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Development of Multi-sample Loading Device for TEM Characterization of Hydroxyapatite Nanopowder

  • Lee, Jong-Moon (Graduate School of Analytical Science and Technology, Chungnam National University) ;
  • Kim, Jung-Kyun (Graduate School of Analytical Science and Technology, Chungnam National University) ;
  • Jeong, Jong-Man (Division of Electron Microscopic Research, Korea Basic Science Institute) ;
  • Kim, Jin-Gyu (Division of Electron Microscopic Research, Korea Basic Science Institute) ;
  • Lee, Eunji (Graduate School of Analytical Science and Technology, Chungnam National University) ;
  • Kim, Youn-Joong (Graduate School of Analytical Science and Technology, Chungnam National University)
  • Received : 2012.10.23
  • Accepted : 2012.12.10
  • Published : 2013.03.20

Abstract

A shortcoming of using transmission electron microscopy (TEM) for structural analysis via electron diffraction is the relatively large error of the measurements as compared to X-ray diffraction. To reduce these errors, various internal standard methods from earlier studies have been widely used. We developed a new device to facilitate the application of internal standard methods in preparation of TEM grids used for nanopowder analysis. Through the application of a partial mask on the TEM grid, both the internal standards and the research materials can be loaded on the same grid. Through this process, we conducted a TEM analysis that compared synthetic hydroxyapatite (HAp) nanopowder to bone apatite from a bovine femur. We determined that the accuracy of the d-spacing measurements of the HAp and bone powders could be improved to better than 1% after statistical treatments of the experimental data. By applying a quarter mask, we loaded four different nanoparticles on a single TEM grid, with one section designated for the internal standard.

Keywords

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