• 제목/요약/키워드: Solder joint

검색결과 355건 처리시간 0.027초

그래핀 산화 분말을 첨가한 플렉시블 기판 솔더 접합부의 반복 굽힘 신뢰성 향상 (Improving Joint Reliability of Lead-free Solder on Flexible Substrate under Cyclic Bending by Adding Graphene Oxide Powder)

  • 고용호;유동열;손준혁;방정환;김택수
    • 마이크로전자및패키징학회지
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    • 제26권3호
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    • pp.43-49
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    • 2019
  • 본 연구에서는 그래핀 산화(graphene oxide, GO) 분말 복합 Sn-3.0Ag-0.5Cu(in wt.%) 솔더페이스트를 이용한 플렉시블 기판과 SOP(small outline package) 사이의 솔더 접합부의 굽힘 신뢰성 향상에 관한 새로운 접근을 제안하였다. 솔더페이스트에 GO의 첨가는 녹는점에 약간의 영향을 미치었으나 그 차이는 미미한 것으로 나타났다. 한편, GO의 첨가는 리플로우 공정 동안 솔더 접합부의 금속간화합물(intermetallic compound, IMC) 성장과 두께를 억제 할 수 있음을 확인하였다. 더욱이 접합부의 신뢰성에 미치는 영향을 살펴보고자 반복 굽힘 시험을 진행하였으며 GO 분말의 첨가로 솔더 접합부의 반복 굽힘 신뢰성 향상 시킬 수 있었다. 0.2 wt.%의 GO가 첨가된 솔더 접합부의 경우 GO가 첨가되지 않은 경우에 비하여 굽힘 수명은 20% 가량 증가하는 것으로 나타났다. GO가 첨가된 경우 솔더 접합부의 인장 강도와 연성이 증가하게 나타났는데 이러한 GO 첨가에 의한 기계적 특성 향상이 솔더 접합부의 반복 굽힘 신뢰성 향상에 기여한 것으로 추측된다.

박막 광학 필터 디바이스의 패키징시 솔더 조인트의 피로 신뢰성 해석 (Thermal Fatigue Reliability of Solder Joints in a Thin Film Optical Filter Device)

  • 이성철;현충민;이형만;김명진;김회경;김기태
    • 대한기계학회논문집A
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    • 제28권6호
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    • pp.677-684
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    • 2004
  • Plastic and creep deformations of solder joints during thermal cycling are the main factors of misalignments and power losses in optical telecommunication components. Furthermore, the increased mismatch between solder Joint-bonded areas may cause severe failure in the components. Darveaux's creep model was implemented into a finite element program (ABAQUS) to simulate creep response of solder. Based on the finite element results, thermal fatigue reliability was predicted by using various fatigue life prediction models. Also, the effects of ramp conditions, dwelling time, and solder joint-embedding materials on the reliability were investigated under the thermal cycling conditions of the Telcordia schedule (-40∼75$^{\circ}C$).

표면실장 적용을 위한 Sn-Zn 무연 솔더의 신뢰성 연구 (Reliability study of Sn-Zn lead-free solder for SMT application)

  • 윤정원;정승부
    • 대한용접접합학회:학술대회논문집
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    • 대한용접접합학회 2005년도 추계학술발표대회 개요집
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    • pp.219-221
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    • 2005
  • Sn-9Zn solder balls were bonded to Cu, ENIG (Electroless Nickel/Immersion Gold) and electrolytic Au/Ni pads, and the effect of aging on their joint reliability was investigated. The interfacial products were different from the general reaction layer formed in a Sn-base solder. The intermetallic compounds formed in the solder/Cu joint were $Cu_{5}Zn_{8}$ and $Cu_{6}Sn_{5}$. After aging treatment, voids formed irregularly at the bottom side of the solder because of Sn diffusion into the $Cu_{5}Zn_{8}$ IMC. In the case of the solder/ENIG joint, $AuZn_{3}$ IMCs were formed at the interface. In the case of the Au/Ni/Cu substrate, an $AuZn_{3}$ IMC layer formed at the interface due to the fast reaction between Au and Zn. In addition, the $AuZn_{3}$ IMC layer became detached from the interface after reflow. When the aging time was extended to 100 h, $Ni_{5}Zn_{21}$ IMC was observed on the Ni substrate.

