• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.4
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• pp.24-31
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• 2007

Up to date, a lot of bus protocol and bus architecture are released though most of them are based on the shared bus architecture and inherit the limitation of performance. SNP (SoC Network Protocol), and hence, SNA (SoC Network Architecture) which are high performance on-chip-bus protocol and architecture, respectively, have been proposed to solve the problems of the conventional shared bus. We refine the SNA specification and improve the performance and functionality. The performance of the SNA is improved by supporting simultaneous routing for bus request of multiple masters. The internal routing logic is also improved so that the gate count is decreased. The proposed SNA employs XSNP (extended SNP) that supports almost perfect compatibility with AMBA AHB protocol without performance degradation. The hardware complexity of the improved SNA is not increased much by optimizing the current routing logic. The improved SNA works for IPs with the original SNP at its best performance. In addition, it can also replace the AMBA AHB or interconnect matrix of a system, and it guarantees simultaneous multiple channels. That is, the existing AMBA system can show much improved performance by replacing the AHB or the interconnect matrix with the SNA. Thanks to the small number of interconnection wires, the SNA can be used for the off-chip bus system, too. We verify the performance and function of the proposed SNA and XSNP simulation and emulation.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.2
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• pp.61-68
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• 2008

This paper introduces an embedded core test wrapper for AMBA based System-on-Chip(SoC) test. The proposed test wrapper is compatible with IEEE 1500 and can be controlled by ARM Test Interface Controller(TIC). We use IEEE 1500 wrapper boundary registers as temporal registers to load test results as well as test patterns and apply a modified scan test procedure. Test time is reduced by simultaneously performing primary input insertion and primary output observation as well as scan-in and scan-out.

• Journal of KIISE:Computer Systems and Theory
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• v.35 no.9_10
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• pp.485-496
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• 2008

As the complexity of SoC (System-on-Chip) design increases dramatically. traditional system performance analysis and verification methods based on RTL (Register Transfer Level) are no more valid for increasing time-to-market pressure. Therefore a new design methodology is desperately required for system verification in early design stages. and hardware software (HW-SW) cosimulation at TLM (Transaction Level Modeling) level has been researched widely for solving this problem. However, most of HW-SW cosimulators support few restricted ion levels only, which makes it difficult to integrate HW-SW cosimulators with different ion levels. To overcome this difficulty, this paper proposes a multipurpose framework for HW SW cosimulation to provide systematic SoC design flow starting from software application design. It supports various design techniques flexibly for each design step, and various HW-SW cosimulators. Since a platform design is possible independently of ion levels and description languages, it allows us to generate simulation models with various ion levels. We verified the proposed framework to model a commercial SoC platform based on an ARM9 processor. It was also proved that this framework could be used for the performance optimization of an MJPEG example up to 44% successfully.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.4
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• pp.105-116
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• 2008

Today's System-on-a-Chip (SoC) is designed with reusable IP cores to meet short time-to-market requirements. However, the increasing cost of testing becomes a big burden in manufacturing a highly integrated SoC. In this paper, we propose an efficient test access mechanism that exploits an on/off-chip bus bridge for the Advanced High-performance Bus (AHB) and Peripheral Component Interconnect (PCI) bus. The test application time is considerably reduced by providing dedicated test stimuli input paths and response output paths, and by excluding the bus direction tumaround delays. Experimental results show that area overhead and testing times are considerably reduced in both functional and structural test modes. The proposed technique can be a lied to the other types of on/off-chip bus bridges.

• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.20 no.3
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• pp.129-134
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• 2020

Moisture infiltration inside the solar cell module, filling of EVA sheet, melting of the frame seal, and deterioration of power generation performance in the module one year after installation are occurring. Whitening phenomenon, electrode corrosion phenomenon, and dielectric breakdown phenomenon are appearing in solar cell module installed in Korea before 5-7 years, leading to deterioration of power generation performance, and big problems for long-term reliability and long life technology are emerging. Therefore, in order to solve these problems, the development of a micro inverter (MiCrco Inverter Converter, MiC) including the function of securing the durability of the solar cell module and monitoring the aging progress and the solar cell based on the monitoring data from the MiC smart monitoring programs have been proposed to determine the aging of modules. In addition, in order to become a highly efficient solar smart monitoring system through systematic operation management through IT convergence with MiC that has enhanced monitoring function of solar cell module, SoC(System On Chip) in micro inverter is the environment for solar cell module. There is a demand for functions that can detect information in a complex manner and perform communication and control when necessary. Based on these requirements, this paper aims to develop SoC-based low-cost MiC smart photovoltaic system technology.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.9 s.351
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• pp.1-9
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• 2006

