Dielectric Properties of (Ba,Sr)$TiO_3$ Thin Films with Substrate Temperature

기판온도에 따른 (Ba,Sr)$TiO_3$ 박막의 유전특성

  • 이상철 (광운대학교 전자재료공학과) ;
  • 정장호 (광운대학교 전자재료공학과) ;
  • 배선기 (인천대학교 전기과) ;
  • 이영희 (광운대학교 전자재료공학과)
  • Published : 1999.07.19

Abstract

(Ba,Sr)$TiO_3$[BST] thin films were fabricated on Pt/Ti/$SiO_2$/Si substrate by RF sputtering. We investigated the effects of substrate temperature on the structural and dielectric properties of BST thin films. Increasing the substrate temperature, barium multi titanate phases were decreased, and BST (100), (200) peaks were increased. The relative dielectric constant and dielectric loss of the BST thin films at the substrate temperature of $500^{\circ}C$ were 300 and 0.018, respectively at l[kHz]. In all films, the dielectric constants decreased. Dielectric losses increased as increasing the frequency. The switching voltage was 5V of the BST thin films at the substrate temperature of $500^{\circ}C$.

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