• Journal of the Korean Institute of Telematics and Electronics A
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• v.30A no.1
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• pp.51-63
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• 1993

"Algorithm DA" is proposed to test linked 2-CFs(2-Coupling Faults) with order 2 or 3 which are not perfectly detected in conventional algorithms. "Test 1*", "Test 2*" and "Algorithm RA" are proposed restricted 3-CFS. The time complexity of "Test 1*" is reduced in view of the detection of 3-CFS. "Test 2*" and "Algorithm RA" have not only the reduces time complexity but also the improved fault coverage in comparison with conventional algorithms. And "Algorithm RA" can be applied step by step according to the degree of the fault coverage. If "Algorithm RA" is applied to the memory with parallel test. its time complexity is reduced considerably. It is proved that the MT(March Test) with nonlinear address sequences can not detect perfectly the CFs more complex than linked 2-CFs with order 3.ss sequences can not detect perfectly the CFs more complex than linked 2-CFs with order 3.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.38 no.1
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• pp.44-54
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• 2001

In this paper, a novel test method is proposed to detect the hard and soft fault in analog circuits. The proposed test method makes use of the offset voltage, which is one of the op-amps characteristics. During the test mode, CUT is modified to unit gain op-amps with feedback loop. When the input of the op-amp is grounded, a good circuit has a small offset voltage, but a faulty circuit has a large offset voltage. Faults in the op-amp which cause the offset voltage exceeding predefined range of tolerance can be detected. In the proposed method, no test vector is required to be applied. Therefore the test vector generation problem is eliminated and the test time and cost is reduced. In this note, the validity of the proposed test method has been verified through the example of the dual slope A/D converter. The HSPICE simulations results affirm that the presented method assures a high fault coverage.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.3
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• pp.85-97
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• 2002

STUMPS has been widely used for built-in self-test of scan design with multiple scan chains. In the STUMPS architecture, there is very high correlation between the bit sequences in the adjacent scan chains. This correlation causes circuits lower the fault coverage. In order to solve this problem, an extra combinational circuit block(phase shifter) is placed between the LFSR and the inputs of STUMPS architecture despite the hardware overhead increase. This paper introduces an efficient test pattern generation technique and built-in self-test architecture for sequential circuits with multiple scan chains. The proposed test pattern generator is not used the input of LFSR and phase shifter, hence hardware overhead can be reduced and sufficiently high fault coverage is obtained. Only several XOR gates in each scan chain are required to modify the circuit for the scan BIST, so that the design is very simple.

• Journal of KIISE:Software and Applications
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• v.36 no.9
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• pp.706-717
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• 2009

A web application is implemented by reusing the library provided by framework and has hierarchical architecture. Also, to deal with the user request from a screen, the web application has an execution flow, called 'Business Logic', which starts with a screen, executes its composed component and comes back to the screen via database. To test web application effectively, it should reflect the characteristics of web application. In this paper we propose to test web applications via user screens with the black-box testing approach and verify its source codes with the web interface white-box test coverage that covers all the business logics of the test target and their corresponding interfaces. We analyze the proposing testing method through its tool: Testopiacov.

• Proceedings of the IEEK Conference
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• 1998.10a
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• pp.1069-1072
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• 1998

Recently the development of design and automation technology and manufacturing method, has reduced the cost of chip, but it becomes more difficult to test IC chip because test technique doesn't keep up with these techniques. In case of IC testing, obtaining test vectors to be able to detect good chip or bad one is very important, but according to increasing complexity, it is very complex and difficult. Another problem is that during testing, there could be capability of physical and electrical damage on chip. Also there is difficulty in synchronization between CUT (circuit under test) and Test equipment〔1〕. Because of these difficulties, built in self test has been proposed. Not only obtaining test vectors but also reducing test time becomes hot issues nowadays. This paper presents a new test BIST(built in self test) method. Proposed BIST implementation reduces test time and obtains high fault coverage. By searching internal nodes in which are inserted test_point_cells〔2〕and allocating TPG(test pattern generation) stages, test length becomes much shorter.

• Journal of Korean Society of Forest Science
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• v.101 no.2
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• pp.175-184
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• 2012

This study was conducted to develop new mattress systems with vegetation base materials for protecting stream bank and rapid rehabilitation. Vegetation base materials are primarily compounded with fine soil, organic composts and peat moss as plant fibers, a water retainer and a soil improver. Peat moss can usually provide necessary natural fibers and organic materials in soil. Especially, peat moss can absorb up to 25 times its own weight in water and is therefore valued as a water retainer to prevent drying effect of vegetation base materials which can harm the growth of vegetation in mattresses. Normally mattress systems resist the lateral earth pressures or stream power by their own weight. Therefore, filled materials must have suitable weight, compressive strength and durability to resist the loading, as well as the effects of water and weathering. In this project, 100 to 200-mm clean, hard stones were basically specified, and about 50-mm rubbles were also used. Test application of new mattress system carried out in the stream bank of a small stream in the Gwangreung experimental forest, belonging to Korea Forest Research Institute (KFRI) in December 16th, 2006. As a result of the monitoring of vegetation coverage of test application plots (each plot size is 4 by 2 m), the coverage of all plots reached 100% in the end of May, 2007 (approximately 50 days passed after the first gemination of vegetation). The coverage of the plots using big hard stones and organic composts and the plots containing peat moss increased more rapidly. The results show that peat moss is effective to retain soil moisture and establish more sound environment for vegetation gemination.

