• Title/Summary/Keyword: Sub-carrier

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Characteristics of Vanadium Oxide Grown by Atomic Layer Deposition for Hole Carrier Selective Contacts Si Solar Cells (실리콘 전하선택접합 태양전지 적용을 위한 원자층 증착법으로 증착된 VOx 박막의 특성)

  • Park, Jihye;Chang, Hyo Sik
    • Korean Journal of Materials Research
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    • v.30 no.12
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    • pp.660-665
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    • 2020
  • Silicon heterojunction solar cells can achieve high conversion efficiency with a simple structure. In this study, we investigate the passivation characteristics of VOx thin films as a hole-selective contact layer using ALD (atomic layer deposition). Passivation characteristics improve with iVoc (implied open-circuit voltage) of 662 mV and minority carrier lifetime of 73.9 µs after post-deposition annealing (PDA) at 100 ℃. The improved values are mainly attributed to a decrease in carbon during the VOx thin film process after PDA. However, once it is annealed at temperatures above 250 ℃ the properties are rapidly degraded. X-ray photoelectron spectroscopy is used to analyze the chemical states of the VOx thin film. As the annealing temperature increases, it shows more formation of SiOx at the interface increases. The ratio of V5+ to V4+, which is the oxidation states of vanadium oxide thin films, are 6:4 for both as-deposition and annealing at 100 ℃, and 5:5 for annealing at 300 ℃. The lower the carbon content of the ALD VOx film and the higher the V5+ ratio, the better the passivation characteristics.

Channel Transfer Function estimation based on Delay and Doppler Profiler for 5G System Receiver targeting 500km/h linear motor car

  • Suguru Kuniyoshi;Shiho Oshiro;Gennan Hayashi;Tomohisa Wada
    • International Journal of Computer Science & Network Security
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    • v.23 no.5
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    • pp.121-127
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    • 2023
  • A 500 km/h linear motor high speed terrestrial transportation service is planned to launch 2027 in Japan. In order to support 5G service in the train, the Sub-carrier spacing frequency of 30 kHz is planned to be used instead of common 15 kHz sub-carrier spacing to mitigate Doppler effect in such high-speed transportation. In addition, to increase the cell size of 5G mobile system, plural Base Station antenna will transmit the identical Down Link (DL) signal to form the expanded cell size along the train rail. In this situation, forward and backward antenna signals will be Doppler shifted by reverse direction respectively and the receiver in the train might suffer to estimate accurate Channel Transfer Function (CTF) for its demodulation. In this paper, Delay and Doppler Profiler (DDP) based Channel Estimator is proposed and it is successfully implemented in signal processing simulation system. Then the simulated performances are compared with the conventional Time domain linear interpolated estimator. According to the simulation results, QPSK modulation can be used even under severe channel condition such as 500 km/h, 2 path reverse Doppler Shift condition, although QPSK modulation can be used less than 200 km/h with conventional Channel estimator.

A Study on the Performance Analysis and Improvement of Physical Layer for Next Generation ITS/DSRC (차세대 ITS/DSRC 물리계층 성능분석 및 개선에 관한 연구)

  • Jeong, Jae-Seung;Park, Sung-Jin;Lee, Byung-Seub
    • Journal of Advanced Navigation Technology
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    • v.5 no.1
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    • pp.37-44
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    • 2001
  • In this paper, the channel environment for next generation ITS/DSRC which is developed for 10Mbps is modeled with ray tracing technique and, we analyzed BER of OFDM which has an advantage over reducing the effect of ISI with multi-carrier and guard time, occuping bandwidth on 6-ray channel environment. Also, we applied the one-tap equalizer to improve the performance of BER. In case only OFDM is applied with 32 sub-carrier, the result of BER is under $10^{-6}$ from 10 to 100m if $E_b/N_0$ is more than 23dB. But in case OFDM and one-tap equalizer are applied with 32 sub-carrier, $E_b/N_0$ is required of about 17dB to achieve BER under $10^{-6}$.

