• 제목/요약/키워드: QFN package

검색결과 12건 처리시간 0.026초

QFN 납땜 불량 검출을 위한 효율적인 검사 기법 (Efficient Mechanism for QFN Solder Defect Detection)

  • 김호중;조태훈
    • 한국정보통신학회:학술대회논문집
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    • 한국정보통신학회 2016년도 춘계학술대회
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    • pp.367-370
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    • 2016
  • QFN(Quad Flat No-leads package)은 SMD(Surface Mount Device) 자재 중의 하나로써, 납땜을 하는 lead 부분이 따로 있지 않아 납땜에 대한 불량이 많이 발생하고 있다. 따라서 본 논문에서는 QFN의 납땜에 대한 불량을 검출하는 기법을 제안하고자 한다. 우리는 QFN의 납땜에 대한 불량 검출을 위해 기계학습 방법 중 하나인 Convolutional Neural Network(CNN)을 사용하였고, CNN에 학습을 시키기 위한 데이터로는 납땜을 한 QFN 컬러 다단 영상을 사용하였다. 이 영상은 3채널 컬러 영상으로, 이를 바로 CNN에 적용시켜 학습시키기에는 문제가 있다. 그렇기 때문에 3채널 컬러 영상을 세개의 1채널 Grayscale 영상(Red, Green, Blue)로 분리시켜 CNN에 적용시켰다. 이렇게 학습시킨 결과를 이용하여 QFN의 납땜에 대한 불량을 검출할 수 있었다. 현재는 Dicing과 Punch에 대해서만 테스트를 해보았기 때문에, 추후에 이를 제외한 다른 것들에 대한 추가적인 연구가 필요하다.

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컬러 입력 영상을 갖는 Convolutional Neural Networks를 이용한 QFN 납땜 불량 검출 (QFN Solder Defect Detection Using Convolutional Neural Networks with Color Input Images)

  • 김호중;조태훈
    • 반도체디스플레이기술학회지
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    • 제15권3호
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    • pp.18-23
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    • 2016
  • QFN (Quad Flat No-leads Package) is one of the SMD (Surface Mount Device). Since there is no lead in QFN, there are many defects on solder. Therefore, we propose an efficient mechanism for QFN solder defect detection at this paper. For this, we employ Convolutional Neural Network (CNN) of the Machine Learning algorithm. QFN solder's color multi-layer images are used to train CNN. Since these images are 3-channel color images, they have a problem with applying to CNN. To solve this problem, we used each 1-channel grayscale image (Red, Green, Blue) that was separated from 3-channel color images. We were able to detect QFN solder defects by using this CNN. In this paper, it is shown that the CNN is superior to the conventional multi-layer neural networks in detecting QFN solder defects. Later, further research is needed to detect other QFN.

QFN 패키지의 Resin Bleed와 Melting 검출 알고리즘 (Algorithm for Segmenting Resin Bleed and Melting on the Surface of QFN Packages)

  • 왕명걸;박덕천;주효남;김준식
    • 제어로봇시스템학회논문지
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    • 제15권9호
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    • pp.899-905
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    • 2009
  • There are many different types of surface defects on semiconductor Integrated Chips (IC's) caused by various factors during manufacturing process, such as Scratch, Flash, Resin bleed, and Melting. These defects must be detected and classified by an inspection system for productivity improvement and effective process control. Among defects, in particular, Resin bleed and Melting are the most difficult ones to classify accurately. The brightness value and the shape of Resin bleed and Melting defects are so similar that normally it is difficult to classify the Resin bleed and Melting. In this paper, we propose a segmenting method and a set of features for detecting and classifying the Resin bleed and Melting defects.

