• IE interfaces
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• v.16 no.3
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• pp.344-351
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• 2003

Critical dimension is one of the most important characteristics of up-to-date integrated circuit devices. Hence, critical dimension control in a semiconductor wafer fabrication process is inevitable in order to achieve optimum device yield as well as electrically specified functions. Currently, in complex semiconductor wafer fabrication processes, statistical methodologies such as Shewhart-type control charts become crucial tools for practitioners. Meanwhile, given a critical dimension sampling plan, the analysis of variance technique can be more effective to investigating critical dimension variation, especially for on-chip and on-wafer variation. In this paper, relating to a typical sampling plan, linear statistical models are presented for the analysis of critical dimension variation. A case study is illustrated regarding a semiconductor wafer fabrication process.

• International Journal of Reliability and Applications
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• v.17 no.1
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• pp.85-105
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• 2016

In this paper accelerated life testing is incorporated in quality control technique of acceptance sampling plan to induce early failures in high reliability products.Stress under accelerated condition can be applied in constant-stress, step-stress and progressive-stress or combination of such loadings. A ramp-stress results when stress is increased linearly (from zero) with time. In this paper optimum failure-censored ramp-stress accelerated life test sampling plan for log-logistic distribution has been formulated with cost considerations. The log-logistic distribution has been found appropriate for insulating materials. The optimal plans consist in finding optimum sample size, sample proportion allocated to each stress, and stress rate factor such that producer's and consumer's interests are safeguarded. Variance optimality criterion is used when expected cost per lot is not taken into consideration, and bilevel programming approach is used in cost optimization problems. The methods developed have been illustrated using some numerical examples, and sensitivity analyses carried out in the context of ramp-stress ALTSP based on variable SSP for proportion nonconforming.

• Journal of the Korean Statistical Society
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• v.23 no.2
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• pp.421-444
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• 1994

Reliability acceptance sampling is concerned with whether to accept or reject a collection of items based upon the information obtained from life testing. Although various reliability acceptance sampling plans have been developed, little is known about their relatvie performances. This paper compares reliability acceptance sampling plans under Type II censoring, Hybrid censoring, and Time-Truncated Type II censoring assuming that the lifetimes of items in a lot follow an exponential distribution. The three plans are compared in terms of the power, the expected number of failures, and the expected time required to reach a decision. Computational experiments are conducted and the results are tabulated to provide guidelines for selecting an appropriate plan for a given situation.

• Nuclear Engineering and Technology
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• v.54 no.1
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• pp.414-422
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• 2022

Presented in this paper is a methodology for combining a Bayesian statistical approach with Data Quality Objectives (a structured decision-making method) to provide increased levels of confidence in analytical data when approaching a waste boundary. Development of sampling and analysis plans for the characterisation of radioactive waste often use a simple, one pass statistical approach as underpinning for the sampling schedule. Using a Bayesian statistical approach introduces the concept of Prior information giving an adaptive sample strategy based on previous knowledge. This aligns more closely with the iterative approach demanded of the most commonly used structured decision-making tool in this area (Data Quality Objectives) and the potential to provide a more fully underpinned justification than the more traditional statistical approach. The approach described has been developed in a UK regulatory context but is translated to a waste stream from the Fukushima Daiichi Nuclear Power Station to demonstrate how the methodology can be applied in this context to support decision making regarding the ultimate disposal option for radioactive waste in a more global context.

• Communications of the Korean Mathematical Society
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• v.20 no.3
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• pp.603-610
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• 2005

A k-sized balanced sampling plan excluding contiguous units of order v and index denoted by $BSEC(v,\;k,\;{\lambda})$, is said to be bicyclic if it admits an automorphism consisting of two disjoint cycles of length ~. In this paper, we obtain a necessary and sufficient condition for the existence of bicyclic BSEC(v, 3, 2)s.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.20 no.41
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• pp.147-156
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• 1997

This Study deals with the problem of determining a minimum cost sampling inspection plan for destructive testing by attribute. The linear cost model(LCM) is constructed under the assumption that unit cost, destructive testing cost, producer's risk cost, consumer's risk cost are given. For the solution from the LCM, we assumed the uniform distribution as a prior distribution.

• Journal of Korean Institute of Industrial Engineers
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• v.8 no.2
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• pp.23-31
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• 1982

A method of selecting parameters of Dodge-type continuous camping plans is proposed ; a sampling plan is designed so that its AFI curve passes through two designated points. AOQL contour lines are also drawn which can be used as a reference in choosing these points.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.14 no.24
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• pp.187-192
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• 1991

We consider a filling process problem on a production line. Up to present this problem have examined by 100% inspection. Thus a target value is determined which takes into account the regular selling prices, the reprocess cost, the excess quality cost and the process variability and so on. However, in this paper we propose a solution under specified sampling plan when the inspection is nondestructive.

• Journal of Korean Society for Quality Management
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• v.22 no.3
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• pp.152-160
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• 1994

This paper concerns an expert system for reliability management. The system includes data base, life data analysis, life testing sampling plans and system operation. PROLOG is used as a language with dBASE III+ for the data base management system and C for calculations and graphics. This system analyzing the data and selecting an appropriate sampling plan can be implemented on an IBM PC 386 or a higher level machine.

• Journal of Korean Institute of Industrial Engineers
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• v.33 no.1
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• pp.76-85
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• 2007

A reliability acceptance sampling plan (RASP) consists of a set of life test procedures and rules for eitheraccepting or rejecting a collection of items based on the sampled lifetime data. Most of the existing RASPs areconcerned with the case where test items are available at the same time. However, as in the early stage ofproduct development, it may be difficult to secure test items at the same time. In such a case, it is inevitable toconduct a life test using sequentially supplied samples.In this paper, it is assumed that test items are sequentially supplied, the lifetimes of test items follow anexponential disthbution, failures are monitored continuously, arrival times of test items are known, and thenumber of test items at each arrival time is given. Under these assumptions, RASPs are developed by deter-mining the test completion time and the critical value for the maximum likelihood estimator of the mean lifetimesuch that the producer and consumer risks are satisfied. Then, the developed plans are compared to thetraditional Type-I censored RASPs in terms of the test completion time. Computational results indicate that thetest completion time of the developed RASP is shorter than that of the traditional Type-I censored plan in mostcases considered. It is also found that the superiority of the developed RASP becomes more prominent as theinter-arrival times of test items increase and/or the total number of test items gets larger.