• Journal of the Korean Society for Precision Engineering
• /
• v.22 no.12 s.177
• /
• pp.205-210
• /
• 2005

This paper addresses the correlation between the change of file size and the scanning path build time by the slicing height of STL file. Though the study about STL file has been achieved quite actively scanning path build time using STL file is not investigated so much to be satisfied. The file size depends on the number of polygon created by the slicing height specified. And this number of polygons increases in a regular rate. The correlation between the number of polygons and the scanning path build time is examined and verified.

• Proceedings of the Korean Society of Precision Engineering Conference
• /
• 2004.10a
• /
• pp.114-118
• /
• 2004

This paper is compared the build time of scanning path as to laminate height of the SLC and STL file. The STL file improve the surface roughness according to slicing height. But it have the fault spending long time to the creation of scanning path by being lower slicing height. So we proposed the SLC file to improve this fault. Therefore this paper showed to the build time of scanning path by the increase of peace using the jewellery model.

• Journal of the Korean Society of Combustion
• /
• v.8 no.3
• /
• pp.24-30
• /
• 2003

A convolution algorithm combined with Fourier transformation has been applied to the tomographic reconstruction of asymmetric soot structure to identify the local soot volume fraction distribution. Line-of-sight integrated data from light extinction measurement with multi-angular scanning formed basic information for the deconvolution. Multi-peak following interpolation technique was applied to obtain the effect of increasing number of scanning angles. Height-by-height reconstructed soot volume fraction distribution was compared with laser-induced incandescence signals.

• Journal of Korea Multimedia Society
• /
• v.21 no.8
• /
• pp.864-875
• /
• 2018

In this paper, we propose a measurement method for height of white light scanning interferometer using deep learning. In order to measure the fine surface shape, a three-dimensional surface shape measurement technique is required. A typical example is a white light scanning interferometer. In order to calculate the surface shape from the measurement image of the white light scanning interferometer, the height of each pixel must be calculated. In this paper, we propose a neural network for height calculation and use virtual data generation method to train this neural network. The accuracy was measured by inputting 57 actual data to the neural network which had completed the learning. We propose two new functions for accuracy measurement. We have analyzed the cases where there are many errors among the accuracy calculation values, and it is confirmed that there are many errors when there is no interference fringe or outside the learned range. We confirmed that the proposed neural network works correctly in most cases. We expect better results if we improve the way we generate learning data.

• Proceedings of the Korean Society of Surveying, Geodesy, Photogrammetry, and Cartography Conference
• /
• 2004.04a
• /
• pp.15-26
• /
• 2004

The calibration for systematic error in LiDAR is crucial for the accuracy of airborne laser scanning. The main error is the misalignment of platforms between INS(Inertial Navigation System) and Laser scanner For planimetrical calibration of LiDAR, the building is good feature which has great changes in height and continuous flat area in the top. The planimetry error(pitch, roll) is corrected by adjustment of height which is calculated from comparing ground control points(GCP) of building to laser scanning data. We can know scale correction of laser range by the comparison of LiDAR data and GCP is arranged at the end of scan angle where maximize the height error. The area for scale calibration have to be large flat and have almost same elevation. At 1000m for average flying height, The Accuracy of laser scanning data using LiDAR is within 110cm in height and ${\pm}$50cm in planmetry so we can use laser scanning data for generating 3D terrain surface, expecically digital surface model(DSM) which is difficult to measure by aerial photogrammetry in forest, coast, urban area of high buildings

• Journal of Korean Society of Forest Science
• /
• v.112 no.3
• /
• pp.363-373
• /
• 2023

Forest biomass surveys are regularly conducted to assess and manage forests as carbon sinks. LiDAR (Light Detection and Ranging), a remote sensing technology, has attracted considerable attention, as it allows for objective acquisition of forest structure information with minimal labor. In this study, we propose a method for estimating overstory and understory biomass in forest stands using backpack laser scanning (BPLS) and unmanned aerial vehicle laser scanning (UAV-LS), and assessed its accuracy. For overstory biomass, we analyzed the accuracy of BPLS and UAV-LS in estimating diameter at breast height (DBH) and tree height. For understory biomass, we developed a multiple regression model for estimating understory biomass using the best combination of vertical structure metrics extracted from the BPLS data. The results indicated that BPLS provided accurate estimations of DBH (R² =0.92), but underestimated tree height (R² =0.63, bias=-5.56 m), whereas UAV-LS showed strong performance in estimating tree height (R² =0.91). For understory biomass, metrics representing the mean height of the points and the point density of the fourth layer were selected to develop the model. The cross-validation result of the understory biomass estimation model showed a coefficient of determination of 0.68. The study findings suggest that the proposed overstory and understory biomass survey methods using BPLS and UAV-LS can effectively replace traditional biomass survey methods.

