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Reliability Acceptance Sampling Plans with Sequentially Supplied Samples  

Koo, Jung-Seo (Department of Industrial Engineering, Korea Advanced Institute of Science and Technology)
Kim, Min (Department of Industrial Engineering, Korea Advanced Institute of Science and Technology)
Yum, Bong-Jin (Department of Industrial Engineering, Korea Advanced Institute of Science and Technology)
Publication Information
Journal of Korean Institute of Industrial Engineers / v.33, no.1, 2007 , pp. 76-85 More about this Journal
Abstract
A reliability acceptance sampling plan (RASP) consists of a set of life test procedures and rules for eitheraccepting or rejecting a collection of items based on the sampled lifetime data. Most of the existing RASPs areconcerned with the case where test items are available at the same time. However, as in the early stage ofproduct development, it may be difficult to secure test items at the same time. In such a case, it is inevitable toconduct a life test using sequentially supplied samples.In this paper, it is assumed that test items are sequentially supplied, the lifetimes of test items follow anexponential disthbution, failures are monitored continuously, arrival times of test items are known, and thenumber of test items at each arrival time is given. Under these assumptions, RASPs are developed by deter-mining the test completion time and the critical value for the maximum likelihood estimator of the mean lifetimesuch that the producer and consumer risks are satisfied. Then, the developed plans are compared to thetraditional Type-I censored RASPs in terms of the test completion time. Computational results indicate that thetest completion time of the developed RASP is shorter than that of the traditional Type-I censored plan in mostcases considered. It is also found that the superiority of the developed RASP becomes more prominent as theinter-arrival times of test items increase and/or the total number of test items gets larger.
Keywords
Reliability Acceptance Sampling Plan; Sequential Supply of Samples; Exponential Lifetime;
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