• 제목/요약/키워드: Reflection High-Energy Electron Diffraction

검색결과 79건 처리시간 0.045초

고에너지 회절무늬 및 반사전자현미경 관찰을 위한 시편준비 (The specimen preparation for the high energy electron diffraction and reflection electron microscopy observation)

  • 김유택
    • 한국결정성장학회지
    • /
    • 제6권4호
    • /
    • pp.543-551
    • /
    • 1996
  • 단결정 표면 및 에피 증착증 표면에 대한 연구가 많아지면서 고에너지전자회절 및 반사전자현미겨의 이용도 늘고 있다. 국내에서는 아직 보편화 되지 않은 이들 두 기술을 위한 시편분비 과정을 요약하였고, 고에너지전자회절 연구시 매우 유용하게 쓰이는 연속 고에너지전자회절 패턴 지도 작성법에 대해 설명하고 그 예를 제시하였다.

  • PDF

Reflection High Energy Electron Diffraction이 결합된 Laser Molecular Beam Epitaxy System에서 $BaTiO_3/SrTiO_3$ 산화물 인공격자의 Layer-by-Layer 성장 (Atomic Layer-by-Layer Growth of $BaTiO_3/SrTiO_3$ Oxide Artificial Lattice in Laser Molecular Beam Epitaxy System Combined Reflection High Energy Electron Diffraction)

  • 이창훈;김이준;전성진;김주호;최택집;이재찬
    • 한국세라믹학회:학술대회논문집
    • /
    • 한국세라믹학회 2003년도 추계총회 및 연구발표회 초록집
    • /
    • pp.179.2-179
    • /
    • 2003
  • PDF

RHEED에 의한 GaN, InN 핵생성층의 열처리 효과 분석 (Characterization of GaN and InN Nucleation Layers by Reflection High Energy Electron Diffraction)

  • 나현석
    • 열처리공학회지
    • /
    • 제29권3호
    • /
    • pp.124-131
    • /
    • 2016
  • GaN and InN epilayers with nucleation layer (LT-buffer) were grown on (0001) sapphire substrates by radio-frequency plasma-assisted molecular beam epitaxy (RF-MBE). As-grown and annealed GaN and InN nucleation layers grown at various growth condition were observed by reflection high-energy electron diffraction (RHEED). When temperature of effusion cell for III source was very low, diffraction pattern with cubic symmetry was observed and zincblende nucleation layer was flattened easily by annealing. As cell temperature increased, LT-GaN and LT-InN showed typical diffraction pattern from wurtzite structure, and FWHM of (10-12) plane decreased remarkably which means much improved crystalline quality. Diffraction pattern was changed to be from streaky to spotty when plasma power was raised from 160 to 220 W because higher plasma power makes more nitrogen adatoms on the surface and suppressed surface mobility of III species. Therefore, though wurtzite nucleation layer was a little hard to be flattened compared to zincblende, higher cell temperature led to easier movement of III surface adatoms and resulted in better crystalline quality of GaN and InN epilayers.

RAMBE를 사용하여 Si 기판 위에 성장된 AIN 박막의 결정성 분석 (Microstructural ananalysis of AlN thin films on Si substrate grown by plasma assisted molecular beam epitaxy)

  • 홍성의;한기평;백문철;조경익;윤순길
    • 한국진공학회지
    • /
    • 제10권1호
    • /
    • pp.22-26
    • /
    • 2001
  • Plasma assisted molecular beam epitaxy(PAMBE)를 사용하여 Si 기판위에 성장시킨 AlN 박막에 대하여 성장온도 및 기판의 방향성에 따른 박막의 결정성 변화를 분석하였다. Reflection high energy electron diffraction(RHEED) 패턴을 이용하여 성장 중의 결정성을 관찰하였고, 성장 후에는 X-ray diffraction(XRD), double crystal X-ray diffraction(DCXD), transmission electron microscopy/diffraction(TEM/TED)분석을 하였다. $850^{\circ}C$이상의 온도에서 Si(100)위에 성장된 AlN박막은 육방정계의 c축 방향으로 우선 배향되어 있음을 확인하였으며 Si(111)위에 성장된 AlN박막의 경우 AlN(0001)/Si(111), AlN(1100)/Si(110), AlN(1120)/Si(112)의 결정방위를 가지고 성장하였음을 확인하였다. 또한 Si(111) 기판 위에서는 전위와 적층결함 등 많은 결정결함에 의해 DCD패턴의 반치폭이 2$\theta$=$36.2^{\circ}$에서 약 3000arcsec에 이르는 등 결정성은 좋지 않았으나 AlN박막이 단결정으로 성장된 것으로 나타났다.

  • PDF

Atomic Structure of TiO Epitaxial Layers Deposited on the MgO(100) Surface

  • Hwang, Yeon
    • 한국세라믹학회지
    • /
    • 제39권5호
    • /
    • pp.433-437
    • /
    • 2002
  • Impact-collision ion scattering spectroscopy was applied to study the geometrical structure of epitaxially grown TiO layers on the MgO(100) surface. Hetero-epitaxial TiO layer was formed by thermal evaporation of titanium onto the MgO(100) surface followed by the exposure to oxygen at $400{\circ}$. The well-ordered TiO structure was confirmed by the impact-collision ion scattering spectroscopy and reflection high energy electron diffraction patterns. It is revealed that the Ti and O atoms are located on the on-top site of the MgO(100) surface and the TiO overlayers are composed of little three dimensional islands.