• Journal of Fashion Business
• /
• v.16 no.1
• /
• pp.150-159
• /
• 2012

This study intend to analyze differences between 3D body scanning sizes and direct measurement sizes of same subjects. The subjects of study are female students of university in China. 3D data analyze as a 3D Body Measurement Soft System. The conclusion found is as below: In case of circumferences, error between direct-measurement size and 3D body scanning size is from 4.9mm to 62.2mm. The neck circumference size of directmeasurement is bigger than 3D body scanning size. The height error range is from 0.6mm to 51mm. Height of underbust, waist and hip are that direct-measurement sizes are higher than 3D body scanning sizes. Gap of width is from 3.8mm to 21.9mm. The gap range is too narrow relatively to others. Only direct-measurement size of neck width is wider than 3D body scanning size. Error range of length is from 0.3mm to 41.8mm. 3D body scanning sizes of lateral neck to waistline, upperarm length, arm length, neck shoulder point to breast point, shoulder center point to breast point, lateral shoulder to breast point are longer than direct-measurement sizes. They have a negative margin of error. I intend to set up same measurement point between direct-measurement and 3D body scanning but they have some errors because direct-measurement point is applied by a person. 3D body scanning measurement point is settled by automatic system. A measurement point of direct-measurement and 3D body scanning isn't unite. So we need to make a standard of setting up measurement points.

• International Journal of Precision Engineering and Manufacturing
• /
• v.9 no.3
• /
• pp.27-32
• /
• 2008

This paper describes a contact atomic force microscope (AFM) that can be used for high-speed precision measurements of microstructured surfaces. The AFM is composed of an air-bearing X stage, an air-bearing spindle with the axis of rotation in the Z direction, and an AFM probe unit. The traversing distance and maximum speed of the X stage are 300 mm and 400 mm/s, respectively. The spindle has the ability to hold a sample in a vacuum chuck with a maximum diameter of 130 mm and has a maximum rotation speed of 300 rpm. The bandwidth of the AFM probe unit in an open loop control circuit is more than 40 kHz. To achieve precision measurements of microstructured surfaces with slopes, a scanning strategy combining constant height measurements with a slope compensation technique is proposed. In this scanning strategy, the Z direction PZT actuator of the AFM probe unit is employed to compensate for the slope of the sample surface while the microstructures are scanned by the AFM probe at a constant height. The precision of such a scanning strategy is demonstrated by obtaining profile measurements of a microstructure surface at a series of scanning speeds ranging from 0.1 to 20.0 mm/s.

• Journal of the Korean Society for Precision Engineering
• /
• v.31 no.11
• /
• pp.999-1006
• /
• 2014

In this investigation, we explain the sub-sampling technique of white light scanning interferometry (WLSI) to improve the measurement speed. In addition to the previous work using Fourier domain analysis, several methods to extract the height from the correlogram of WLSI are described with the sub-sampling technique. Especially, Fourier-inverse Fourier transformation method adopting sub-sampling technique is proposed and the phase compensation technique is verified with simulation and experiments. The main advantage of sub-sampling is to speed up the measurements of WLSI but the precision such as repeatability is slightly poor. In case of measuring the sample which has high height step or difference, the proposed technique can be widely used to reduce the measurement time.

• Journal of the Korean Electrochemical Society
• /
• v.9 no.2
• /
• pp.84-88
• /
• 2006

The effects of tip voltage, deflection setpoint, and tip velocity on height of $SiO_2$ line drawn by local anodization on Si wafer using scanning probe microscope were investigated. No local anodization was detected at smaller than -3 V of tip voltage. The line height increased at rate of 0.47 nm/V when the tip voltage is stronger than -3 V at $1{\mu}m/s$ tip velocity. From deflection setpoint, mechanical force between tip and substrate could be calculated and the threshold farce was $12\sim18nN$. The height of anodized $SiO_2$ lines is independent of the magnitude of force above the threshold force. The line height decreased as increasing the tip velocity and limited to 0.7 nm at -5 V tip voltage.