• JSTS:Journal of Semiconductor Technology and Science
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• v.15 no.2
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• pp.184-193
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• 2015

This paper proposes a cost-efficient and automatic method for large data acquisition from a test chip without expensive equipment to characterize random process variation in an integrated circuit. Our method requires only a test chip, a personal computer, a cheap digital-to-analog converter, a controller and multimeters, and thus large volume measurement can be performed on an office desk at low cost. To demonstrate the proposed method, we designed a test chip with a current model logic driver and an array of 128 current mirrors that mimic the random process variation of the driver's tail current mirror. Using our method, we characterized the random process variation of the driver's voltage due to the random process variation on the driver's tail current mirror from large volume measurement data. The statistical characteristics of the driver's output voltage calculated from the measured data are compared with Monte Carlo simulation. The difference between the measured and the simulated averages and standard deviations are less than 20% showing that we can easily characterize the random process variation at low cost by using our cost-efficient automatic large data acquisition method.

• 제어로봇시스템학회:학술대회논문집
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• 1993.10b
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• pp.451-455
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• 1993

Interaction between system and disturbance results in system with time-dependent parameter. Parameter variation due to interaction has random characteristics. Most of the randomly varying parameters in control problem is regarded as white noise random process which is not a realistic model. In real situation those random variation is colored noise random process. Modified F-P-K equation is proposed to get the response of the random parametric system using some correction factor. Proposed technique is employed to obtain the colored noise parametric system response and confirmed via Monte-Carlo Simulation.

• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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• 1993.10a
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• pp.55-59
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• 1993

Interaction between system and disturbance results in system with time-dependent parameter. Parameter variation due to interaction has random characteristics. Most of the randomly varying parameters in control problem is regarded as white noise random process, which is not a realistic model. In real situation those random variation is colored noise random process. Modified F-P-K equation is proposed to get the response of the random parametric system using some correction factor. Proposed technique is employed to obtain the colored noise parametric system response and confirmed via Monte-Carlo Simulation.

• Transactions of the Korean Society of Mechanical Engineers
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• v.16 no.9
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• pp.1691-1699
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• 1992

The experimental results of fatigue crack propagation under constant amplitude loading show that intra-and inter-specimen variability exist. In this paper, a stochastic model for the estimation of mean and variance of crack propagation life is presented To take into account the intra-specimen variability, the material resistance against crack propagation is treated as an 1-dimensional spatial stochastic process, i. e. random field, varying along the propagation path. For the inter-specimen variability, C in paris equation is assumed to be a random variable. Compared with experimental results reported, the present method well estimate the variation in fatigue crack propagation life. And it is confirmed that the thicker the specimen thickness is, the less the variation of propagation life is.

• JSTS:Journal of Semiconductor Technology and Science
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• v.14 no.4
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• pp.365-375
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• 2014

This paper proposes an abnormal V-shaped-error-free non-blind deconvolution technique featuring an adaptively segmented forward-problem based iterative deconvolution (ASDCN) process. Unlike the algebraic based inverse operations, this eliminates any operations of differential and division by zero to successfully circumvent the issue on the abnormal V-shaped error. This effectiveness has been demonstrated for the first time with applying to a real analysis for the effects of the Random Telegraph Noise (RTN) and/or Random Dopant Fluctuation (RDF) on the overall SRAM margin variations. It has been shown that the proposed ASDCN technique can reduce its relative errors of RTN deconvolution by $10^{13}$ to $10^{15}$ fold, which are good enough for avoiding the abnormal ringing errors in the RTN deconvolution process. This enables to suppress the cdf error of the convolution of the RTN with the RDF (i.e., fail-bit-count error) to $1/10^{10}$ error for the conventional algorithm.

