• Title/Summary/Keyword: TEM Journal

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A study on design of optimal structure of TEM cell for the characteristic impedance matching and analysis of the electric field distribution (특성 임피던스 정합을 위한 TEM CELL의 최적 구조 설계와 전계 분포 해석에 관한 연구)

  • 정성영;이중근
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.33A no.7
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    • pp.99-110
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    • 1996
  • In this paper, the analysis o fthe electric field distribution for TEM cell which is matched iwth 50 is performed, and the relations of variables for characteristic impedance are derived. Quasi-static approximations are used to calculate the fiedl strength of the internal field of TEM cell. The results of the improved method for analysis of the electric field is compared with that of R.J. Spigel. and the improved method for characteristic impedance and the results of numerical analysis are shown.

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Effects of PCB Patterns on EMI Measurement in TEM Cell and Proposal of PCB Design Guidelines (TEM 셀에서 PCB 패턴이 EMI 측정에 미치는 영향 및 PCB 설계 가이드라인 제시)

  • Choi, Minkyoung;Shin, Youngsan;Lee, Seongsoo
    • Journal of IKEEE
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    • v.21 no.3
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    • pp.272-275
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    • 2017
  • Recently, semiconductor integration density enormously increases and its interconnection width is significantly narrowed, which leads to EMI (electromagnetic interference) problems on chip level. Chip manufacturer exploits TEM cell (transverse electromagnetic cell) to measure EMI on chip level, which requires PCB (printed circuit board) for measurement purpose. However, it is often neglected to consider that PCB patterns and other factors can affect on EMI measurement. In this paper, several test patterns are designed for different PCB design variables, and effects of PCB patterns on EMI measurement in TEM cell are analyzed. Based on these analyses, PCB design guidelines are also proposed to minimize the effects on EMI measurements.

Study on Surface Damage of Specimen for Transmission Electron Microscopy(TEM) Using Focused Ion Beam(FIB) (집속 이온빔을 이용한 투과 전자 현미경 시편의 표면 영향에 관한 연구)

  • Kim, Dong-Sik
    • 전자공학회논문지 IE
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    • v.47 no.2
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    • pp.8-12
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    • 2010
  • TEM is a powerful tool for semiconductor material analyses in structure or biological sample in micro structure. TEM observation need to make to coincide specimens for special purpose. in this paper, we have experimented for minimum surface damage on bulk wafer and patterned specimen by various conditions such as accelerating energy, depth of ion beam, ion milling types, and etc. in various specimen preparation methods by FIB (Focus Ion Beam). The optimal qualified specimens are contain low mounts of surface damage(about 5 nm) on patterned specimen.

TemG : A Geofence Platform with Time-Limited Property (TemG : 시한적 속성을 갖고 있는 지오펜스 플랫폼)

  • Eom, Young-Hyun;Choi, Young-Keun;Cho, Sungkuk;Jeon, Byungkook
    • The Journal of the Institute of Internet, Broadcasting and Communication
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    • v.16 no.1
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    • pp.177-182
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    • 2016
  • Geofence is a generic concept for describing geographic aspects of PoI(Point of Interest) enabling users to proactively induce context-based actions. However there is no need to maintain continuity when you reflect geofence in case of temporary events, accidents and isolation. Therefore we propose a geofence platform so-called TemG by adding time-limited information to support PoI. The proposed geofence platform TemG ensures the persistency and continuity of geofence. Furthermore, the proposed TemG can not only provide to automatically activate or deactivate the specified geofence during a period of timestamp but also support to the basic context-aware service knowing in/out in the zone. In the near future, the proposed TemG will be need to extend HPS(Hybrid Positioning System) for IoT(Internet of Things).

Design of TE10 to TEM mode convertor for W-band radial power combiner (W밴드 radial 전력 결합기용 TE10-TEM 모드 변환기 설계)

  • Young-Gon Kim;Myung-Hun Yong;Han-Chun Ryu;Se-Hoon Kwon;Seon-Keol Woo
    • The Journal of the Institute of Internet, Broadcasting and Communication
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    • v.23 no.6
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    • pp.41-46
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    • 2023
  • Design of W-band TE10 to TEM mode converter for radial power combiner is proposed in this paper. The proposed structure is used with generally available pin to realize TEM mode and is designed to convert TE10 to TEM mode gradually using 2-step impedance transformer and back short. The pin of proposed mode converter is well bonded to the housing so that environment conditions such as vibration or shock are not affected. The proposed mode converter, in a back-to-back configuration, has less than 1.55 dB insertion loss and more than 10 dB return loss from 92.5 GHz to 97.7 GHz. Proposed converter is expected compact radar and various applications requiring for high power and stable environment conditions.

