of humidity absorbing deterioration on AC dielectric breakdown characteristics of modified epoxy resin system with SN(succinonitrile) were investigated. As the forced humidity absorbing deterioration proceeded under high temperature and humidify, glass transition temperature increased. The dielectric breakdown strength increased and then decreased at deterioration cycles higher than 2. Not only, the increment of thermal stability but also, the physical detects such as Internal cracks and voids occurred during the humidity absorbing deterioration cycle were the main causes of the change in dielectric properties.

• E2M - 전기 전자와 첨단 소재
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• 제7권3호
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• pp.187-199
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• 1994

In order to find an effect of structural changes due to variation of addition ratio of anhydride hardener and postcuring herat-treatments upon electrical properties of epoxy composites, the dielectric properties over a frequency range from 30[Hz] to l[MHz] were investigated in the temperature range of 20-180[.deg. C]. From the dielectric properties, the a peaks related with glass-transition phenomena of epoxy network appeared near 130[.deg. C], the conduction loss in high temperature region above 150[.deg. C] due to thermal dissociation of hardener started off with the low frequency side and the .betha. peak concerned with contribution of movable unreacted terminal epoxy groups and curing agents in the glass states concurred with the high-frequency side below 20[.deg. C]. And an effect of an hydride hardener upon structural changes and of postcuring heat treatments upon structural stability in epoxy composites would be explained through the estimation of the distribution of relaxation times and the activation energy for a .alpha. peak according to the WLF equations.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2007년도 추계학술대회 논문집
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• pp.33-33
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• 2007

In PDP industry, the dielectrics and barrier ribs have been required with low dielectric constant, low melting point and Pb-free composition due to the low power consumption, low signal delay time and the environment restriction. We were studied with $B_2O_3-Al_2O_3$-SrO glass systems about optical, thermal and dielectric properties. The glass forming region of the $B_2O_3-Al_2O_3$-SrO glass systems was narrow due to the amount of the glass former $(B_2O_3)$. The glass transition temperature (Tg) of the glasses was at $550{\sim}590^{\circ}C$. The glasses have 6~8 for the dielectric constant. Furthermore, the transmittance of the glasses was over 80% on the range of the visible ray. From the results, the glasses of the $B_2O_3-Al_2O_3$-SrO glass systems should enable to be a good candidate of the PDP devices for information display with low dielectric constant. The aim of this study is to give a fundamental result of new glass system for low dielectric constant in the information display.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2006년도 6th International Meeting on Information Display
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• pp.946-948
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• 2006

It is important to keep a constant transmittance of dielectric during firing. To control the shrinkage and fusion stage of frits in firing, we used a hot stage microscope (HSM) to analyze the thermal properties of the lead and bismate glass frits by the in-situ method. This research would be useful for improving the reliability of transmittance of dielectric during firing in industry using a large furnace with temperature deviation.

• 전자공학회논문지A
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• 제29A권8호
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• pp.56-62
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• 1992

This paper is analyzed the charge trapping and electrical properties of 0(Oxide), NO(Nitrided oxide) and ONO(Reoxidized nitrided oxide) as dielectric films in MIS structures. We have processed bottom oxide and top oxide by the thermal method, and nitride(Si$_{3}N_{4}$) by the LPCVD(Low Pressure Chemical Vapor Deposition) method on P-type(100) Silicon wafer. We have studied the charge trapping properties of the dielectrics by using a computer controlled DLTS system. All of the dielectric films are shown peak nearly at 300K. Those are bulk traps. Many trap densities which is detected in NO films, but traps. Many trap densities which is detected in NO films. Varing the nitride thickness, the trap densities of thinner nitride is decreased than the thicker nitride. Finally we have found that trap densities of ONO films is affected by nitride thickness.