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Novel Viterbi Decoding Architecture for DVB-T with Improved Performance in Rayleigh Channels (레일레이 채널에서 성능 향상을 위한 DVB-T용 비터비 디코더의 아키텍쳐)

  • Oh, Jung-Youn;Park, Kyu-Hyun;Lee, Seung-Jun
    • Journal of the Institute of Electronics Engineers of Korea SP
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    • v.39 no.6
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    • pp.718-726
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    • 2002
  • This paper presents a novel Viterbi decoding architecture for European Digital Video Broadcasting (DVB) receiver. The channel sate information (CSI) of each sub carrier is used to weight the bit-metric of each symbol. The weighted bit-metric is delivered to Viterbi decoder after going through the symbol deinterleaver and bit deinterleaver, such that the CSI can be correctly applied to corresponding bits even after the two interleavings. Simulation shows that the new architecture gives significant performance enhancement of 6~13dB in Rayleigh fading channels depending on the modulation types. This results is also better than previous results by 3.7~10.3dB.

Design of Main Carrier Rejection Circuit for Adaptive Linear Power Amplifier without usign Pilot Tones (Pilot tone들을 사용치 않는 자동적응 선형전력 증폭기용 주 신호 제거회로 설계)

  • Jeong, Yong-Chae
    • Journal of the Korean Institute of Telematics and Electronics D
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    • v.36D no.9
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    • pp.6-12
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    • 1999
  • It is difficult to realize adaptive main carrier rejection circuit in feedforward-type LPA(Linear Power Amplifier) because the gain and nonlinear characteristics of power amplifier are changed according to operating frequency, voltage, temperature. Usually, pilot tones are used for adaptive LPA operation. but in this paper, the relative phase, which in obtained through I&Q demodulator using input signals as LO signals and main-path & sub-path signals as RF signals, and the magnitude of main-path & sub-path signals are compared, so main carrier rejection is obtained. The proposed method rejects main carriers by 28.34 ~ 34.66dB (@Po=36.2 ~ 28.2 dBm/tone) with two tones at 877MHz, 882MHz and also rejects main carriers by 31.3dB despite changing condition of operating voltage.

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A New Carrier frequency Offset Estimation Using CP-ICA Scheme in OFDM Systems (OFDM 시스템에서 CP-ICA 기법을 이용한 새로운 주파수 옵셋 추정)

  • Kim, Jong-Deuk;Byun, Youn-Shik
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.31 no.12C
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    • pp.1257-1264
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    • 2006
  • The carrier frequency offset causes loss of orthogonality between sub-carriers, thus leads to inter-carrier interference (ICI) in the OFDM symbol. This ICI causes severe degradation of the BER performance of the OFDM receiver. In this paper, we propose a new ICI cancellation algorithm which estimates frequency offset at the time-domain by using CP-ICA method to the received sub-carriers phase rotation. This algorithm is based on a statistical blind estimation method, which mainly utilizes the EVD, rotating phase and the $4^{th}-cumulants$. Since our scheme does not need any training and pilot symbol in estimation, we can expect enhanced bandwidth efficiency in OFDM systems. Simulation results show that the proposed frequency offset estimator is more accurate than the other estimators in $0.0<\varepsilon<1.0$.

Power and Rate Adaptations in Multi-carrier DS/CDMA Communications over Rayleigh Fading Channel (레일레이 패이딩 채널에서 다중 반송자 DS/CDMA 통신 시스템의 전력-전송율 적응 방식)

  • Ah Heejune;Lee Ye Hoon
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.30 no.6C
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    • pp.423-433
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    • 2005
  • We present power(in frequency domain) and rate adaptation(in time domain) schemes in multicarrier (MC) direct-sequence code-division multiple-access(DS/CDMA) communications. Utilizing channel state information from the receiver, the adaptation schemes allocate power the user's sub-band with the largest channel gain. In the time domain, the transmission data rate is adapted for a desired transmission quality. In the case of single-user channels, a closed-form expression is derived for an optimal time domain power adaptation that minimizes the average bit error rate(BER). Channel inversion power adaptation is found to provide nearly optimal performance in this case, as the number of sub-bands or available average transmission power increase. Analysis and simulation results show the BER performance of the proposed power and rate adaptations with fixed average transmission power significantly improves the performance over the power allocation in the frequency domain only. Also, we compare the performance of the proposed power and rate adaptation schemes in MC-DS/CDMA systems with that of power and rate adapted single carrier DS/CDMA systems with RAKE receiver.