In the System-on-Chip(SoC) design, the global wires are critical parts for the performance. Therefore, the global wires need to be pipelined using flip-flops or latches. Since the timing constraint of the latch is more flexible than it of the flip-flop, the latch-based design can provide a better solution for the clock period. Retiming is an optimizing technique which repositions memory elements in the circuits to reduce the clock period. Traditionally, retiming is used on gate-level netlist, but retiming for SoC is used on macro-level netlist. In this paper, we extend the previous work of retiming for SoC using flip-flops to retiming for SoC using single-phase clocked latches. In this paper we propose a MILP for retiming for SoC using single-phase clocked latches, and apply the fixpoint computation to solve it. Experimental results show that retiming for SoC using latches reduces the clock period of circuits by average 10 percent compared with retiming for SoC using flip-flops.

• JSTS:Journal of Semiconductor Technology and Science
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• v.16 no.5
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• pp.542-549
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• 2016

This paper presents a SoC (System-on-a-Chip) dedicated for a single-chip smart capsule which can be used to continuously monitor human alimentary canal pH and temperature values. The SoC is composed of the pH and temperature sensor interface circuit, a wireless transceiver, the power management circuit and the flow control logic. Fabricated in $0.18{\mu}m$ standard CMOS technology, the SoC occupies a die area of ${\sim}9 mm^2$. The SoC consumes 6.15 mW from a 3 V power supply, guaranteeing the smart capsule battery life is no less than 24 hours when using 50 mAh coin batteries. The experimental results show that measurement accuracy of the smart capsule is ${\pm}0.1$ pH and ${\pm}0.2^{\circ}C$ for pH and temperature sensing, respectively, which meets the requirement of in-body pH and temperature monitoring in clinical practice.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.11
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• pp.65-73
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• 2007

This paper introduces design-for-test (DFT) techniques for low-cost system-on-chip (SoC) test. We present a Scan-Test method that controls IEEE 1500 wrapper thorough IEEE 1149.1 SoC TAP (Test Access Port) and design an at-speed test clock generator for delay fault test. Test cost can be reduced by using small number of test interface pins and on-chip test clock generator because we can use low-price automated test equipments (ATE). Experimental results evaluate the efficiency of the proposed method and show that the delay fault test of different cores running at different clocks test can be simultaneously achieved.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.2
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• pp.86-94
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• 2007

The NoC (network-on-chip) approach is a promising solution to the increasing complexity of on-chip communication problems because of its high scalability. But, NoC applications generally consume a lot of power, because they require a large design space to accommodate many parallel IPs and network communication channels. It is not easy to analyze the power consumption of NoC applications with conventional simulation methods using simple power models. In addition, there are also many limitations in using sophisticated simulation models because they require long execution time and large efforts. In this paper, we apply a cycle-accurate energy measurement technique and tool to the FPGA prototypes, which are generally used to verify the correctness of SoC designs, as a practical indication of the power consumption of real NoC applications. An NoC-based JPEG encoder implementation is used as a case study to demonstrate the effectiveness of our approach.

• JSTS:Journal of Semiconductor Technology and Science
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• v.5 no.4
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• pp.249-254
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• 2005

This paper presents a system-on-a-chip (SOC) design for digital TV. The single LSI incorporates almost all essential parts such as CPU, ISO/IEC 11172/13818 system/audio/video decoders, a video post-processor, a graphics/OSD processor and a display processor. It has analog IP's inside such as video DACs, an audio PLL, and a system PLL to reduce the system-level implementation cost. Descramblers and Smart Card interface are included to support widely used conditional access systems. The video decoder can decode two video streams simultaneously. The DSP-based audio decoder can process various audio coding specifications. The functional blocks for video quality enhancement also form outstanding features of this SoC. The SoC supports world-wide major DTV services including ATSC, ARIB, DVB, and DIRECTV.