• Journal of the Optical Society of Korea
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• v.17 no.6
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• pp.548-558
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• 2013

In this work, laser induced breakdown spectroscopy (LIBS) is used to investigate soil samples collected from different desert areas of Riyadh city in Saudi Arabia. Both qualitative analysis and plasma parameters are studied via the observed LIBS spectra. These experiments have been done using a Spectrolaser-7000 system with 50 mJ fundamental wavelength of Nd:YAG laser and detection delay time of 1 microsecond. Many spectral lines are highly resolved for many elements like Al, Fe, Mg, Si, Mn, Na, Ca and K. The electron temperatures Te and electron densities Ne, for the constituent of generated LIBS plasma, are determined for all the collected samples. It is found that both Te and Ne vary from one desert area to other. This variation is due to the change of the elemental concentration in different desert areas that affects the sample's matrices. Time dependent measurements have also been performed on the soil samples. While the signal-to-base ratio (SBR) reached its optimal value at 1 microsecond, the plasma parameters Ne and Te reach values of $4{\times}10^{17}cm^{-3}$ and 9235 K, respectively, at 2.5 microsecond. The later indicate that the plasma cooling processes are slow in comparison to the previously observed results for metallic samples. The observed results show also that in the future it is possible to enhance the exploitation of LIBS in the remote on-line environmental monitoring application, by following up only the values of Ne and Te for one element of the soil desert sample using an optical fiber probe.

• Proceedings of the KIEE Conference
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• 1999.07d
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• pp.1818-1820
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• 1999

This paper presents direct ${\mu}c$-Si:H thin film growth on the glass substrates using RPCVD system (remote plasma chemical vapor deposition) in low temperature. Hydrogenated micro-crystalline silicon deposited by RPCVD system in low temperature is very useful material for photovoltaic devices, sensor applications, and TFTs (thin film transistors). Varying the deposition conditions such as substrate temperature, gas flow rate, reactive gas ratio $(SiH_4/H_2)$, total chamber pressure, and rf power, we deposited ${\mu}c$-Si:H thin films on the glass substrates (Corning glass 1737). And then we measured the structural and electrical properties of the films.

• Journal of the Korean Ceramic Society
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• v.47 no.3
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• pp.262-267
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• 2010

a-SiC has been thought as an ideal candidate for conventional silicon at many applications. However, the uniformity problem of deposition has been a obstacle for conventional use of a-SiC:H films. a-SiC:H films were deposited on (100) silicon wafer by RPECVD system in various temperature. HMDS and $H_2$ gas were used as a precursor and a carrier gas, respectively. The flow rate of HMDS source and $C_2H_2$ dilution gas was fixed in order to study the carbon effect on the film stoichiometric and bonding properties. The plasma power varied from 200 to 400W. We used three types of source delivery line to control the uniformity and film properties of deposited film. We showed that the change of source delivery line has effect on the film uniformity of deposited film and this change of line did not affect on film properties. Also, the change of deposition conditions has effect on the film uniformity.

• Journal of Satellite, Information and Communications
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• v.12 no.1
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• pp.114-119
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• 2017

In this paper we present the search on HC-06 Bluetooth based driver module for emergency LED Multi-Directional Indicator. Nowadays, a growing trends in which electronic displays such as LED, LCD or plasma monitors are being installed in public places like bars, stores, entertainment areas, restaurants, lobbies, etc. In this paper, the study is curried out on efficiency of HC-06 Bluetooth module based controller driver that relates generally to the field of emergency signage management systems for displaying various indicator contents remotely on electronic displays in public and privates venues. It allows user smart devices interaction remotely with digital signage by providing content for displaying on at least one display in a venue. Depending on the emergency case, HC-06 Bluetooth based driver module proves the high efficiency as well as good performance of processing and communicating remotely the indicator based message that is displayed from a venue management control system by using smart devices. The system combines smart device that linked to HC-06 Bluetooth module with ATmega168/328 embedded micro controller which result by switching the displayer containing the digital signage indicator based message.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.08a
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• pp.116-116
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• 2010

