• Title/Summary/Keyword: Statistic Process Control

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Generalized Q Control Charts for Short Run Processes in the Presence of Lot to Lot Variability (Lot간 변동이 존재하는 Short Run 공정 적용을 위한 일반화된 Q 관리도)

  • Lee, Hyun Cheol
    • Korean Management Science Review
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    • v.31 no.3
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    • pp.27-39
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    • 2014
  • We derive a generalized statistic form of Q control chart, which is especially suitable for short run productions and start-up processes, for the detection of process mean shifts. The generalization means that the derived control chart statistic concurrently uses within lot variability and between lot variability to explain the process variability. The latter variability source is noticeably prevalent in lot type production processes including semiconductor wafer fabrications. We first obtain the generalized Q control chart statistic when both the process mean and process variance are unknown, which represents the case of implementing statistical process control charting for short run productions and start-up processes. Also, we provide the corresponding generalized Q control chart statistics for the rest of three cases of previous Q control chart statistics : (1) both the process mean and process variance are known (2) only the process mean is unknown and (3) only the process variance is unknown.

Identification of the out-of-control variable based on Hotelling's T2 statistic (호텔링 T2의 이상신호 원인 식별)

  • Lee, Sungim
    • The Korean Journal of Applied Statistics
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    • v.31 no.6
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    • pp.811-823
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    • 2018
  • Multivariate control chart based on Hotelling's $T^2$ statistic is a powerful tool in statistical process control for identifying an out-of-control process. It is used to monitor multiple process characteristics simultaneously. Detection of the out-of-control signal with the $T^2$ chart indicates mean vector shifts. However, these multivariate signals make it difficult to interpret the cause of the out-of-control signal. In this paper, we review methods of signal interpretation based on the Mason, Young, and Tracy (MYT) decomposition of the $T^2$ statistic. We also provide an example on how to implement it using R software and demonstrate simulation studies for comparing the performance of these methods.

A Selectively Cumulative Sum(S-CUSUM) Control Chart (선택적 누적합(S-CUSUM) 관리도)

  • Lim, Tae-Jin
    • Journal of Korean Society for Quality Management
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    • v.33 no.3
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    • pp.126-134
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    • 2005
  • This paper proposes a selectively cumulative sum(S-CUSUM) control chart for detecting shifts in the process mean. The basic idea of the S-CUSUM chart is to accumulate previous samples selectively in order to increase the sensitivity. The S-CUSUM chart employs a threshold limit to determine whether to accumulate previous samples or not. Consecutive samples with control statistics out of the threshold limit are to be accumulated to calculate a standardized control statistic. If the control statistic falls within the threshold limit, only the next sample is to be used. During the whole sampling process, the S-CUSUM chart produces an 'out-of-control' signal either when any control statistic falls outside the control limit or when L -consecutive control statistics fall outside the threshold limit. The number L is a decision variable and is called a 'control length'. A Markov chain approach is employed to describe the S-CUSUM sampling process. Formulae for the steady state probabilities and the Average Run Length(ARL) during an in-control state are derived in closed forms. Some properties useful for designing statistical parameters are also derived and a statistical design procedure for the S-CUSUM chart is proposed. Comparative studies show that the proposed S-CUSUM chart is uniformly superior to the CUSUM chart or the Exponentially Weighted Moving Average(EWMA) chart with respect to the ARL performance.

An Adaptive Moving Average (A-MA) Control Chart with Variable Sampling Intervals (VSI) (가변 샘플링 간격(VSI)을 갖는 적응형 이동평균 (A-MA) 관리도)

