• Korean Journal of Optics and Photonics
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• v.11 no.5
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• pp.323-329
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• 2000

In this study we have calculated an ideal complex refractive index of a TiN trim used in a layer of anl1reilecnon (I\R) coatmg, [air$ISiO_2ITiNIglass$] in the visible. Also we simulated the rellectance of lwo-layer AR coating by varying the thicknesses of TiN and $SiO_2$ layers, respecl1vely. The simolation results show that we can controllhe lowest reflectance and AR band of tile AR coating. The TIN fihns were fabricated by a RF magnetron sputtering apparalus. The chemical, structural and electrical properties of TiN fih11S were inveshgated by the Rutherford backscattering spech'oscopy (RBS), atomic force microscope (AFM) and 4-point probe. The optical properlies were inve,tigated by the spectrophotometer and vanable angle spectroscopic ellipsometer (VASE). The smface roughness of TiN flhns \vas $9~10\AA$. TIle resistivity of TiN films was TEX>$360~730\mu$\Omega $ cm. The ,toichlOllletry of TiN film was 1'1: O:N = I: 0.65 :0.95 and ilic oxygen wa~ found on ilie smface. With these experimental and simu]al1on resulLs, we deposited duo: two-layer AR coating, [air$ISiO_2ITiNIglass$] and the refleClance was under 0.5% ill the regIOn of 440-650 run. 0 run.

• Korean Journal of Optics and Photonics
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• v.26 no.2
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• pp.73-82
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• 2015

This work demonstrates the indoor SI-traceable calibration of a transmissometer with a 75-m baseline for the measurement of visibility in MOR (Meteorological Optical Range). The calibration is performed using a set of neutral density (ND) filters (OD 0.1-2.5) and a set of high-transmission quartz glass plates (a bare quartz glass plate and antireflective-coated quartz glass plates), the collection consisting of 20 artifacts in total. The luminous transmittance values of the reference artifacts had been calibrated traceable to the KRISS spectral transmittance scale, which ranges from 0.2 % to 99.5 %. The transmissometer to be calibrated typically consists of a loosely collimated light source based on a white LED (CCT ~5000 K) and a luminous intensity detector with a CIE 1924 V(${\lambda}$) spectral response. As a result of calibration, we obtained the MOR error and its uncertainty for the transmissometer in 20 m - 40 km of MOR. Based on the results, we investigated the applicability of the calibration method and the conformity of the transmissometer to the ICAO's (International Civil Aviation Organization) accuracy requirement for meteorological visibility measurement. We expect that this work will establish the standard procedure for the SI-traceable calibration of a transmissometer.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.121-121
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• 2010

ZnO is a promising material for the application of high efficiency light emitting diodes with short wavelength region for its large bandgap energy of 3.37 eV which is similar to GaN (3.39 eV) at room temperature. The large exciton binding energy of 60 meV in ZnO provide provides higher efficiency of emission for optoelectronic device applications. Several ZnO/ZnMgO multiple quantum well (MQW) structures have been grown on various substrates such as sapphire, GaN, Si, and so on. However, the achievement of high quality ZnO/ZnMgO MQW structures has been somehow limited by the use of lattice-mismatched substrates. Therefore, we propose the optical properties of ZnO/ZnMgO multiple quantum well (MQW) structures with different well widths grown on lattice-matched ZnO substrates by molecular beam epitaxy. Photoluminescence (PL) spectra show MQW emissions at 3.387 and 3.369 eV for the ZnO/ZnMgO MQW samples with well widths of 2 and 5 nm, respectively, due to the quantum confinement effect. Time-resolved PL results show an efficient photo-generated carrier transfer from the barrier to the MQWs, which leads to an increased intensity ratio of the well to barrier emissions for the ZnO/ZnMgO MQW sample with the wider width. From the power-dependent PL spectra, we observed no PL peak shift of MQW emission in both samples, indicating a negligible built-in electric field effect in the ZnO/$Zn_{0.9}Mg_{0.1}O$ MQWs grown on lattice-matched ZnO substrates.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.22 no.1
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• pp.461-467
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• 2021

Among the defect factors that can occur when a wafer-level lens is molded using a thermosetting material, the mold sticking problem of a molded lens during the release process can damage the molded substrate and deform the substrate at the wafer level. An experiment was conducted to examine the factors affecting the demolding force in the lens forming process. The demolding force was examined according to the coating material of the molds. The mold was surface-treated with ITO and Ti, followed by plasma treatment in an O2 atmosphere. A DLC coating was then performed, and the curing and releasability were examined. A coating method for the pull-off experiment was selected based on the results. To measure the demolding force according to the curing process conditions, a method of curing at a constant pressure and a method of curing at a constant position were applied. As a result, the TiO2 surface treatment reduced the release force. When cured by controlling the location, curing shrinkage can reduce the adhesion energy of the interface during curing, resulting in better demolding.

