• 한국결정성장학회지
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• 제24권5호
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• pp.202-206
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• 2014

$V_2O_5$ 박막에서의 PL 특성을 조사하기 위해 RF 스퍼터링법을 이용하여 비정질과 결정질 $V_2O_5$ 박막을 제작하였고, 10~300 K의 온도까지 PL 스펙트럼을 측정하였다. 상온에서 성장된 비정질 박막에서는 ~505 nm를 중심으로 하는 하나의 PL 피크만이 관찰되었고, 결정질 $V_2O_5$ 박막에서는 505 nm를 중심으로 하는 피크와 산소결함에 의한 것으로 알려진 ~695 nm를 중심으로 하는 피크가 관찰되었다. 비정질과 결정질 $V_2O_5$ 박막에서 관찰되는 505 nm에서의 PL 피크의 위치는 온도에 강한 의존성을 보였고, 그 값은 300 K에서 2.45 eV였고, 10 K에서 2.35 eV였다. 505 nm에서의 PL은 $V_2O_5$에서의 밴드 에너지 전이에 의한 것이었으며, 또한 온도의 감소에 따른 피크 위치 에너지의 감소는 전자-포논 상호작용의 감소에 의한 격자팽창효과의 감소 때문이었다.

• 센서학회지
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• 제18권4호
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• pp.316-321
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• 2009

Er-doped ZnO(ZnO:Er) films were deposited onto MgO wafers by ultrasonic spray pyrolysis at 550 $^{\circ}C$ varying the concentration of Er in the deposition source from 0.5 wt% to 3.0 wt%. Annealing of the films in a vacuum was carried out to increase the intensity of ultraviolet(UV) emission from the films. The annealing temperature was between 600$^{\circ}C$ and 800$^{\circ}C$. The crystallographic properties and surface morphology of the films were investigated by X-ray diffraction(XRD)and scanning electron microscope(SEM), respectively. The properties of photoluminescence(PL) for the films were investigated by the dependence of PL spectra on the annealing temperature. X-ray photoelectron spectroscopy(XPS) was conducted to find the composition change in the films by the annealing.

• 한국전기전자재료학회논문지
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• 제11권10호
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• pp.784-789
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• 1998

In this work, the optical properties of freestanding GaN single crystalline substrate grown by hydride vapor phase epitaxy(HVPE) were investigated. The low temperature PL spectrum in freestanding GaN consists of free and bound exciton emissions, and a deep DAP recombination around at 1.8eV. The optically-pumped stimulated emission in freestanding GaN substrate was observed at room temperature. At the maximum power density of 2MW/$\textrm{cm}^2$, the peak energy and FEHM of stimulated emission were 3.318 eV and 8meV, respectively. The excitation power dependence on the integrated emission intensity indicates the threshold pumping power density of 0.4 MW/$\textrm{cm}^2$.

• 한국재료학회지
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• 제15권5호
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• pp.293-300
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• 2005

ZnO:Li epilayers were synthesized on sapphire substrates by the pulesd laser deposition (PLD) after the surface of the ZnO:Li sintered pellet was irradiated by the ArF (193 nm) excimer laser. The growth temperature was fixed at $400^{\circ}C$. The crystalline structure of epilayers was investigated by the photoluminescence (PL) and double crystal X-ray diffraction (DCXD). The carrier density and mobility of epilayers measured by van der Pauw-Hall method are $2.69\times10cm^{-3}$ and $52.137cm^2/V{\cdot}s$ at 293 K, respectively. The temperature dependence of the energy band gap of epilayers obtained from the absorption spectra is well described by the Varshni's relation, $E_g(T)=3.5128eV{\cdot}(9.51\times10^{-4}eV/K)T^2/(T+280K)$. After the as-grown ZnO:Li epilayer was annealed in Zn atmospheres, oxygen and vaccum the origin of point defects of ZnO:Li has been investigated by PL at 10 K. The Peaks of native defects of $V_{zn},\;V_o,\;Zn_{int},\;and\;O_{int}$ showned on PL spectrum are classified as a donors or accepters type. We confirm that $ZnO:Li/Al_2O_3$ in vacuum do not form the native defects because ZnO:Li epilayers in vacuum existe in the form of stable bonds.