Structure Analysis of $BaTiO_3$ Film on the MgO(001) Surface by Time-Of-Flight Impact-Collision Ion Scattering Spectroscopy

  • Yeon Hwang;Lee, Tae-Kun;Ryutaro Souda
    • 한국결정학회:학술대회논문집
    • /
    • 한국결정학회 2002년도 정기총회 및 추계학술연구발표회
    • /
    • pp.17-17
    • /
    • 2002
  • Time-of-flight impact collision ion scattering spectroscopy (TOF-ICISS) was applied to study the geometrical structure of the epitaxially grown BaTiO₃ layers on the MgO(100) surface. Hetero-epitaxial BaTiO₃ layers can be deposited by the following steps: first thermal evaporation of titanium onto the MgO(100) surface in the atmosphere of oxygen at 400℃, secondly thermal evaporation of barium in the same manner, and finally annealing at 800℃. Well ordered perovskite BaTiO₃ was confirmed from the ICISS spectra and reflection high electron energy diffraction (RHEED) patterns. It was also revealed that BaTiO₃ had cubic structure with the same lattice parameter of bulk phase.

  • PDF

As과 Ga 빔 조사에 의해 세척된 Si(100) 기판 위에 GaAs 에피층 성장과 RHEED 패턴 (GaAs Epilayer Growth on Si(100) Substrates Cleaned by As/Ga Beam and Its RHEED Patterns)

  • 임광국;김민수;임재영
    • 한국표면공학회지
    • /
    • 제43권4호
    • /
    • pp.170-175
    • /
    • 2010
  • The GaAs epitaxial layers were grown on Si(100) substrates by molecular beam epitaxy(MBE) using the two-step method. The Si(100) substrates were cleaned with different surface cleaning method of vacuum heating, As-beam, and Ga-beam at the substrate temperature of $800^{\circ}C$. Growth temperature and thickness of the GaAs epitaxial layer were $800^{\circ}C$ and 1 ${\mu}m$, respectively. The surface structure and epitaxial growth were observed by reflection high-energy electron diffraction(RHEED) and scanning electron microscope(SEM). Just surface structure of the Si(100) substrate cleaned by Ga-beam at $800^{\circ}C$ shows double domain ($2{\times}1$). RHEED patterns of the GaAs epitaxial layers grown on Si(100) substrates with cleaning method of vacuum heating, As-beam, and Ga-beam show spot-like, ($2{\times}4$) with spot, and clear ($2{\times}4$). From SEM, it is found that the GaAs epitaxial layers grown on Si(100) substrates with Ga-beam cleaning has a high quality.

산소 플라즈마에서의 분자살 적층성장에 의한 $CeO_2$ 박막의 성장과 구조 (Growth and structure of $CeO_2$ films by oxygen-plasma-assisted molecular beam epitaxy)

  • 김용주
    • 한국진공학회지
    • /
    • 제9권1호
    • /
    • pp.16-23
    • /
    • 2000
  • The epitaxial growth of $CeO_2$ films has been investigated on three different substrates-Si(111), $SrTiO_3$(001), and MgO(001)-over wide range of growth parameters using oxygen-plasma-assisted molecular beam epitaxy. Pure-phase, single-crystalline epitaxial films of $CeO_2$ (001) have been grown only on $SrTiO_3$(001). We discuss the growth conditions in conjunction with the choice of substrates required to synthe-size this oxide, as well as the associated characterization by menas of x-ray diffraction, reflection high-energy electron diffraction, low-energy electron diffraction, and x-ray photoelectron spectroscopy and diffraction. Successful growth of single crystalline $CeO_2$ depends critically on the choice of substrate and is rather insensitive to the growth conditions studied in this investigation. $CeO_2$(001) films on $SrTiO_3$exhibit the sturcture of bulk $CeO_2$ without surface reconstructions. Ti outdiffusion is observed on the films grown temperatures above $650^{\circ}C$.

  • PDF

원자층 제어 PLD를 이용한 산화물 자성 박막 연구의 동향 (Research Trend of Oxide Magnetic Films with Atomically Controlled Pulsed Laser Deposition)

  • 김봉주;김복기
    • 한국자기학회지
    • /
    • 제22권4호
    • /
    • pp.147-156
    • /
    • 2012
  • 최근 들어 박막의 원자층 두께를 정밀하게 제어하는 여러 가지 박막 성장 방법에 관한 관심이 높다. 그 중에서 원자층 두께를 조절할 수 있는 PLD 방법은 매우 폭넓은 관심을 받고 있다. 우리는 기존의 PLD 방법과 Reflection high energy electron diffraction(RHEED)을 이용하여 원자층 제어 PLD 방법을 구현하였다. 이러한 방법을 이용하여 산화물에서의 원자층 두께를 정밀하게 제어하는 방법에 관한 실험을 수행하였다. 이와 같은 실험방법이 가지는 다양한 조건을 제어하여 최소한의 결함을 가지고 결정의 화학적 조성에 근접하는 고품질의 박막을 구축하여 이를 바탕으로 다양한 실험을 수행하였다. 본 논문에서는 최근 이러한 박막을 이용한 우리의 실험결과와 타 그룹의 실험 동향을 정리하여 보았다.