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Immersion Ag가 도금된 Cu기판을 가진 Pb-free solder 접합부의 신뢰성 평가 (Reliability evaluation of Pb-free solder joint with immersion Ag-plated Cu substrate)

  • 윤정원;정승부
    • 대한용접접합학회:학술대회논문집
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    • 대한용접접합학회 2006년도 춘계 학술대회 개요집
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    • pp.30-32
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    • 2006
  • The interfacial reaction and reliability of eutectic Sn-Pb and Pb-free eutectic Sn-Ag ball-grid-array (BGA) solders with an immersion Ag-plated Cu substrate were evaluated following isothermal aging at $150^{\circ}C$. During reflowing, the topmost Ag layer was dissolved completely into the molten solder, leaving the Cu layer exposed to the molten solder for both solder systems. A typical scallop-type Cu-Sn intermetallic compound (IMC) layer was formed at both of the solder/Cu interfaces during reflowing. The thickness of the Cu-Sn IMCs for both solders was found to increase linearly with the square root of isothermal aging time. The growth of the $Cu_3Sn$ layer for the Sn-37Pb solder was faster than that for the Sn-3.5Ag solder, In the case of the Sn-37Pb solder, the formation of the Pb-rich layer on the Cu-Sn IMC layer retarded the growth of the $Cu_6Sn_5$ IMC layer, and thereby increased the growth rate of the $Cu_3Sn$ IMC layer. In the ball shear test conducted on the Sn-37Pb/Ag-plated Cu joint after aging for 500h, fracturing occurred at the solder/$Cu_6Sn_5$ interface. The shear failure was significantly related to the interfacial adhesion strength between the Pb-rich and $Cu_6Sn_5$ IMC layers. On the other hand, all fracturing occurred in the bulk solder for the Sn-3.5Ag/Ag-plated Cu joint, which confirmed its desirable joint reliability.

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가공의치(架工義齒) 납착부(蠟着部)의 강도(强度)와 내부구조(內部構造)에 관(關)한 실험적(實驗的) 연구(硏究) (An experimental study of the strength and internal structure of solder joint of fixed partial denture)

  • 박상남;계기성
    • 대한치과보철학회지
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    • 제23권1호
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    • pp.39-59
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    • 1985
  • The purpose of this study was to investigate how gap distances of 0.13mm, 0.15mm, 0.20mm, and 0.30mm affects solder joint strength from gold alloys and nickel-chromium base alloys and to examine the composition of solder gold, the solder joint of gold alloys and nickel-chromium base alloys. The tensile test specimens were prepared in the split stainless steel mold with a half dumbbell shape 2.5mm in diameter and l2mm in length. 6 pairs of specimens of each gap distance group of gold alloys and nickel-chromium base alloys were made and 48 pairs of all specimens were soldered with solder gold of 666 fineness. All soldered specimens were machined to a uniform diameter and then a tensile load was applied at a cross-head speed of 0.10mm/min using Instron Universal Testing Machine, Model 1115. The fractured specimens at solder gold of solder joint fracture with each gap distance of 0.13mm, 0.15mm, 0.20mm, and 0.30mm were examined under the Scanning Electron Microscope, JSM-35c and the composition of solder gold, the solder joint of gold alloys and nickel-chromium base alloys was analyzed by Electron Probe Micro Analyzer. The results of this study were obtained as follows: 1. In case of soldering of gold alloys, the tensile strength between gold alloys showed $37.33{\pm}2.52kg/mm^2$ at 0.13, $39.14{\pm}3.35kg/mm^2$ at 0.15mm, $43.76{\pm}2.97kg/mm^2$ at 0.20mm, and $49.18{\pm}4.60kg/mm^2$ at 0.30mm. There was statistically significant difference at each gap distance, and so the greater increase of gap distance showed the greater tensile strength. 2. In case of soldering of nickel-chromium base alloys, the tensile strength between nickel-chromium base alloys showed $34.84{\pm}4.26kg/mm^2$ at 0.13mm, $37.25{\pm}2.49kg/mm^2$ at 0.15mm, $42.91{\pm}4.32kg/mm^2$ at 0.20mm, and $46.93{\pm}4.21kg/mm^2$ at 0.30mm. There was not statistically significant difference only between 0.13mm and 0.15mm and bet ween 0.20 mm and 0.30mm, but generally the greater increase of gap distance showed the greater tensile strength. 3. The greater increase of gap distance shoed less porosities in solder gold at solder joint fracture. 4. In solder gold Au, Cu, Ag, Zn, and Sn were composed and Au and Cu were mostly distributed uniformly. 5. In solder joints of solder gold and gold alloys Au, Cu, Ag, Zn, and Sn were composed in solder gold and Au, Cu, Ag, Pt, and Pd were composed in gold alloys. Au and Cu of solder gold and gold alloys were mostly distributed uniformly and the diffusion of other elements except Pt and Pd around the solder joint was not almost found. In solder joints of solder gold and nickel-chromium base alloys Au, Cu, Ag, Zn, and Sn were composed in solder gold and Ni, Cr, and Al were composed in nickel-chromium base alloys. Au and Cu of solder gold and Ni and Cr of nickel-chromium base alloys were mostly distributed uniformly and the diffusion of other elements except Cr around the solder joint was not almost found.

