• 제목/요약/키워드: Relative dielectric constant

검색결과 313건 처리시간 0.032초

70/30 mol% P(VDF-TrFE) 공중합체 박막의 주팍수에 따른 유전특성 (Dielectric properties of 70/30 mol% P(VDF-TrFE) copolymer thin films with freqeuncy)

  • 윤종현;정무영;박수홍;임응춘;이상희;박상현;이덕출
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2001년도 하계학술대회 논문집
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    • pp.470-473
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    • 2001
  • In this study, 70/30 mol% P(VDF-TrFE) copolymer thin films were prepared by physical vapor deposition, and dielectric properties with frequency were investigated. From results of TA(Thermal Analysis), the Curie transition temperature and melting temperature were observed at 118.8$^{\circ}C$ and 146$^{\circ}C$, respectively. Therefore, while thin films were prepared, the substrate temperature was varied from 30$^{\circ}C$ to 90$^{\circ}C$. The dielectric constant decreased with increasing frequency. At measuring frequency of 1kHz, the relative dielectric constant increased from 3.643 to 23.998 with increasing substrate temperature from 30$^{\circ}C$ to 90$^{\circ}C$. As a result of dielectric loss factor, ${\alpha}$-relaxation and ${\beta}$-relaxation were observed near at 100Hz and 1MHz, respectively. And the magnitude of ${\alpha}$-relaxation decreased and that of ${\beta}$-relaxation increased with increasing substrate temperature.

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스크린 프린팅법으로 제작한 BSCT 후막의 구조적 특성과 유전적 특성 (Structural and dielectric properties of the BSCT thick films fabricated by the screen printing method)

  • 노현지;이성갑;이창공;남성필;이영희
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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    • pp.167-167
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    • 2008
  • The barium strontium calcium titanate powders were prepared by sol-gel method. Ferroelectric $(Ba_{0.54}Sr_{0.36}Ca_{0.1})TiO_3$(BSCT) thick films were fabricated by the screen-printing method on alumina substrate. And we investigated the structural and dielectric properties of BSCT thick films with the variation of sintering temperature. As a result of thermal analysis, BSCT polycrystalline perovskite phase was formed at around $660^{\circ}C$. The results of X-ray diffraction analysis were showed a cubic perovskite structure without presence of the second phase in all BSCT thick films. The average grain size and the thickness of the specimen sintered at $1450^{\circ}C$ were about 1.6 mm and 45 mm, respectively. The relative dielectric constant increased and the dielectric loss decreased with increasing the sintering temperature, the values of the BSCT thick films sintered at $1450^{\circ}C$ were 5641 and 0.4% at 1kHz, respectively.

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졸겔법으로 제조된 Tb-doped PZT 박막의 강유전 특성 (Ferroelectric Properties of Tb-doped PZT Thin films Prepared by Sol-gel Process)

  • 손영훈;김경태;김창일
    • 한국전기전자재료학회논문지
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    • 제17권9호
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    • pp.947-952
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    • 2004
  • Tb-doped lead zirconate titanate(Pb(Zr$\_$0.6/,Ti$\_$0.4/)O$_3$; PZT) thin films on Pt(111)/Ti/SiO$_2$/Si(100) substrates were fabricated by the sol-gel method. The effect on the structural and electrical properties of films measured according to Tb content. The dielectric and ferroelectric properties of Tb-doped PZT thin films were altered significantly by Tb-doping. The PZT thin film with higher dielectric constant and improved leakage current characteristic was obtained by adding 0.3 mol% Tb. The relative dielectric constant and the dielectric loss of the 0.3 mol% Tb-doped PZT thin film were 1611 and 0.024, respectively. Typical value of the swichable remanent poaraization(2Pr) and the coercive filed of the PZT film capacitor for 0.3 mol% Tb-doped were 61.4 ${\mu}$C/cm$^2$ and 61.9 kV/cm, respectively. Tb-doped PZT thin films showed improved fatigue characteristics comparing to the undoped PZT thin film.

기판온도에 따른 (Ba,Sr)$TiO_3$ 박막의 유전특성 (Dielectric Properties of (Ba,Sr)$TiO_3$ Thin Films with Substrate Temperature)

  • 이상철;정장호;배선기;이영희
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1999년도 하계학술대회 논문집 D
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    • pp.1879-1881
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    • 1999
  • (Ba,Sr)$TiO_3$[BST] thin films were fabricated on Pt/Ti/$SiO_2$/Si substrate by RF sputtering. We investigated the effects of substrate temperature on the structural and dielectric properties of BST thin films. Increasing the substrate temperature, barium multi titanate phases were decreased, and BST (100), (200) peaks were increased. The relative dielectric constant and dielectric loss of the BST thin films at the substrate temperature of $500^{\circ}C$ were 300 and 0.018, respectively at l[kHz]. In all films, the dielectric constants decreased. Dielectric losses increased as increasing the frequency. The switching voltage was 5V of the BST thin films at the substrate temperature of $500^{\circ}C$.

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저온 플라즈마 발생과 응용 (Generation of Low Temperature Plasma and Its Application)

  • 이봉주
    • 대한전기학회논문지:전기물성ㆍ응용부문C
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    • 제51권9호
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    • pp.413-416
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    • 2002
  • It was reported that low temperature plasma developed by our group was apparently homogeneous and stable at atmospheric pressure, and was generated if the alumina was used as a dielectric insulating material and Ar gas as a plasma gas. This is a structure in which the dielectric materials are covered and arranged in parallel in the one side of electrode. In this experiment, we discovered that dielectric material was important to generate normal electric discharge. To examine the effect of dielectric material on the electric discharge characteristic, the voltage and current of the plasma was measured and the electrical effect of dielectric material was examined. Also, it was applied to an etching of tin oxide films.