• The Transactions of the Korea Information Processing Society
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• v.6 no.11
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• pp.3086-3096
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• 1999

To declare conformance of multi-protocol Implementation Under Test(IUT), every layer of the multi-protocol IUT should be tested. According to ISO9646, single-layer test method is applied to testing the highest layer of multi-protocol IUT and single-layer embedded test method is used for the layers by layer all the protocols in a multi-protocol IUT. This paper proposes a new method for testing a multi-protocol IUT. The proposed test method assumes that a multi-protocol IUT is under test and that the interfaces between the layers cannot be controlled or observed by the tester. We apply the proposed test method to TCP/IP and compare the application results with those of the existing test turns out that the proposed test method significantly reduces the number of test cases as well as the number of test events while providing the same test coverage. In addition, the proposed test method shows the capability to locate the layer that is source of failure in testing multi-protocol IUTs.

• Journal of the Korean Society for Aviation and Aeronautics
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• v.28 no.2
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• pp.53-62
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• 2020

This study is to evaluate the accuracy of the meteorological information provided for the aircraft operating at low altitude. At first, it is necessary to identify crucial elements of weather information closely related to flight safety during low altitude flights. The study conducted a survey of pilots of low altitude aircraft, divided into pre-flight and in-flight phases, and reached an opinion that wind direction, wind speed, cloud coverage and ceiling and visibility are important items. Related to these items, we compared and calculated the accuracy of TAFs and METARs from Taean Airfield, Seosan Airport and Gunsan Airport because of their high number of domestic low-altitude flights. Accuracy analysis evaluated the accuracy of two numerical variables, Mean Absolute Error(MAE) and Root Mean Square Error(RMSE), and the cloud coverage which is categorical variable was calculated and compared by accuracy. For numeric variables, one-way ANOVA, which is a parameter-test, was approached to identify differences between actual forecast values and observations based on absolute errors for each item derived from the results of MAE and RMSE accuracy analyses. To determine the satisfaction of both normality assumptions and equivalence variability assumptions, the Shapiro-Wilk test was performed to verify that they do not have a normality distribution for numerical variables, and for the non-parametric test, Kruscal-Wallis test was conducted to determine whether or not they are satisfied.

• The Transactions of the Korea Information Processing Society
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• v.3 no.3
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• pp.572-580
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• 1996

This paper describes a test generation method for sequential circuits which improves the application limits of the IPMT method by applying the partial scan design to the IPMT method. To solve the problem that the IPMT method requires enormous computation time in image computation, and generates test patterns after the partialscan design is introduced to reduce test complexity. Scan flip-flops are selected for the partial scan design according to the node size of the state functions of a sequential circuit in their binary decision diagram representations. Experimental results on ISCAS'95 benchmark circuits show that a test generator based on our method has achieved 100% fault coverage by use of either 20% scan FFs for s344, s349, and s420 or 80% scan FFs for sl423. However, test gener-ators based on the previous IPM method have not achieved 100% fault coverage for those circuits.

• Research in Community and Public Health Nursing
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• v.21 no.4
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• pp.502-511
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• 2010

Purpose: The purpose of this study was to investigate the influencing factors of influenza vaccination in the elderly participating in lifetime transitional health examination. Methods: This study was a secondary analysis of data collected from lifetime transitional health examination (for 66-year-old people) conducted by the National Health Insurance Corporation (NHIC) from January 1 to December 31, 2008. Questionnaires were received from NHIC to obtain information regarding gender, chronic diseases, health-related behaviors, and ADL. A total of 255,333 participants who responded all the questions in the questionnaire were included in the analysis. Collected data were analyzed by descriptive statistics, ${\chi}^2$ test, and multiple logistic regression. Results: The influenza vaccine coverage rate in 66-year-old people was 66.1%. The influenza vaccine coverage rate was higher in female elders and those with hypertension, diabetes, heart disease or past smoking, and lower in those with stroke, current smoking, drinking, no-exercise or ADL-dependency. Conclusion: Strategies for improving the influenza vaccination coverage rate in the elderly are needed. The strategies should give priority to the elderly with current smoking, drinking, and no-exercise, and home visiting programs are needed for the elderly with stroke and ADL-dependency.