• JSTS:Journal of Semiconductor Technology and Science
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• v.14 no.6
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• pp.728-732
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• 2014

Macro-model of magnetic tunnel junction (MTJ) for spin transfer torque magnetic random access memory (STT-MRAM) has been developed. The macro-model can describe the dynamic behavior such as the state change of MTJ as a function of the pulse width of driving current and voltage. The statistical behavior has been included in the model to represent the variation of the MTJ characteristic due to process variation. The macro-model has been developed in Verilog-A.

• Journal of Power System Engineering
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• v.4 no.2
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• pp.40-45
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• 2000

Some engineering materials are often known to have considerable spatial variation in their resisting strength and other properties. The objective of this study is to investigate the averaging effect and the applicability of extremal statistic for the statistical size effect. In the present study, it is assumed that the material property is a stationary random process in space. The theoretical autocorrelation function of the material strength are discussed for several correlation lengths. And, in order to investigate the statistical size effect, the material properties was simulated by using the non-Gaussian random process method. The material properties were plotted on the Weibull probability papers. The main results are summarized as follows: The autocorrelation function of the material properties are almost independent of the averaging length. The variance decreases with increasing the averaging length. As correlation length is smaller, the slope is larger. And also, it was found that Weibull statistics based on the weakest-link model could not explain the spatial variation of material properties with respect to the size effect satisfactory.

• IE interfaces
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• v.18 no.4
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• pp.444-453
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• 2005

The purpose of the Gage R&R study is to determine whether a measurement system is adequate for monitoring a process. If the measurement system variation is small relative to the process variation, then the measurement system is deemed "adequate". The sources of variation associated with the measurement system are compared using an analysis of variance (ANOVA) model, in general. A typical ANOVA model used in a standard Gage R&R study is the two-factor random effect model. Then, the ANOVA partitions the total variation into three categories: repeatability, reproducibility, part variation. However, if the process variation possesses the between group variation, within group variation, and within part variation, these variations can cause the measurement system evaluation to provide misleading results. That is, in the standard Gage R&R study these variations affect the estimate of repeatability, reproducibility, or both. This paper presents a four-factor nested factorial ANOVA model which explicitly considers these variations for the Gage R&R study. The variance component estimators are derived by setting the EMS equations equal to the corresponding mean square from the ANOVA table and solving. And the proposed model is compared with the standard Gage R&R model.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.14 no.3
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• pp.241-245
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• 2001

In this paper, we present parameter optimization technique for GaAs/AlGaAs multiple quantum well avalanche photodiodes used for image capture mechanism in high-definition system. Even under flawless environment in semiconductor manufacturing process, random variation in process parameters can bring the fluctuation to device performance. The precise modeling for this variation is thus required for accurate prediction of device performance. The precise modeling for this variation is thus required for accurate prediction of device performance. This paper will first use experimental design and neural networks to model the nonlinear relationship between device process parameters and device performance parameters. The derived model was then put into genetic algorithms to acquire optimized device process parameters. From the optimized technique, we can predict device performance before high-volume manufacturign, and also increase production efficiency.

• Proceedings of the Korean Operations and Management Science Society Conference
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• 2005.05a
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• pp.975-982
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• 2005

The purpose of the Gage R&R study is to determine whether a measurement system is adequate for monitoring a process. If the measurement system variation is small relative to the process variation, then the measurement system is deemed 'adequate'. The sources of variation associated with the measurement system are compared using an analysis of variance (ANOVA) model, in general. A typical ANOVA model used in a standard Gage R&R study is the two-factor random effect model. Then, the ANOVA partitions the total variation into three categories: repeatability, reproducibility, part variation. However, if the process variation possesses the between group variation, within group variation, and within-part variation, these variations can cause the measurement system evaluation to provide misleading results. That is, in the standard Gage R&R study these variations affect the estimate of repeatability, reproducibility, or both. This paper presents a four-factor nested factorial ANOVA model which explicitly considers these variations for the Gage R&R study. The variance component estimates are derived by setting the EMS equations equal to the corresponding mean square from the ANOVA table and solving. And the proposed model is compared with the standard Gage R&R model.