• Journal of the Korea Institute of Information and Communication Engineering
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• v.26 no.10
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• pp.1559-1562
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• 2022

As electronic devices technology scales down into the deep-submicron to achieve high-density, low power and high performance integrated circuits, multiple bit upsets by soft errors have become a major threat to on-chip memory systems. To address the soft error problem, single error correction, double error detection and double adjacent error correction (SEC-DED-DAEC) codes have been recently proposed. But these codes do not troubleshoot mis-correction problem. We propose the SEC-DED_DAEC code with without mis-correction. The decoder for proposed code is implemented as hardware and verified. The results show that there is no mis-correction in the proposed codes and the decoder can be employed on-chip memory system.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.26 no.11
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• pp.1747-1750
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• 2022

As shrinking the semiconductor process into the deep sub-micron to achieve high-density, low power and high performance integrated circuits, MBU (multiple bit upset) by soft errors is one of the major challenge of on-chip memory systems. To address the MBU, single error correction, double error detection and double adjacent error correction (SEC-DED-DAEC) codes have been recently proposed. But these codes do not resolve mis-correction. We propose the SEC-DED-DAEC-TAED(triple adjacent error detection) code without mis-corrections. The generated H-matrix by the proposed heuristic algorithm to accomplish the proposed code is implemented as hardware and verified. The results show that there is no mis-correction in the proposed codes and the 2-stage pipelined decoder can be employed on-chip memory system.

• Journal of Institute of Control, Robotics and Systems
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• v.17 no.11
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• pp.1101-1105
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• 2011

Radiation particles can introduce temporary errors in memory systems. To protect against these errors, so-called soft errors, error detection and correcting codes are used. In addition, scrubbing is applied which is a fundamental technique to avoid the accumulation of soft errors. This paper introduces an optimal scrubbing scheme, which is suitable for a system with auto error detection and correction logic. An auto error detection and correction logic can correct soft errors without CPU's writing operation. The proposed scrubbing scheme leads to maximum reliability by considering both allowable scrubbing load and the periodic accesses to memory by the tasks running in the system.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.21 no.3
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• pp.601-606
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• 2017

SRAM-based FPGAs mainly used to develop and implement high-performance circuits have SRAM-type configuration memory. Soft errors in memory devices are the main threat from a reliability point of view. Soft errors occurring in the configuration memory of FPGAs cause FPGAs to malfunction. SEM(Soft Error Mitigation) Controllers offered by Xilinx can mitigate the influence of soft errors in configuration memory. SEM Controllers use ECC(Error Correction Code) and CRC(Cyclic Redundancy Code) which are placed around the configuration memory to detect and correct the errors. The correction is done through a partial reconfiguration process. This paper presents the availability analysis of SRAM-based FPGAs against soft errors under the protection of SEM Controllers. Availability functions were derived and compared according to the correction capability of SEM Controllers of several different families of FPGAs. The result may help select an SRAM-based FPGA part and estimate the availability of FPGAs running in an environment where soft errors occur.

• Proceedings of the Korean Society of Broadcast Engineers Conference
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• 2020.11a
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• pp.241-243
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• 2020

The high computational complexity of deep learning algorithms has led to the development of specialized hardware architectures. However, soft errors (bit flip) may occur in these hardware systems due to voltage variation and high energy particles. Many error correction methods have been proposed to counter this problem. In this work, we analyze an error correction mechanism based on repetition codes and an activation function. We test this method by injecting errors into weight filters and define an ideal error rate range in which the proposed method complements the accuracy of the model in the presence of error.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2016.10a
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• pp.655-658
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• 2016

Xilinx 7-Series FPGA(Field Programmable Gate Array)s mainly used for the implementation of high-performance digital circuit have SRAM-type configuration memory and can malfunction when soft errors occur in their configuration memory. SEM(Soft Error Mitigation Controller) offered by Xilinx helps users mitigate the influence of soft errors in configuration memory. When soft errors occur, SEM Controller can recover the state of FPGA through partial reconfiguration if the soft errors are correctable by ECC(Error Correction Code) and CRC(Cyclic Redundancy Code). This paper presents the availability analysis of Xilinx 7-Series FPGAs against soft errors under the protection of the SEM Controller. Availability functions are derived and compared according to the correction capability of the SEM Controller. The result may help to estimate the reliability of SRAM-based FPGA running in an environment where soft errors may occur.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2011.10a
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• pp.677-680
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• 2011

Error detection and correcting codes are typically used to protect against soft errors. In addition, scrubbing is applied which is a fundamental technique to avoid the accumulation of soft errors. This paper introduces an optimal scrubbing scheme, which is suitable for a system with auto error detection and correction logic. An auto error detection and correction logic can correct soft errors without CPU's writing operation. The proposed scrubbing scheme leads to maximum reliability by considering both allowable scrubbing load and the periodic accesses to memory by the tasks running in the system.

• The Journal of the Korea institute of electronic communication sciences
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• v.13 no.4
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• pp.721-728
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• 2018

This paper introduces various linear block error correction code and compares performances of the correction circuits. As the risk of errors due to power noise has increased, ECC(: Error Correction Code) has been introduced to prevent the bit error. There are two representatives of ECC structures which are SEC-DED(: Single Error Correction Double Error Detection) and SEC-DED-DAEC(: Double Adjacent Error Correction). According to simulation results, the SEC-DED circuit has advantages of small area and short delay time compared to SEC-DED-DAEC circuits. In case of SED-DED-DAEC, there is no big difference between Dutta's and Pedro's from performance point of view. Therefore, Pedro's code is more efficient than Dutta' code since the correction rate of Pedro's code is higher than that of Dutta's code.

• Journal of Institute of Control, Robotics and Systems
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• v.20 no.4
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• pp.443-448
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• 2014

Soft errors in memory devices that caused by radiation are the main threat from a reliability point of view. This threat can be commonly overcome with the combination of SEC (Single-Error Correction) codes and scrubbing technique. The interleaving architecture can give memory devices the ability of tolerating these soft errors, especially against multiple-bit soft errors. And the interleaving distance plays a key role in building the tolerance against multiple-bit soft errors. This paper proposes a reliability model of an interleaved memory device which suffers from multiple-bit soft errors and are protected by a combination of SEC code and scrubbing. The proposed model shows how the interleaving distance works to improve the reliability and can be used to make a decision in determining optimal scrubbing technique to meet the demands in reliability.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.57 no.1
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• pp.128-136
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• 2008

In this paper, we propose a new cache structure for effective error correction of soft error. We added check bit and SEEB(soft error evaluation block) to evaluate the status of cache line. The SEEB stores result of parity check into the two-bit shit register and set the check bit to '1' when parity check fails twice in the same cache line. In this case the line where parity check fails twice is treated as a vulnerable to soft error. When the data is filled into the cache, the new replacement algorithm is suggested that it can only use the valid block determined by SEEB. This structure prohibits the vulnerable line from being used and contributes to efficient use of cache by the reuse of line where parity check fails only once can be reused. We tried to minimize the side effect of the proposed cache and the experimental results, using SPEC2000 benchmark, showed 3% degradation in hit rate, 15% timing overhead because of parity logic and 2.7% area overhead. But it can be considered as trivial for SEEB because almost tolerant design inevitably adopt this parity method even if there are some overhead. And if only parity logic is used then it can have $5%{\sim}10%$ advantage than ECC logic. By using this proposed cache, the system will be protected from the threat of soft error in cache and the hit rate can be maintained to the level without soft error in the cache.