진공 chamber에서 방전된 plasma 내부를 외부 view port를 통하여 확인하는 것은 극히 제한적이며 leak의 확률을 높이고 plasma의 균일한 방전을 방해한다. 이를 개선하기 위하여 내장형 무선 카메라를 chamber 내부에 위치한 후 고진공 영역에서 촬영을 시도하였으나 일반적인 CCD 카메라로는 촬영할 수 없다. 고진공 영역에서 카메라 내부온도의 급격한 상승이 원인으로 밝혀졌고 적정온도인 $45^{\circ}C$를 초과하여 최대 $96^{\circ}C$까지 4 min 이내에 상승함을 IR camera로 확인할 수 있었으며 이 때 카메라가 작동하지 않았다. 또한 카메라를 고진공 영역에서 촬영 및 녹화하기 위해서는 $46^{\circ}C$의 온도를 낮추어야 함을 진공해제 이후 내부온도가 $50^{\circ}C$로 감소하면서 내장형 무선 카메라가 다시 작동함으로 인해 알 수 있었다. 본 연구에서는 이를 해결하기 위하여 내장형 무선 카메라에 AM 변조 방식의 311 MHz RF remote controller를 장착하여 외부에서 선택적으로 ON/OFF 할 수 있도록 개조하였고 10 L chamber에서 150 L/sec TMP를 이용하여 10-6 Torr의 압력에서 성공적으로 녹화 및 촬영하였다. 또한 내장형 무선 카메라 내부의 반도체 회로 규격 및 발열량과 heat sink의 규격 (열전도도, 복사율)을 추가로 조사하였다. 분자유동 영역에서 열전달은 복사에 의한 영향이 대부분이므로 내장형 무선 카메라 내부 온도를 감소시켜 카메라의 작동 시간을 연장하기 위하여 내부 회로에 emissivity가 높고 전기전도도가 낮아 회로에 영향이 없는 박막을 회로에 증착시키는 추후의 연구가 필요하다.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.08a
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• pp.82.1-82.1
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• 2013

SPOES(Self Plasma Optical Emission Spectroscopy)는 반도체 및 LCD 제조 장비의 Foreline에 장착되는 센서로써, Foreline에 흐르는 Gas를 이온화시켜 이때 발생되는 빛을 분광시켜 공정의 상태 및 장비의 상태등을 종합적으로 점검할 수 있는 센서입니다. SPOES의 최대 장점은 공정 장비에 영향을 주기 않으면서 공정을 진단할 수 있고, 장비의 메인챔버에서 플라즈마 방전이 발생하지 않는 RPS (Remote Plasma System)등에 적용이 가능하며, 설치 및 분해이동과 운용이 용이한 장점이 있습니다. 하지만, SPOES는 오염성 가스 및 물질에 의한 오염에 취약한 단점이 있습니다. 예컨대, 플라즈마 방전에 의한 부산물들이 SPOES의 내부에 있는 윈도우의 렌즈에 부착되어 감도를 저하시켜, SEOES의 수명을 단축시킵니다. 또한 오염 물질이 SPOES 내부의 방전 CHAMBER에 증착되어 플라즈마 방전 효울을 저하시켜 센서의 효율을 저하시킵니다. 예를들면, 장비의 공정 챔버에서 배출되는 탄소와 같은 비금속성 오염물질과 텅스텐과 같은 금속성 오염물질이 SPOES의 방전 CHAMBER 내벽과 윈도우에 증착되어 오염을 유발합니다. 오염이 진행된 SPOES는 방전 CHAMBER의 오염으로 CHAMBER의 유전율을 변화시켜, 플라즈마 방전 효율의 저하를 가져오고, 윈도우의 오염은 빛의 투과율을 저하시켜, OES 신호의 감도를 저하시켜, SPOES 감도를 저하시키는 요인으로 작용합니다. 이러한 문제를 해결하기위한 방법으로 능동형 오염 방지 기술을 채용 하였습니다. 능동형 오염 방지 기법은 SPEOS의 방전 챔버에서 플라즈마 방전시 발생하는 진공의 밀도차를 이용하는 기술과 방전 챔버와 연결된 BYPASS LINE에 의해 발생되는 오염물질 자체 배기 시스템, 그리고 고밀도 플라즈마 방전을 일으키는 멀티 RF 기술 및 고밀도 방전을 일으키는 챔버 구조로 구성 되어 있습니다. 능동형 오염 방지 기법으로 반도체 공정에서 6개월 이상의 LIFETIME을 확보 할 수 있고, 고밀도 플라즈마로 인한 UV~NIR 영역의 감도 향상등을 확보 할 수 있습니다.