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에폭시 경화형 무세정 SAC305 솔더 페이스트의 리플로우 공정성과 보드레벨 BGA 솔더 접합부 특성 (Reflow Behavior and Board Level BGA Solder Joint Properties of Epoxy Curable No-clean SAC305 Solder Paste)

  • 최한;이소정;고용호;방정환;김준기
    • 마이크로전자및패키징학회지
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    • 제22권1호
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    • pp.69-74
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    • 2015
  • 첨단 전자기기에 사용되는 전자부품의 크기와 접속피치가 감소하면서 리플로우 공정 후 플럭스 잔사의 세정이 어려워짐에 따라 무세정 솔더 페이스트에 대한 요구가 증가하고 있다. 본 연구에서는 SAC305 솔더분말과 에폭시 레진을 주성분으로 하는 경화성 플럭스를 혼합하여 제조한 에폭시 경화형 솔더 페이스트에 대하여 리플로우 공정성, 플럭스 잔사의 부식성, 솔더볼 및 보드레벨 BGA 패키지 솔더 접합부의 기계적 거동을 기존 로진계 솔더 페이스트와 비교하여 평가하였다. 에폭시 경화형 솔더 페이스트는 솔더 접합부 주변에 경화물 필렛을 형성한 것으로 보아 플럭싱 작용에 의해 솔더 접합부가 형성된 이후에 경화반응이 진행되는 것을 확인할 수 있었으며, 동판에 대한 젖음성 시험을 통해 기존상용 솔더 페이스트 정도의 납퍼짐성을 갖는 것을 알 수 있었다. 리플로우 후 동판에 대한 고온 고습 시험을 통해 에폭시 경화형 솔더 페이스트는 동판 부식을 전혀 발생시키지 않는 것으로 나타났는데, 이는 FT-IR 분석결과 에폭시 경화반응을 통해 단단히 고정된 결과로 생각되었다. 볼전단, 볼당김 및 다이전단 시험 결과, 솔더 접합부 주변에 형성된 경화물 필렛은 솔더 표면과 접착본딩을 형성하며, 다이전단강도를 15~40% 정도 향상시키는 것으로 보아 에폭시 경화형 솔더 페이스트는 플럭스 잔사 세정공정의 생략과 함께 솔더 접합부 보강효과를 통해 패키지 신뢰성 향상에도 기여할 수 있을 것으로 생각되었다.

고온 시효 시험에 따른 Epoxy 솔더 접합부의 접합 특성 평가 (Evaluation of Bonding Properties of Epoxy Solder Joints by High Temperature Aging Test)

  • 강민수;김도석;신영의
    • 한국전기전자재료학회논문지
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    • 제32권1호
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    • pp.6-12
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    • 2019
  • Bonding properties of epoxy-containing solder joints were investigated by a high temperature aging test. Specimens were prepared by bonding an R3216 standard chip resistor to an OSP-finished PCB by a reflow process with two basic types of solder (SAC305 & Sn58Bi) pastes and two epoxy-solder (SAC305+epoxy & Sn58Bi+epoxy) pastes. In all epoxy solder joints, an epoxy fillet was formed in the hardened epoxy, lying around the outer edge of the solder joint, between the chip and the Cu pad. In order to analyze the bonding characteristics of solder joints at high temperatures, a high-temperature aging test at $150^{\circ}C$ was carried out for 14 days (336 h). After aging, the intermetallic compound $Cu_6Sn_5$ was found to have formed in the solder joint on the Cu pad, and the shear stress on the conventional solder joint was reduced by a significant amount. The reason that the shear force did not decrease much, even though in epoxy solder, was thatbecause epoxy hardened at the outer edge of the supported solder joints. Using epoxy solder, strong bonding behavior can be ensured due to this resistance to shear force, even in metallurgical changes such as those where intermetallic compounds form at solder joints.