  • Lim, Tae-Jin
    • Journal of Korean Institute of Industrial Engineers
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    • v.33 no.4
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    • pp.457-468
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    • 2007
  • This paper proposes an adaptive moving average (A-MA) control chart with variable sampling intervals (VSI) for detecting shifts in the process mean. The basic idea of the VSI A-MA chart is to adjust sampling intervals as well as to accumulate previous samples selectively in order to increase the sensitivity. The VSI A-MA chart employs a threshold limit to determine whether or not to increase sampling rate as well as to accumulate previous samples. If a standardized control statistic falls outside the threshold limit, the next sample is taken with higher sampling rate and is accumulated to calculate the next control statistic. If the control statistic falls within the threshold limit, the next sample is taken with lower sampling rate and only the sample is used to get the control statistic. The VSI A-MA chart produces an 'out-of-control' signal either when any control statistic falls outside the control limit or when L-consecutive control statistics fall outside the threshold limit. The control length L is introduced to prevent small mean shifts from being undetected for a long period. A Markov chain model is employed to investigate the VSI A-MA sampling process. Formulae related to the steady state average time-to signal (ATS) for an in-control state and out-of-control state are derived in closed forms. A statistical design procedure for the VSI A-MA chart is proposed. Comparative studies show that the proposed VSI A-MA chart is uniformly superior to the adaptive Cumulative sum (CUSUM) chart and to the Exponentially Weighted Moving Average (EWMA) chart, and is comparable to the variable sampling size (VSS) VSI EWMA chart with respect to the ATS performance.

A Selectively Cumulative Sum (S-CUSUM) Control Chart with Variable Sampling Intervals (VSI) (가변 샘플링 간격(VSI)을 갖는 선택적 누적합 (S-CUSUM) 관리도)

  • Im, Tae-Jin
    • Proceedings of the Korean Operations and Management Science Society Conference
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    • 2006.11a
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    • pp.560-570
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    • 2006
  • This paper proposes a selectively cumulative sum (S-CUSUM) control chart with variable sampling intervals (VSI) for detecting shifts in the process mean. The basic idea of the VSI S-CUSUM chart is to adjust sampling intervals and to accumulate previous samples selectively in order to increase the sensitivity. The VSI S-CUSUM chart employs a threshold limit to determine whether to increase sampling rate as well as to accumulate previous samples or not. If a standardized control statistic falls outside the threshold limit, the next sample is taken with higher sampling rate and is accumulated to calculate the next control statistic. If the control statistic falls within the threshold limit, the next sample is taken with lower sampling rate and only the sample is used to get the control statistic. The VSI S-CUSUM chart produces an 'out-of-control' signal either when any control statistic falls outside the control limit or when L-consecutive control statistics fall outside the threshold limit. The number L is a decision variable and is called a 'control length'. A Markov chain model is employed to describe the VSI S-CUSUM sampling process. Some useful formulae related to the steady state average time-to signal (ATS) for an in-control state and out-of-control state are derived in closed forms. A statistical design procedure for the VSI S-CUSUM chart is proposed. Comparative studies show that the proposed VSI S-CUSUM chart is uniformly superior to the VSI CUSUM chart or to the Exponentially Weighted Moving Average (EWMA) chart with respect to the ATS performance.

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EWMA Control Chart for Monitoring a Process Correlation Coefficient (상관계수의 변동을 탐지하기 위한 EWMA 관리도)

  • 한정혜;조중재
    • Journal of Korean Society for Quality Management
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    • v.26 no.1
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    • pp.108-125
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    • 1998
  • The EWMA(Exponentially Weighted Moving Average) has recently received a great deal of attention in the quality control literature as a process monitoring tool on the shop floor of manufacturing industires, since it is easy to plot, to interpret, and its control limits are easy to obtain. Most a, pp.ications of the EWMA for process monitoring have concentrated on the problem of detecting shifts of a process mean and a process standard deviation with ARL(Average Run Length) properties. But there may be the necessity of controlling linearity on product quality such as the correlation coefficient to the process operator. Control managers may want to protect the increase of a process correlation coefficient value, such as 0, between two variables of interest. However, there are few studies concerned on this part. Therefore, we propose EWMA models for a process correlation coefficient using two transformed statistics, T-statistic and (Fisher's) Z-statistic. We also present some results of simulation by SAS/IML and compare two models.

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Multivariate EWMA Control Chart for Means of Multiple Quality Variableswith Two Sampling Intervals

  • Chang, Duk-Joon;Heo, Sunyeong
    • Journal of Integrative Natural Science
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    • v.5 no.3
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    • pp.151-156
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    • 2012
  • Because of the equivalence between control chart procedures and hypothesis testing, we propose to use likelihood ratio test (LRT) statistic $Z_i^2$ as the multivariate control statistic for simultaneous monitoring means of the multivariate normal process. Properties and comparisons of the proposed control charts are explored and conducted for matched fixed sampling interval (FSI) and variable sampling interval (VSI) with two sampling interval charts. The result of numerical comparisons shows that EWMA chart with two sampling interval procedure is more efficient than the corresponding FSI chart for small or moderate changes. When large shift of the process has occurred, we also found that Shewhart chart is more efficient than EWMA chart.

