• 한국전자파학회논문지
• /
• 제24권5호
• /
• pp.574-580
• /
• 2013

표적 추적을 위해 탐색 빔의 스캔간 획득 정보 상관 관계를 이용하는 TWS(Track While Scan) 방식과 달리, 위상 배열 레이더에서는 탐색 빔과 별도로 추적 빔을 할당하여 표적을 추적하는 adaptive tracking 방식을 사용할 수 있으며, 이로 인해 추적 형성 거리를 향상시킬 수 있다. 본 논문에서는 정기적인 탐색 빔 사이에 별도의 추적 빔들을 균등 시간 간격으로 할당한 adaptive tracking 방식을 제시하였다. 그리고 제안한 adaptive tracking 방식의 markov chain과 추적 형성 거리를 기존의 TWS 방식과 함께 나타내었다. 모의실험 결과, 동일한 추적 확인 조건하에서 제안한 adaptive tracking 방식이 TWS 방식에 비해 27.6 % 정도의 증가된 추적 형성 거리를 나타낼 수 있음을 보여주었다.

• JSTS:Journal of Semiconductor Technology and Science
• /
• 제14권5호
• /
• pp.640-648
• /
• 2014

Excessive power dissipation is one of the major issues in the testing of VLSI systems. Many techniques are proposed for scan test, but there are not so many for logic BIST because of its unmanageable randomness. This paper presents a novel low switching activity BIST scheme that reduces toggle frequency in the majority of scan chain inputs while allowing a small portion of scan chains to receive pseudorandom test data. Reducing toggle frequency in the scan chain inputs can reduce test power but may result in fault coverage loss. Allowing a small portion of scan chains to receive pseudorandom test data can make better uniform distribution of 0 and 1 and improve test effectiveness significantly. When compared with existing methods, experimental results on larger benchmark circuits of ISCAS'89 show that the proposed strategy can not only reduce significantly switching activity in circuits under test but also achieve high fault coverage.

• 대한전기학회논문지:시스템및제어부문D
• /
• 제49권11호
• /
• pp.637-642
• /
• 2000

IEEE 1149.1 boundary scan architecture is used as a standard in board-level system testing. The simplicity of this architecture is an advantage in system testing, but at the same time, it it makes a limitation of applications. Because of several problems such as 3-state net conflicts, or ambiguity issues, interconnect testing for multi-drop multi-board systems is more difficult than that of single board systems. A new approach using IEEE 1149.1 boundary scan architecture for multi-drop multi-board systems is developed in this paper. Adding boundary scan cells on backplane bus lines, each board has a complete scan-chain for interconnect test. This new scan-path insertion method on backplane bus using limited 1149.1 test bus less area overhead and mord efficient than previous approaches.

• ETRI Journal
• /
• 제30권3호
• /
• pp.412-420
• /
• 2008

A new scan partition architecture to reduce both the average and peak power dissipation during scan testing is proposed for low-power embedded systems. In scan-based testing, due to the extremely high switching activity during the scan shift operation, the power consumption increases considerably. In addition, the reduced correlation between consecutive test patterns may increase the power consumed during the capture cycle. In the proposed architecture, only a subset of scan cells is loaded with test stimulus and captured with test responses by freezing the remaining scan cells according to the spectrum of unspecified bits in the test cubes. To optimize the proposed process, a novel graph-based heuristic to partition the scan chain into several segments and a technique to increase the number of don't cares in the given test set have been developed. Experimental results on large ISCAS89 benchmark circuits show that the proposed technique, compared to the traditional full scan scheme, can reduce both the average switching activities and the average peak switching activities by 92.37% and 41.21%, respectively.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 1998년도 추계학술대회 논문집 학회본부 B
• /
• pp.669-671
• /
• 1998

Due to the serial nature of scan chains, the use of the boundary scan chain leads the high application costs. And with 3-state net, it is important to avoid enabling the two drivers in a net. In this paper, the new test method for 3-state nets in the multiple boundary scan chains is presented. This method configures the boundary scan cells as multiple scan chains and the test application time can be reduced. Also three efficient algorithms are proposed for testing the interconnects in a board without the collision of the test data in 3-state nets.

