• 마이크로전자및패키징학회지
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• 제28권4호
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• pp.19-23
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• 2021

본 논문은 경면반사특성을 갖는 솔더볼의 생산공정 관리와 품질확보를 목적으로 머신비전을 적용한 3차원형상을 결함검사방법으로서, 60미크론 이내의 마이크로 솔더볼을 대상으로 정밀한 위치제어장치가 필요없이 임의로 위치한 솔더볼의 반사영상을 취득 후 통계적으로 분석하여 3차원 형상의 결함유무를 검사하는 방법을 제안한다. 이를 위해 복수개의 LED를 링형태로 배열한 광원을 사용하여 트레이에 위치한 많은 수의 마이크로솔더볼을 동시에 촬영한 영상을 취득하고, 영상처리를 통해 반사되는 LED의 상대적 위치를 구한 후, 통계적 분석을 통하여 결함의 유무를 판단하는 방법을 제안하고 실험을 통해 그 효용성을 보인다.

• 한국분말야금학회:학술대회논문집
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• 한국분말야금학회 2006년도 Extended Abstracts of 2006 POWDER METALLURGY World Congress Part2
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• pp.1207-1208
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• 2006

We developed the copper core ball electroplated with Sn-Ag-Cu of the eutectic composition which used mostly as Pb free solder ball with high reliability. In order to search for the practicality of this developed copper core ball, the evaluation was executed by measuring the initial joint strength of the sample mounted on the substrate and reflowed and by measuring the joint strength of the sample after the high temperature leaving test and the constant temperature and the humidity leaving test. This evaluation was compered with those of the usual other copper core balls electroplated with (Sn,Sn-Ag,Sn-Cu,Sn-Bi) and the Sn-Ag-Cu solder ball.

• 한국생산제조학회지
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• 제20권5호
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• pp.559-563
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• 2011

Drop impact reliability assessment of solder joints on the flip chip is one of the critical issues for micro system packaging. Our previous researches have been showing that new solder ball compositions of Sn-3.0Ag-0.5Cu has better mechanical reliability than Sn-1.0Ag-0.5Cu. In this paper, dynamic reliability analysis using Finite Element Analysis (FEA) is carried out to assess the factors affecting flip chip in drop simulation. The design parameters are size and thickness of chip, and size, pitch and array of solder ball with composition of Sn1.0Ag0.5Cu. The board systems by JEDEC standard including 15 chips, solder balls and PCB are modeled with various design parameter combinations, and through these simulations, maximum yield stress and strain at each chip are shown at the solder balls. It is found that larger chip size, smaller chip array, smaller ball diameter, larger pitch, and larger chip thickness have bad effect on maximum yield stress and strain at solder ball of each chip.

• 한국소음진동공학회논문집
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• 제25권3호
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• pp.176-183
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• 2015

This research proposes a method to estimate the fatigue life of SSD(solid-state drive) due to the effect of dummy solder ball under forced vibration. A finite element model of the SSD was developed to simulate the forced vibration and a modal testing was performed to verify the developed finite element model. Fatigue life of the SSD under vibration was experimentally determined according to JEDEC standard in which the SSD was excited by a sinusoidal sweep vibration within the narrow frequency band around the first natural frequency until the SSD fails. Basquin's equation was introduced to estimate the fatigue life of the SSD due to the effect of dummy solder balls. It shows that the dummy solder balls are effective elements of the SSD to increase the fatigue life of an SSD by increasing 700 times of the fatigue life of the given SSD.

• 마이크로전자및패키징학회지
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• 제16권2호
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• pp.11-19
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• 2009

모아레 간섭계를 이용하여 와이어 본딩 플라스틱 볼 그리드 (WB-PBGA) 패키지의 열-기계적인 거동 특성을 연구하였다. 실시간 모아레 간섭계를 이용하여 각 온도단계 에서 변위분포를 나타내는 간섭무늬를 각각 얻고, 그로부터 굽힘변형 거동 및 솔더볼의 변형률에 대한 해석을 비교하여 수행하였다. 본 실험에서는 full grid와 perimeter with central connections 및 perimeter의 배열 형태를 갖는 세 가지 패키지를 사용하였으며, 이 배열 형태를 비교하여 굽힘변형 및 솔더볼의 평균변형률을 자세하게 해석하였다. 솔더볼의 유효변형률은 WB-PBGA-FG의 경우 칩 가장자리 바로 바깥쪽 솔더볼에서, WB-PBGA-P/C의 경우 가운데 연결 솔더볼의 가장 바깥 솔더볼에서, WB-PBGA-P의 경우는 칩과 가장 기까운 안쪽 솔더볼에서 최대값을 가지는 것으로 나타났다.