Theory of High Resolution TEM Image Formation: Coherence (1) (TEM 관련 이론해설 (6): 투과전자현미경의 고분해능 영상이론: 결맞음 (1))

  • Lee, Hwack-Joo
    • Applied Microscopy
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    • v.35 no.3
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    • pp.105-112
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    • 2005
  • In this review, the important ideas of coherence theory are introduced. The transfer function and damping envelopes of the microscope due to temporal and spatial coherence are described. The passbands and the condition of Scherzer focus are also disscussed in associated with the resolution of transmission electron microscope.

Development of Multi-sample Loading Device for TEM Characterization of Hydroxyapatite Nanopowder

  • Lee, Jong-Moon;Kim, Jung-Kyun;Jeong, Jong-Man;Kim, Jin-Gyu;Lee, Eunji;Kim, Youn-Joong
    • Bulletin of the Korean Chemical Society
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    • v.34 no.3
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    • pp.788-792
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    • 2013
  • A shortcoming of using transmission electron microscopy (TEM) for structural analysis via electron diffraction is the relatively large error of the measurements as compared to X-ray diffraction. To reduce these errors, various internal standard methods from earlier studies have been widely used. We developed a new device to facilitate the application of internal standard methods in preparation of TEM grids used for nanopowder analysis. Through the application of a partial mask on the TEM grid, both the internal standards and the research materials can be loaded on the same grid. Through this process, we conducted a TEM analysis that compared synthetic hydroxyapatite (HAp) nanopowder to bone apatite from a bovine femur. We determined that the accuracy of the d-spacing measurements of the HAp and bone powders could be improved to better than 1% after statistical treatments of the experimental data. By applying a quarter mask, we loaded four different nanoparticles on a single TEM grid, with one section designated for the internal standard.

Transmission Electron Microscope Specimen Preparation of Si-Based Anode Materials for Li-Ion Battery by Using Focused Ion Beam and Ultramicrotome

  • Chae, Jeong Eun;Yang, Jun Mo;Kim, Sung Soo;Park, Ju Cheol
    • Applied Microscopy
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    • v.48 no.2
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    • pp.49-53
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    • 2018
  • A successful transmission electron microscope (TEM) analysis is closely related to the preparation of the TEM specimen and should be followed by the suitable TEM specimen preparation depending on the purpose of analysis and the subject materials. In the case of the Si-based anode material, lithium atoms of formed Li silicide were removed due to ion beam and electron beam during TEM specimen preparation and TEM observation. To overcome the problem, we proposed a new technique to make a TEM specimen without the ion beam damage. In this study, two types of test specimens from the Si-based anode material of Li-ion battery were prepared by respectively adopting the only focused ion beam (FIB) method and the new FIB-ultramicrotome method. TEM analyses of two samples were conducted to compare the Ga ion damage of the test specimen.

Analysis of Aircraft Upset through TEM and Improvement of UPRT (항공기 비정상 자세 사고의 TEM 분류 및 UPRT 향상에 관한 연구)

  • Choi, Jin-Kook;Jeon, Seung-Joon
    • The Journal of the Korea Contents Association
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    • v.19 no.11
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    • pp.365-374
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    • 2019
  • Loss of Control in Flight(LOC-I) due to aircraft upset attitude has the highest air accident rate, and International Aviation Institute such as ICAO and FAA recommended flight crew to operate aircraft safely through UPRT(Upset Prevention & Recovery Training) program. ICAO has selected Loss of Control(LOC) as key safety indicator, and recommended to respond using TEM(Threat and Error Management). However there are not much specific treats and errors classified for UPRT programs using real TEM based on evidences. This study intends to consider the importance of UPRT through the introduction of UPRT and accident analysis using TEM. Typical upset accidents were classified to common threats as IFR, inadequate training, Automation surprise, and inexperienced copilots. The common errors were cross-check, speed and altitude deviation, callouts, communication, thrust and stall action fail. The undesired aircraft states were inadequate automation mode, Deviation of speed and vertical, stall, and crash. These suggest areas to improve UPRT.

Three-dimensional Finite Difference Modeling of Time-domain Electromagnetic Method Using Staggered Grid (엇갈린 격자를 이용한 3차원 유한차분 시간영역 전자탐사 모델링)

  • Jang, Hangilro;Nam, Myung Jin;Cho, Sung Oh;Kim, Hee Joon
    • Geophysics and Geophysical Exploration
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    • v.20 no.3
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    • pp.121-128
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    • 2017
  • Interpretation of time-domain electromagnetic (TEM) data has been made mostly based on one-dimensional (1-D) inversion scheme in Korea. A proper interpretation of TEM data should employ 3-D TEM forward and inverse modeling algorithms. This study developed a 3-D TEM modeling algorithm using a finite difference time-domain (FDTD) method with staggered grid. In numerically solving Maxwell equations, fictitious displacement current is included based on an explicit FDTD method using a central difference approximation scheme. The developed modeling algorithm simulated a small-coil source configuration to be verified against analytic solutions for homogeneous half-space models. Further, TEM responses for a 3-D anomaly are modeled and analyzed. We expect that it will contribute greatly to the precise interpretation of TEM data.