• 한국전기전자재료학회논문지
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• 제15권3호
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• pp.208-213
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• 2002

We present the temperature and excitation power density dependence of the photoluminescence from carbon-doped GaAs epilayers grown on GaAs (311)A substrate by atmospheric pressure metalorganic chemical vapor deposition. The measured temperature dependence of the PL peak energy is well expressed by an empirical formula proposed by Varshni. The thermal quenching mechanism of the intensity of 16 K luminescence peak at 1.480 eV is described with the dominant activation energy of 27$\pm$2 meV. The activation energy shows an evidence that the emission band involves the carbon acceptor in the recombination process.

• 한국진공학회지
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• 제19권3호
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• pp.211-216
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• 2010

$In_{0.5}Al_{0.5}As$ 버퍼층(buffer layer)의 성장온도 변화에 따른 $In_{0.5}Ga_{0.5}As/In_{0.5}Al_{0.5}As$ 다중양자우물(multiple quantum wells: MQWs)의 광학적 특성을 photoluminescence (PL)와 time-resolved PL (TRPL) 측정을 이용하여 분석하였다. $In_{0.5}Al_{0.5}As$ 버퍼층은 $320^{\circ}C$에서 $580^{\circ}C$까지 다양한 온도조건에서 $1{\mu}m$ 성장하였으며, 그 위에 6 nm, 4 nm, 그리고 2.5 nm 두께의 $In_{0.5}Ga_{0.5}As$ 양자우물(quantum well)과 10 nm 두께의 $In_{0.5}Ga_{0.5}As$ 장벽(barrier)의 MQWs을 성장하였다. 낮은 온도($320-480^{\circ}C$)에서 성장한 InAlAs 버퍼층의 MQWs는 4 nm QW과 6 nm QW로부터 모두 PL 피크가 측정되었으나, 높은 온도($320-580^{\circ}C$)의 버퍼층 위에 성장한 MQWs는 6 nm QW에서의 PL 피크만 관찰되었다. 일정한 온도 $480^{\circ}C$에서 성장한 버퍼층의 MQWs의 PL 세기가 가장 강하게 측정되었으며, 가장 높은 온도에서($530-580^{\circ}C$)에서 성장한 버퍼층의 MQWs의 PL 세기가 가장 약하게 나타났다. 이러한 PL 결과로부터 $In_{0.5}Al_{0.5}As$ 버퍼층의 최적의 성장조건은 일정한 온도 $480^{\circ}C$임을 확인하였다. 방출파장에 따른 PL 소멸시간(decay time)과 PL 스펙트럼으로부터 4 nm QW과 6 nm QW에서의 운반자 수명시간을 얻었다.

• Bulletin of the Korean Chemical Society
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• 제34권11호
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• pp.3335-3339
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• 2013

Boron-doped ZnO (BZO) nanorods were grown on quartz substrates using hydrothermal synthesis, and the temperature-dependence of their photoluminescence (PL) was measured in order to investigate the origins of their PL properties. In the UV range, near-band-edge emission (NBE) was observed from 3.1 to 3.4 eV; this was attributed to various transitions including recombination of free excitons and their longitudinal optical (LO) phonon replicas, and donor-acceptor pair (DAP) recombination, depending on the local lattice configuration and the presence of defects. At a temperature of 12 K, the NBE produces seven peaks at 3.386, 3.368, 3.337, 3.296, 3.258, 3.184, and 3.106 eV. These peaks are, respectively, assigned to free excitons (FX), neutral-donor bound excitons ($D^{\circ}X$), and the first LO phonon replicas of $D^{\circ}X$, DAP, DAP-1LO, DAP-2LO, and DAP-3LO. The peak position of the FX and DAP were also fitted to Varshni's empirical formula for the variation in the band gap energy with temperature. The activation energy of FX was about ~70 meV, while that of DAP was about ~38 meV. We also discuss the low temperature PL near 2.251 eV, related to structural defects.