• Proceedings of the Korean Vacuum Society Conference
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• 2015.08a
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• pp.244.1-244.1
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• 2015

The Ag Nanowire is one of the materials that are widely studied as alternatives to ITO and is available for large area, low cost process and the flexible transparent electrode. However, Ag nanowire can have the problem of a lack of stability at high temperatures, making this impossible to form a film. Using a structure of ITO/AgNW/ITO in photodetector device, we improved the properties of the ITO in the IR region and improved the thermal stability of the AgNW. The structure of ITO/AgNW/ITO has a high transmittance value of 89% at a wavelength of 900 nm and provide a good electrical property. The AgNWs embedded ITO film has a high transmittance, this is because of the light scattering from the AgNW. The thermal stability of the developed ITO/AgNWs/ITO films were investigated and found AgNWs embedded ITO films posses considerable high stability compared to the solo AgNWs on the Si surface. The ITO/AgNWs/ITO device showed a improved photo-response ratio compared to those of the conventional TC device in IR region. This is attributed to the high transmittance and low sheet resistance. We suggest an effective design scheme for IR-sensitive photodetection by using an AgNW embedded ITO.

• Korean Journal of Optics and Photonics
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• v.21 no.4
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• pp.175-178
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• 2010

A transmission type color filter based on a thin film Ag-$SiO_2$-Ag etalon was proposed and realized in a quartz substrate. The device could acquire infrared suppressed transmission and wide effective area compared to costly e-beam lithography and laser interference lithography. The FDTD method was introduced to take into account the effect of the dispersion characteristics of the silver metal and the thickness thereof. Three different color filters were devised: The cavity length for the red, green and blue filters were 160 nm, 130 nm, and 100 nm respectively, with the metal layer unchanged at 25 nm. The observed center wavelengths were measured at 650 nm, 555 nm, and 480 nm for the red, green, and blue devices; the corresponding bandwidths were about 120 nm, 100 nm, and 120 nm; and the peak transmission for all was ~60%. Finally the relative transmission was measured to decline with the angle of the incident beam with the rate of 1%/degree.

• Korean Journal of Optics and Photonics
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• v.10 no.6
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• pp.462-467
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• 1999

This paper describes the design and fabrication of mid-IR $(3.7-4.8{\mu}m)$ zoom optics which is used for FUR (Forward Looking Infra-Red) system with 320 $\times$ 240 focal plane arrays. The zoom optics has 20 magnification range and maximun 40$^{\circ}$$\times$30$^{\circ}$ of super wide field of view. The locus of zoom is almost linear, which gives easy access of mechanical and electro-mechanical design. The on-axis MTF of zoom optics has been measured and it shows diffraction limited optical performance. For example, it gives 0.692 at 24 cycles/mm at highest magnification, and 7.6 cycles/mradof resolving power is achieved with the operation of attached micro-scanning system.system.

• Current Optics and Photonics
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• v.3 no.6
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• pp.590-596
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• 2019

To improve the color gamut of a liquid-crystal display (LCD), we propose a bandpass filter that is added to the backlight unit to optimize the backlight spectrum. The bandpass filter can only transmit red, green and blue light in the visible range, while reflecting the unwanted light. We study the optical properties of the bandpass filter using the transfer-matrix method, and the effect of the bandpass filter on the color gamuts of LCDs is also investigated. When a bandpass filter based on a 5-layer configuration comprising low and high refractive indices ((HL)²H) is used in phosphor-converted white-light-emitting diode (pc-WLED), K₂SiF₆:Mn⁴⁺ (KSF-LED), and quantum-dot (QD) backlights, the color gamuts of the LCDs improve from 72% to 95.3% of NTSC, from 92% to 106.7% of NTSC, and from 104.3% to 112.2% of NTSC respectively. When the incident angle of light increases to 30°, the color gamuts of LCDs with pc-WLED and KSF-LED backlights decrease by 2.9% and 1% respectively. For the QD backlight, the color gamut almost does not change. When the (HL)²H structure is coated on the diffusion film, the color gamut can be improved to 92.6% of NTSC (pc-WLED), 105.6% of NTSC (KSF-LED), and 111.9% of NTSC (QD). The diffusion film has no obvious effect on the color gamut. The results have an important potential application in wide-color-gamut LCDs.

• Korean Journal of Optics and Photonics
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• v.20 no.2
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• pp.110-117
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• 2009

This work introduces the uncertainty evaluation formulation on color measurement of light sources and display devices, such as CIE 1931 (x, y) chromaticity, CIE 1960 (u, v) chromaticity, correlated color temperature, and distribution temperature. All the mentioned quantities are reduced from spectral data in the visible range, for which uncertainties are strongly correlated between different wavelengths. Using matrix algebra we have formulated the uncertainty propagation from the SI- traceable spectral irradiance standard to the individual color related measurement quantities taking the correlation between wavelengths into account. As a result, we have demonstrated uncertainty evaluation examples of 3 types of light sources: CIE illuminant A, LED white light, and LCD white light. This method can be applied to any other quantities based on spectral measurement such as solar irradiance, material color measurement, etc.

• Korean Journal of Optics and Photonics
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• v.15 no.5
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• pp.443-448
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• 2004

We realized the national standard of the candela, one of the SI units, by using two photometers with the spectral responsivity measured in reference to the absolute cryogenic radiometer. The external apertures of the photometers were fabricated using a diamond turning machine, and measured in terms of area with uncertainty of 0.05 %(k = 1). The candela is realized using a 1 kW FEL lamp and the characterized photometers on an optical bench. The uncertainty is budgeted to be 0.25 %(k = 1) considering the uncertainty of the spectral responsivity and the response uniformity of the detectors, the area of the external apertures, the color temperature of the lamp, and the positioning reproducibility of the photometers and the lamp. We verified the realized scale by comparing with the scale of National Institute of Standards and Technology, USA. They coincided with each other within 0.1%.