• 한국컴퓨터정보학회논문지
• /
• 제3권2호
• /
• pp.105-112
• /
• 1998

본 논문에서는 다중 보드를 시험하기 위한 새로운 구조인 확장된 스캔 경로(ESP: Extended Scan Path) 구조를 제안한다. 보드를 시험하기 위한 기존의 구조로는 단일 스캔경로와 다중 스캔 경로가 있다. 단일 스캔경로 구조는 시험 데이타의 전송 경로인 스캔 경로가 하나로 연결되므로 스캔 경로가 단락이나 개방으로 결함이 생기면 나머지 스캔 경로에올바른 시험 데이타를 입력할 수 없다. 다중 스캔 경로 구조는 다중 보드 시험 시 보드마다별도의 신호선이 추가된다 그러므로 기존의 두 구조는 다중 보드 시험에는 부적절하다. 제안된 ESP 구조를 단일 스캔 경로 구조와 비교하면, 스캔 경로 상에 결함이 발생하더라도 그 결함은 하나의 스캔 경로에만 한정되어 다른 스캔 경로의 시험 데이타에는 영향을 주지않는다. 뿐만 아니라, 비스트 (BIST: Built In Self Test)와 IEEE 1149.1 경계면 스캔 시험을 병렬로 수행함으로써 시험에 소요되는 시간을 단축한다. 본 논문에서는 제안한 ESP 구조와 기존 시험 구조의 성능을 비교하기 위해서 수치적 비교를 한다.

• 한국산학기술학회논문지
• /
• 제10권6호
• /
• pp.1191-1195
• /
• 2009

본 논문에서는 스캔 체인의 레이아웃 거리를 고려한 효율적인 Test Wrapper 설계 방식을 제안한다. SoC내의 스캔체인들을 태스트하기 위해서는 외부 TAM 라인(line)에 각 스캔체인들을 할당해야 한다. IP 내에 존재하는 스캔체인들은 정상모드에서는 타이밍 위반(Timing Violation)이 발생하지 않도록 레이아웃이 되지만, 테스트 모드에서는 TAM 라인(line)과 연결되는 스캔체인들 간에 부가적인 레이아웃 거리를 갖게 되므로 스캔체인에서 타이밍 위반이 발생될 수 있다. 본 논문에서는 타이밍 위반이 발생하지 않도록 체인간 레이아웃거리를 고려하여 스캔체인을 할당하는 새로운 test wrapper 설계 방식을 제안하였다.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 2008년도 제39회 하계학술대회
• /
• pp.1957-1958
• /
• 2008

The Logic Built In Self Test (LBIST) technique is substantially applied in chip design in most many semiconductor company in despite of unavoidable overhead like an increase in dimension and time delay occurred as it used. Currently common LBIST software uses the MISR (Multiple Input Shift Register) However, it has many considerations like defining the X-value (Unknown Value), length and number of Scan Chain, Scan Chain and so on for analysis of result occurred in the process. So, to solve these problems, common LBIST software provides the solution method automated. Nevertheless, these problems haven't been solved automatically by Tri-state Bus in logic circuit yet. This paper studies the simulator and algorithm that judges whether Tri-state Bus lines is the circuit which have X-value or One-hot Value after presuming the control signal of the lines which output X-value in the logic circuit to solve the most serious problems.

• 제어로봇시스템학회논문지
• /
• 제19권4호
• /
• pp.306-314
• /
• 2013

Automatic tracking in cluttered environment requires the initiation and maintenance of tracks, and track existence probability of true track is kept by Markov Chain Two model of target existence propagation. Unlike Markov Chain One model for target existence propagation, Markov Chain Two model is made up three hypotheses about target existence event which are that the target exist and is detectable, the target exists and is non-detectable through occlusion, and the target does not exist and is non-detectable according to non-existing target. In this paper we present multi-scan single target tracking algorithm based on the target existence, which call the Integrated Track Splitting algorithm with Markov Chain Two model in imaging sensor.

• JSTS:Journal of Semiconductor Technology and Science
• /
• 제14권1호
• /
• pp.124-130
• /
• 2014

In highly reliable and durable systems, failures due to aging might result in catastrophes. Aging monitoring techniques to prevent catastrophes by predicting such a failure are required. This paper presents a scan-based on-line aging monitoring scheme which monitors aging during normal operation and gives an alarm if aging is detected so that the system users take action before a failure occurs. We illustrate our modified scan chain architecture and aging monitoring control method. Experimental results show our simulation results to verify the functions of the proposed scheme.