• 한국재료학회지
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• 제4권4호
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• pp.379-384
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• 1994

$HF-HNO_{3}$계의 화학용액에서 실리콘웨이퍼를 식각함으로써 실온에서 자외선 조사에 의해 가시광을 발광하는 다공질실리콘(porous-Si)을 형성하였으며, 이렇게 형성시킨 다공질 실리콘의 발광특성고 표면형상을 각각 photoluminescence(PL)측정과 atomic force microscopy(AFM)를 이용하여 조사하였다. $HF:HNO_{3}: H_{2}O$=1 : 5 : 10인 용액을 이용하여 다공질실리콘을 형성시킬때 식각시간에 따른 다공질실리콘의 PL강도 및 표면형상의 변화를 관찰한 결과 1-10분의 영역에서 식각시간을 변화시켰을때 식각시간에 따라 표면의 색깔이 변하였으며 5분간 식각시켰을 경우 표면의색깔은 오렌지 색을 가지고 가장 강한 PL 강도를 보였다. 그리고 AFM관측결과 식각시간이 길어짐에 따라 다공질실리콘의 표면형상크기(surface feature size)가 점점 작아져 5분간 식각시킨 시료의 표면형상 크기는 1,5000~2,000$\AA$범위이며, PL강도가 다공질실리콘의 표면형상과 관계가 있음을 알 수 있었다.

• Advances in nano research
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• 제5권3호
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• pp.261-279
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• 2017

Spectroscopic investigation of Si quantum dots (Si-QDs) embedded in silicon nitride was performed over a broad stoichiometry range to optimize light emission. Plasma-enhanced chemical vapor deposition was used to grow the $SiN_x$ films on Si (001) substrates. The film composition was controlled via the flow ratio of silane ($SiH_4$) and ammonia ($NH_3$) in the range of R = 0.45-1.0 allowed to vary the Si excess in the range of 21-62 at.%. The films were submitted to annealing at $1100^{\circ}C$ for 30 min in nitrogen to form the Si-QDs. The properties of as-deposited and annealed films were investigated using spectroscopic ellipsometry, Fourier transform infrared spectroscopy, Raman scattering and photoluminescence (PL) methods. Si-QDs were detected in $SiN_x$ films demonstrating the increase of sizes with Si excess. The residual amorphous Si clusters were found to be present in the films grown with Si excess higher than 50 at.%. Multi-component PL spectra at 300 K in the range of 1.5-3.5 eV were detected and nonmonotonous varying total PL peak versus Si excess was revealed. To identify the different PL components, the temperature dependence of PL spectra was investigated in the range of 20-300 K. The analysis allowed concluding that the "blue-orange" emission is due to the radiative defects in a $SiN_x$ matrix, whereas the "red" and "infrared" PL bands are caused by the exciton recombination in crystalline Si-QDs and amorphous Si clusters. The nature of radiative and no radiative defects in $SiN_x$ films is discussed. The ways to control the dominant PL emission mechanisms are proposed.

• Journal of Information Display
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• 제2권3호
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• pp.1-5
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• 2001

The effect of doping on the energy transfer and charge carrier trapping processes has been studied in organic light-emitting diodes (OLEDs) doped with a fluorescent laser dye. The devices consisted of N,N'-diphenyl-N,N'-bis(3-methylphenyl)-1,1-biphenyl-4,4'-diamine (TPD) as a hole transporting layer, tris(8-hydroxyquinoline) aluminum ($Alq_3$) as the host, and a fluorescent dye, 4-dicyanomethylene-2-methyl-6-[2-(2,3,6,7-tetrahydro-1 H,5H-benzo[i,j]quinolizin-8-yl) vinyl]-4H-pyran) (DCM2) as the dopant. Temperature dependence of the current-voltage-luminescence (I-V-L) characteristics, the electroluminescence (EL) and photoluminescence (PL) spectra are studied in the temperature ranging between 15 K and 300 K. The emission from DCM2 was seen to be much stronger compared with the emission from $Alq_3$, indicative of efficient energy transfer from $Alq_3$ to DCM2. In addition, the EL emission from DCM2 increasd with increasing temperature while the emission from the host $Alq_3$ decreased. The result indicates that direct charge carrier trapping becomes efficient with increasing temperature. The EL emission from DCM2 shows a slightly sublinear dependence on the current density, implying the enhanced quenching of excitons at high current densities due to the exciton-exciton annihilation.