• 마이크로전자및패키징학회지
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• 제11권1호
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• pp.77-85
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• 2004

플라즈마 리플로우 솔더링에서 솔더볼의 접합성을 향상시키기 위해 UBM(Under Bump Metallization)을 Ar-10vol%$H_2$플라즈마로 클리닝하는 방법을 연구하였다. UBM층은 Si 웨이퍼 위에 Au(두께; 20 nm)/ Cu(4 $\mu\textrm{m}$)/ Ni(4 $\mu\textrm{m}$)/ Al(0.4 $\mu\textrm{m}$)을 웨이퍼 측으로 차례대로 증착하였다. 무연 솔더로는Sn-3.5wt%Ag, Sn-3.5wt%Ag-0.7wt%Cu를 사용하였고 Sn-37wt%Pb를 비교 솔더로 사용하였다. 지름이500 $\mu\textrm{m}$인 솔더 볼을 플라즈마 클리닝 처리를 한 UBM과 처리하지 않은 UBM위에 놓고, Ar-10%$H_2$플라즈마 분위기에서 플럭스 리스 솔더링하였다. 이 결과는 플럭스를 사용하여 대기 중에서 열풍 리플로우한 결과와 비교하였다. 실험 결과, 플라즈마 클리닝 후 플라즈마 리플로우한 솔더의 퍼짐율이 클리닝 하지 않은 플라즈마 솔더링보다 20-40%정도 더 높았다. 플라즈마 클리닝 후 플라즈마 리플로우한 솔더 볼의 전단 강도는 약58-65MPa로, 플라즈마 클리닝 하지 않은 플라즈마 리플로우보다 60-80%정도 높았으며, 플럭스를 사용한 열풍 리플로우보다는 15-35%정도 높았다. 따라서 Ar-10%$H_2$가스를 사용하여 UBM에 플라즈마 클리닝하는 공정은 플라즈마 리플로우 솔더 볼의 접합강도를 향상시키는데 상당한 효과가 있는 것으로 확인되었다.

• 제어로봇시스템학회논문지
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• 제21권12호
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• pp.1115-1121
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• 2015

Fast inspection of solder ball bumps in ball grid array (BGA) is an important issue in the flip chip bonding technology. Particularly, semiconductor industry has required faster and more accurate inspection of micron-size solder bumps in flip chip bonding, as the density of balls increase dramatically. In this paper, we describe an inspection approach of BGA balls by using 5-step ring illumination device and normalized cross-correlation (NCC) method. The images of BGA ball by the illumination device show unique and distinguishable characteristic contours by their 3-D shapes, which are called as "iso-slope contours". Template images of reference ball samples can be produced artificially by the hybrid reflectance model and 3D data of balls. NCC values between test and template samples are very robust and reliable under well-structured condition. The 200 samples on real wafer are tested and show good practical feasibility of the proposed method.

• 한국생산제조학회지
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• 제21권2호
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• pp.225-231
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• 2012

Drop simulations of the board level in the flip chips with solder joints have been highlighted for years, recently. Also, through the study on the life prediction of thermal fatigue in the flip chips considering underfill, its importance has been issued greatly. In this paper, dynamic analysis using the implicit method in the Finite Element Analysis (FEA) is carried out to assess the factors effecting on flip chips considering underfill. The design parameters are size and thickness of chip, and size, pitch and array of solder ball with composition of Sn1.0Ag0.5Cu. The board systems by JEDEC standard is modeled with various design parameter combinations, and through these simulations, maximum yield stress and strain at each chip are shown at the solder balls. Modal analysis is simulated to find out the relation between drop impact and vibration of the board system.

• 한국마이크로전자및패키징학회:학술대회논문집
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• 한국마이크로전자및패키징학회 2001년도 추계 기술심포지움
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• pp.67-73
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• 2001

To investigate the relationships of solder joint characteristics with solder composition and A:V ratio (solder volume per pad area), Sn-37Pb and Sn-4.0Ag-0.5Cu solder balls with 330, 400, 450 and $457{\mu}{\textrm}{m}$ size were reflowed on same substrate. Sn-37Pb and Sn-4.0Ag-0.5Cu was reflowed at $220^{\circ}C$ and $240^{\circ}C$ respectively by IR-type soldering machine. As a result of reflowed solder- ball diameter(D) and height(H) measurement, D/H was decreased with solder ball size increment in range of 330~450 ${\mu}{\textrm}{m}$. But, D/H was increased in the solder joint for 457 ${\mu}{\textrm}{m}$ size, it was caused possibly by decrement of solder ball height increment compared with solder volume increment. As a result of shear and pull test, joint strength with A:V ratio was high. Joint strength of Sn-4.0Ag-0.5Cu was higher than Sn-37Pb. However, Sn-37Pb had more stable solder joint of small standard deviation. A thick and clean scallop type Ni-Cu-Sn intermetallic compound layer was formed in high A:V ratio and Sn-4.0Ag-0.5Cu solder joint interface.

• 한국소음진동공학회:학술대회논문집
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• 한국소음진동공학회 2014년도 추계학술대회 논문집
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• pp.978-983
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• 2014

This research proposes a method to estimate the fatigue life of solid-state drive(SSD) due to the effect of dummy solder ball under forced vibration. Mechanical jig is developed to describe the SSD in laptop computer. The jig with SSD is mounted on a shaker, and excited by a sinusoidal sweep vibration within the narrow frequency band around the first resonant frequency until the SSD fails. A finite element model of SSD is also developed to simulate the forced vibration. It shows that the solder joints at the corners of controller package are most vulnerable components and that placing dummy solder balls at those area is effective method to increase fatigue life of SSD.