• Proceedings of the KIPE Conference
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• 2016.07a
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• pp.221-222
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• 2016

본 논문에서는 급변하는 특징을 갖는 부하를 제어하기 위한 병렬부하 공진컨버터의 공진 네트워크를 설계한다. RPG(Remote Plasma Generator)는 플라스마를 생성하기 위한 장치로써 플라스마 발생 전, 후의 부하 조건이 급격하게 달라지는 특징을 갖는다. 이때 플라스마를 발생시키기 위해서는 고전압이 필요하며, 플라스마를 유지하기 위해서는 높은 스위칭 주파수와 일정 크기의 정현파 전류가 필요하다. 이러한 특성을 고려하여 공진 네트워크를 설계하고, 시뮬레이션을 통해 과정의 타당성을 입증한다.

• Journal of the Korean Vacuum Society
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• v.7 no.s1
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• pp.85-99
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• 1998

A ultrahigh vacuum chemical vapor deposition(UHVCVD)/metalorganic chemical vapor deposition(MOMBE) system equipped with a radio frequency(RF)-plasma cell was employed to grow GaN layer on the sapphire at a low temperature. The x-ray photoelectron spectroscopy analysis of nitrogen composition on the nitridated sapphite surface indicated that a nitridation process is mostly affected by the RF power at low temperature. Atomic force microscope images of nitridated surface the protrusion density on the nitridated sapphire is dependent on the nitridation temperature. The crystallinity of GaN grown at $450^{\circ}C$ was found to be much improved when the sapphire was nitridated at low temperature prior to the GaN layer growth. Moreover, a strong photoluminescence spectrum of GaN grown by UHVCVD/MOMBE with a rf-nitrogen plasma was observed for the first time at room temperature.

• Journal of Welding and Joining
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• v.28 no.5
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• pp.75-79
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• 2010

The Remote welding system(RWS) using $CO_2$ laser equipment has focusable distance of laser beam longer than 800 mm from workpiece and can deflect the laser beam by the scanner mirrors very rapidly. In the case of normal welding system based on robot, there is a limit to move the shortest path in short time and this causes interference between robot and workpiece. On the other hand, RWS is the optimized equipment to get big merits with advanced sequence of welding and short cycle time. However, there is still a pending task such as the control of plasma in the welding process of thick sheets therefore, it requires high power laser beam because of the absence of assist gas equipment in itself. In this study, high-tensile steel plates were overlap welded with $CO_2$ RWS for the production of car body and the influence of penetration depth according to the existence of assist gas was analyzed. Excellent tensile strength with enough width of molten zone independent to penetration depth was observed under welding condition with 3.6 kW laser power and 2.8 m/min welding speed without assist gas. Finally, the proto-type automotive parts were produced by applying the deduced optimal welding condition.

• Analytical Science and Technology
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• v.19 no.6
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• pp.535-543
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• 2006

Being used widely in semiconductor and display manufacturing, $NF_3$ is internationally considered as one of the regulated compounds in emission. Numerous companies have been continuously trying to reduce the emissions of $NF_3$ to comply with the global environmental regulation. This work is made to report the destruction and removal efficiency (DRE) of electrically heated scrubbers and the use rate in process chambers installed in three main LCD manufacturing companies in Korea. As the measurement techniques for $NF_3$ emission, mass flow controlled helium gas was continuously supplied into the equipment by which scrubber efficiency is being measured. The partial pressures of $NF_3$ and helium were accurately measured for each sample using a mass spectrometer, as it is emitted from inlet and outlet of the scrubber system. The results show that the DRE value for electrically heated scrubbers installed before 2004 is less than 52 %, while that for the new scrubbers modified based on measurement by scrubber manufacturer has been sigificentely improved upto more than 95 %. In additon, we have confirmed the efficiency depends on such variables as the inlet gas flow rate, water content, heater temperature, and preventative management period. The use rates of $NF_3$ in process chambers were also affected by the process type. The use rate of radio frequency source chambers, built in the $1^{st}$ and $2^{nd}$ generation process lines, was determined to be less than 75 %. In addition, that of remote plasma source chambers for the $3^{rd}$ generation was measured to be aboove 95 %. Therefore, the combined application of improved scrubber and the RPSC process chamber to the semiconductor and display process can reduce $NF_3$ emmision by 99.95 %. It is optimistic that the mission for the reduction of greenhouse gas emission can be realized in these LCD manufacturing companies in Korea.