Bearing fault detection through multiscale wavelet scalogram-based SPC

  • Jung, Uk;Koh, Bong-Hwan
    • Smart Structures and Systems
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    • v.14 no.3
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    • pp.377-395
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    • 2014
  • Vibration-based fault detection and condition monitoring of rotating machinery, using statistical process control (SPC) combined with statistical pattern recognition methodology, has been widely investigated by many researchers. In particular, the discrete wavelet transform (DWT) is considered as a powerful tool for feature extraction in detecting fault on rotating machinery. Although DWT significantly reduces the dimensionality of the data, the number of retained wavelet features can still be significantly large. Then, the use of standard multivariate SPC techniques is not advised, because the sample covariance matrix is likely to be singular, so that the common multivariate statistics cannot be calculated. Even though many feature-based SPC methods have been introduced to tackle this deficiency, most methods require a parametric distributional assumption that restricts their feasibility to specific problems of process control, and thus limit their application. This study proposes a nonparametric multivariate control chart method, based on multiscale wavelet scalogram (MWS) features, that overcomes the limitation posed by the parametric assumption in existing SPC methods. The presented approach takes advantage of multi-resolution analysis using DWT, and obtains MWS features with significantly low dimensionality. We calculate Hotelling's $T^2$-type monitoring statistic using MWS, which has enough damage-discrimination ability. A bootstrap approach is used to determine the upper control limit of the monitoring statistic, without any distributional assumption. Numerical simulations demonstrate the performance of the proposed control charting method, under various damage-level scenarios for a bearing system.

Treatment Planning Guideline of EBT Film-based Delivery Quality Assurance Using Statistical Process Control in Helical Tomotherapy (토모테라피에서 통계적공정관리를 이용한 EBT 필름 기반의 선량품질보증의 치료계획 가이드라인)

  • Chang, Kyung Hwan
    • Journal of radiological science and technology
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    • v.45 no.5
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    • pp.439-448
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    • 2022
  • The purpose of this study was to analyze the results from statistical process control (SPC) to recommend upper and lower control limits for planning parameters based on delivery quality assurance (DQA) results and establish our institutional guidelines regarding planning parameters for helical tomotherapy (HT). A total of 53 brain, 41 head and neck (H & N), and 51 pelvis cases who had passing or failing DQA measurements were selected. The absolute point dose difference (DD) and the global gamma passing rate (GPR) for all patients were analyzed. Control charts were used to evaluate upper and lower control limits (UCL and LCL) for all assessed treatment planning parameters. Treatment planning parameters were analyzed to provide its range for DQA pass cases. We confirmed that the probability of DQA failure was higher when the proportion of leaf open time (LOT) below 100 ms was greater than 30%. LOT and gantry period (GP) were significant predictor for DQA failure using the SPC method. We investigated the availability of the SPC statistic method to establish the local planning guideline based on DQA results for HT system. The guideline of each planning parameter in HT may assist in the prediction of DQA failure using the SPC statistic method in the future.

Residual-based Robust CUSUM Control Charts for Autocorrelated Processes (자기상관 공정 적용을 위한 잔차 기반 강건 누적합 관리도)

  • Lee, Hyun-Cheol
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.35 no.3
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    • pp.52-61
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    • 2012
  • The design method for cumulative sum (CUSUM) control charts, which can be robust to autoregressive moving average (ARMA) modeling errors, has not been frequently proposed so far. This is because the CUSUM statistic involves a maximum function, which is intractable in mathematical derivations, and thus any modification on the statistic can not be favorably made. We propose residual-based robust CUSUM control charts for monitoring autocorrelated processes. In order to incorporate the effects of ARMA modeling errors into the design method, we modify parameters (reference value and decision interval) of CUSUM control charts using the approximate expected variance of residuals generated in model uncertainty, rather than directly modify the form of the CUSUM statistic. The expected variance of residuals is derived using a second-order Taylor approximation and the general form is represented using the order of ARMA models with the sample size for ARMA modeling. Based on the Monte carlo simulation, we demonstrate that the proposed method can be effectively used for statistical process control (SPC) charts, which are robust to ARMA modeling errors.