기지국용 ZST세라믹스의 소결조건에 따른 고주파 유전 특성 (Microwave Dielectric Properties of ZST Ceramics for Mobile Telecommunication System)

  • 서정철;이희영
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2000년도 하계학술대회 논문집
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    • pp.636-639
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    • 2000
  • Effects of sintering temperature and time on relative permittivity $\varepsilon$$\_$r/, unloaded quality factor Q$.$f and temperature coefficient of resonant frequency $\tau$$\_$f/ of dielectric resonator materials produced from commercial ZST powder were investigated in some detail. Q$.$f values, as determined from cavity perturbation method at 1.6 GHz, gradually increased with sintering temperature reaching the maximum at 1420$^{\circ}C$. However, bulk density and relative permittivity values, which increased with temperature, started to decrease above 1380$^{\circ}C$. In addition, Q$.$f values slightly increased with sintering time at the sintering temperature of 1300$^{\circ}C$∼1380$^{\circ}C$, while bulk density and relative permittivity values were approximately constant. It was also found that $\tau$$\_$f/ values were not affected by sintering temperature and time within the experimental conditions used.

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$Dy_{2}O_{3}$가 첨가된 (Ba,Sr,Ca)$TiO_3$ 후막의 구조 및 유전 특성 (Structural and Dielectric Properties of (Ba,Sr,Ca)$TiO_3$ Thick films Doped with $Dy_{2}O_{3}$)

  • 윤상은;이성갑;박상만;노현지;이영희;배선기
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2007년도 제38회 하계학술대회
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    • pp.1275-1276
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    • 2007
  • For fabrication of $BaTiO_3$ system Ferroelectric thick films, (Ba,Sr,Ca)$TiO_3$ (BSCT) powders, prepared by using the alkoxide-based sol-gel method, were doped $MnCO_3$ as acceptor and $Dy_{2}O_{3}$ as donor. $MnCO_3$ and $Dy_{2}O_{3}$-doped (Ba,Sr,Ca)$TiO_3$ thick films were fabricated by screen printing techniques on high purity alumina substrates. The structure and dielectric properties were investigated with variation of $Dy_{2}O_{3}$ amount. As a result of the differential thermal analysis(DTA), exothermic peak was observed at around $670^{\circ}C$ due to the formation of the polycrystalline perovskite phase. All the BSCT thick films, sintered at $1420^{\circ}C$ for 2h, showed the typical XRD patterns of perovskite polycrystalline structure and no pyrochlore phase was observed. The average grain size and thickness of specimens no doped with $Dy_{2}O_{3}$ was 1.32mm, 52mm, respectively. The relative dielectric constant decreased and dielectric loss increased with increasing amount of $Dy_{2}O_{3}$ dopant, the values of the BSCT thick films no doped with $Dy_{2}O_{3}$ were 4043 and 0.4% at 1 kHz, respectively. The relative dielectric constant gradually decreased in the measured frequency range from 0.1 to 100 kHz

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도체와 유전체가 복합된 쐐기에 의한 E-편파된 전자파의 회절, II:확장된 회절계수 (E-polarized electromagnetic diffraction by a composite wedge, II:Extended diffraction coefficients)

  • 김세윤;김상욱
    • 전자공학회논문지D
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    • 제34D권7호
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    • pp.1-7
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    • 1997
  • The physical optical solution to the E-polarized diffraction by a composite wedge consisting of perfect conductor and lossless dielectric cannot sayisfy not only the boundary conditions at the wedge interfaces but also the edge condition at the wedge tip. Its diffraction coefficients are extended outside the composite wedge to become the exact solution to the perfectly conducting wedge as its relative dielectric constant increases to infinite or decreases to 1. It is assured that the extended diffraction coefficients approach zero in the arificially complementary region of the composite wedge.

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A Study on Dielectric Properties of Printed Circuit Board(PCB) Materials in the Frequency Range of 100MHz to 1Ghz

  • Kim, Jong-Heon;C. Venkataseshaiah;Lee, Joon-Ung
    • Journal of Electrical Engineering and information Science
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    • 제2권5호
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    • pp.40-44
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    • 1997
  • This paper presents the results of studies made for measuring the relative complex permittivity of PCB sheet material in he frequency a range of 100MHz∼1GHz using vector network analyzer. A measurement cell was developed for this purpose using broad-band impedance method and the dielectric constant and loss tangent of two PCBV sheet materials, glass-epoxy and teflon, were measured. The effect of copper cladding was studied.

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유전체 내의 전계를 급수전개로 표시한 모멘트 방법을 적용한 파수영역의 역산란 방법 (A Spectral Inverse Scattering Technique with Series-Expanded Field in Dirlectric Object)

  • 최현철
    • 한국광학회:학술대회논문집
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    • 한국광학회 1989년도 제4회 파동 및 레이저 학술발표회 4th Conference on Waves and lasers 논문집 - 한국광학회
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    • pp.147-151
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    • 1989
  • A spectral inversion scheme, based on the moment-method procudure with series-expanded field within each cell by dividing the dielectric object into a small number os rectangular cells with large area, is developed to regularize the ill-posedness inherent in inverse scattering problems. One of the interesting features on the presented scheme is that the relative dielectric constant may be obtained by averaging over each cell. This averaging is expected to play an important role in regularizing the high-frequency effect due to noise.

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