신뢰성 수명예측 도구 Sherlock을 활용한 랜덤진동에서의 BGA 및 TSSOP 솔더 접합부의 구조 신뢰성 평가 (Structural Reliability Evaluation on Solder Joint of BGA and TSSOP Components under Random Vibration using Reliability and Life Prediction Tool of Sherlock)

  • Park, Tae-Yong;Park, Jong-Chan;Park, Hoon;Oh, Hyun-Ung
    • 한국항공우주학회지
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    • 제45권12호
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    • pp.1048-1058
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    • 2017
  • 우주용 전장품의 주요 고장 메커니즘 중 하나는 발사진동에 의한 기판의 반복적인 굽힘에 의한 솔더 접합부 피로파괴이며, 상기의 잠재적 위험요소에 대해 피로수명 평가를 통한 조기진단의 필요성이 증대되고 있다. 종래 연구에서 제안된 솔더부 수명예측 기법은 실장기법이 달라지면 예측결과의 정확성을 장담할 수 없으며, 다수의 실장기법이 적용된 고집적 기판의 유한요소모델 구축에 많은 시간과 노력이 수반되는 단점이 있다. 본 연구에서는 기존 연구의 한계점 극복을 위해 우주용 전장품 구조 신뢰성 평가의 새로운 접근법으로 상용 신뢰성 수명예측 도구인 Sherlock을 이용한 기판의 수명예측을 실시하고 발사진동 수명시험을 통해 분석결과의 타당성을 검증하였다. 또한 전자소자 및 솔더 높이에 따른 피로수명 영향성 분석을 통해 Sherlock이 우주용 전장품의 구조 신뢰성 평가에 있어서 유용한 도구임을 입증하였다.

자동차 전장품용 무연솔더 접합부의 시리즈 시험 유효성 (Validation of sequence test method of Pb-free solder joint for automotive electronics)

  • 김아영;오철민;홍원식
    • Journal of Welding and Joining
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    • 제33권3호
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    • pp.25-31
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    • 2015
  • Due to environmental regulations (RoHS, WEEE and ELV) of the European Union, electronics and automotive electronics have to eliminate toxic substance from electronic devices and system. Specifically, reliability issue of lead-free solder joint have an increasing demand for the car electronics caused by ELV banning. The authors prepared engine control unit and cabin electronics soldered with Sn-3.0Ag-0.5Cu (SAC305). To compare with the degradation characteristics of solder joint strength, thermal cycling test (TC), power-thermal cycling test (PTC) and series tests were conducted. Series tests were conducted for TC and PTC combined stress test using the same sample in sequence and continuously. TC test was performed at $-40{\sim}125^{\circ}C$ and soak time 10 min for 1000 cycles. PTC test was applied by pulse power and full function conditions during 100 cycles. Combined stress test was tested in accordance with automotive company standard. Solder joint degradation was observed by optical microscopy and environment scanning electron microscopy (ESEM). In addition, to compare with deterioration of bond strength of quad flat package (QFP) and chip components, we have measured lead pull and shear strength. Based on the series test results, consequently, we have validated of series test method for lifetime and reliability of Pb-free solder joint in automotive electronics.

수치해석을 이용한 임베딩 패키지 솔더 조인트의 신뢰성에 미치는 에이징 효과 연구 (Study on Effects of Solder Joint aging on the Reliability of Embedded Package Solder Joints using Numerical analysis)

  • 조승현;장준영;고영배
    • 마이크로전자및패키징학회지
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    • 제25권1호
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    • pp.17-22
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    • 2018
  • 본 논문에서는 임베딩 패키지의 솔더 조인트 신뢰성에 미치는 솔더 조인트의 에이징 효과를 유한요소법에 의한 수치해석을 통해 연구하였다. SAC305 솔더 조인트의 에이징 시간은 0, 60, 180 일이 적용되었고 신뢰성 분석을 위해 패키지 휨, ECS(Equivalent Creep Strain) 및 TSED(Total Strain Energy Density)이 분석되었다. 연구결과에 따르면 임베딩 패키지의 휨이 비임베딩 패키지에 비해 감소하여 임베딩 패키지내 솔더 접합부의 신뢰성이 높을 것으로 예측되었다. 또한, 에이징 시간이 길수록 임베디드 패키지의 휨이 감소하지만 솔더 조인트의 신뢰성 수명도 감소할 것으로 분석되었다.