Development of promotors for fast redox reaction of MgMnO3 oxygen carrier material in chemical looping combustion

  • Hwang, Jong Ha;Lee, Ki-Tae
    • Journal of Ceramic Processing Research
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    • v.19 no.5
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    • pp.372-377
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    • 2018
  • MgO or gadolinium-doped ceria (GDC, $Ce_{0.9}Gd_{0.1}O_{2-{\delta}}$) was added as a promoter to improve the oxygen transfer kinetics of $MgMnO_3$ oxygen carrier material for chemical looping combustion. Neither MgO nor GDC reacted with $MgMnO_3$, even at the high temperature of $1100^{\circ}C$. The average oxygen transfer capacities of $MgMnO_3$, 5 wt% $MgO-MgMnO_3$, and 5 wt% $GDC-MgMnO_3$ were 8.74, 8.35, and 8.13 wt%, respectively. Although the addition of MgO or GDC decreased the oxygen transfer capacity, no further degradation was observed during their use in 5 redox cycles. The addition of GDC significantly improved the conversion rate for the reduction reaction of $MgMnO_3$ compared to the use of MgO due to an increase in the surface adsorption process of $CH_4$ via oxygen vacancies formed on the surface of GDC. On the other hand, the conversion rates for the oxidation reaction followed the order 5 wt% $GDC-MgMnO_3$ > 5 wt% $MgO-MgMnO_3$ >> $MgMnO_3$ due to morphological change. MgO or GDC particles suppressed the grain growth of the reduced $MgMnO_3$ (i.e., (Mg,Mn)O) and increased the specific surface area, thereby increasing the number of active reaction sites.

Analysis of Positive Bias Temperature Instability Degradation Mechanism in n+ and p+ poly-Si Gates of High-Voltage SiO2 Dielectric nMOSFETs (고전압 SiO2 절연층 nMOSFET n+ 및 p+ poly Si 게이트에서의 Positive Bias Temperature Instability 열화 메커니즘 분석)

  • Yeohyeok Yun
    • The Journal of Korea Institute of Information, Electronics, and Communication Technology
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    • v.16 no.4
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    • pp.180-186
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    • 2023
  • Positive bias temperature instability (PBTI) degradation of n+ and p+ poly-Si gate high-voltage(HV) SiO2 dielectric nMOSFETs was investigated. Unlike the expectation that degradation of n+/nMOSFET will be greater than p+/nMOSFET owing to the oxide electric field caused by the gate material difference, the magnitude of the PBTI degradation was greater for the p+/nMOSFET than for the n+/nMOSFET. To analyze the cause, the interface state and oxide charge were extracted for each case, respectively. Also, the carrier injection and trapping mechanism were analyzed using the carrier separation method. As a result, it has been verified that hole injection and trapping by the p+ poly-Si gate accelerates the degradation of p+/nMOSFET. The carrier injection and trapping processes of the n+ and p+ poly-Si gate high-voltage nMOSFETs in PBTI are detailed in this paper.

Improvement of the carrier transport property and interfacial behavior in InGaAs quantum well Metal-Oxide-Semiconductor Field-Effect-Transistors with sulfur passivation (황화 암모늄을 이용한 Al2O3/HfO2 다층 게이트 절연막 트랜지스터 전기적 및 계면적 특성 향상 연구)

  • Kim, Jun-Gyu;Kim, Dae-Hyun
    • Journal of Sensor Science and Technology
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    • v.29 no.4
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    • pp.266-269
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    • 2020
  • In this study, we investigated the effect of a sulfur passivation (S-passivation) process step on the electrical properties of surface-channel In0.7Ga0.3As quantum-well (QW) metal-oxide-semiconductor field-effect transistors (MOSFETs) with S/D regrowth contacts. We fabricated long-channel In0.7Ga0.3As QW MOSFETs with and without (NH4)2S treatment and then deposited 1/4 nm of Al2O3/HfO2 through atomic layer deposition. The devices with S-passivation exhibited lower values of subthreshold swing (74 mV/decade) and drain-induced barrier lowering (19 mV/V) than the devices without S-passivation. A conductance method was applied, and a low value of interface trap density Dit (2.83×1012 cm-2eV-1) was obtained for the devices with S-passivation. Based on these results, interface traps between InGaAs and high-κ are other defect sources that need to be considered in future studies to improve III-V microsensor sensing platforms.