An Wideband GaN Low Noise Amplifier in a 3×3 mm2 Quad Flat Non-leaded Package

  • Park, Hyun-Woo;Ham, Sun-Jun;Lai, Ngoc-Duy-Hien;Kim, Nam-Yoon;Kim, Chang-Woo;Yoon, Sang-Woong
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제15권2호
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    • pp.301-306
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    • 2015
  • An ultra-compact and wideband low noise amplifier (LNA) in a quad flat non-leaded (QFN) package is presented. The LNA monolithic microwave integrated circuit (MMIC) is implemented in a $0.25{\mu}m$ GaN IC technology on a Silicon Carbide (SiC) substrate provided by Triquint. A source degeneration inductor and a gate inductor are used to obtain the noise and input matching simultaneously. The resistive feedback and inductor peaking techniques are employed to achieve a wideband characteristic. The LNA chip is mounted in the $3{\times}3-mm^2$ QFN package and measured. The supply voltages for the first and second stages are 14 V and 7 V, respectively, and the total current is 70 mA. The highest gain is 13.5 dB around the mid-band, and -3 dB frequencies are observed at 0.7 and 12 GHz. Input and output return losses ($S_{11}$ and $S_{22}$) of less than -10 dB measure from 1 to 12 GHz; there is an absolute bandwidth of 11 GHz and a fractional bandwidth of 169%. Across the bandwidth, the noise figures (NFs) are between 3 and 5 dB, while the output-referred third-order intercept points (OIP3s) are between 26 and 28 dBm. The overall chip size with all bonding pads is $1.1{\times}0.9mm^2$. To the best of our knowledge, this LNA shows the best figure-of-merit (FoM) compared with other published GaN LNAs with the same gate length.

QFN 반도체 패키지의 외형 결함 검사를 위한 효과적인 결함 분류 시스템 개발 (Development of an Effective Defect Classification System for Inspection of QFN Semiconductor Packages)

  • 김효준;이정섭;주효남;김준식
    • 융합신호처리학회논문지
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    • 제10권2호
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    • pp.120-126
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    • 2009
  • 반도체 외관결함에는 발생 요인이 각각 다른 crack, foreign material, chip-out, chip, void 등이 있으며, 검사 시스템에서는 결함 유무 및 결함 분류를 수행하여 효과적인 공정관리가 가능하여야 한다. 본 논문에서는 QFN 패키지 결함의 분류를 위한 알고리즘 및 광학시스템을 제안한다. 제안한 방법에서 분류가 어려운 결함 중 하나인 foreign material 과 chip의 효과적인 분류를 위해 제안한 결함의 위치, 밝기의 특징정보(feature)를 사용한 ML(Maximum Likelihood ratio) 분류방법 및 특징정보 획득에 효과적인 광학계를 제안하였다. 실험 결과에서 분류가 어려운 foreign material과 chip에 대한 신뢰성 높은 분류성능을 보였다.

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단상 에너지 측정용 IC 구현 (Implementation of Single-Phase Energy Measurement IC)

  • 이연성;서해문;김동구
    • 한국통신학회논문지
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    • 제40권12호
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    • pp.2503-2510
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    • 2015
  • 본 논문에서는 전력 정보를 측정하기 위한 단상 에너지 측정용 IC의 구현 방법을 제안한다. 제안된 전력 측정용 IC는 2개의 PGA(Programmable Gain Amplifier), 2개의 ${\sum}{\Delta}$ modulator, reference 회로, LDO(Low-dropout) regulator, 온도 센서, 필터부, 계산 엔진, 보정 제어부, 레지스터, 외부 인터페이스로 구성된다. $0.18-{\mu}m$ CMOS 공정으로 제작되었고, 32-pin QFN package로 제작되었다. 구현된 IC는 3.3V 전원을 공급받아 동작하며, 동작 클럭 주파수는 4,096 kHz이고, IC 동작시 소비 전력은 10 mW이다.

Small-Cell 기지국 시스템을 위한 2.6 GHz GaN-HEMT Doherty 전력증폭기 집적회로 설계 (Design of a 2.6 GHz GaN-HEMT Doherty Power Amplifier IC for Small-Cell Base Station Systems)

  • 이휘섭;임원섭;강현욱;이우석;이형준;윤정상;이동우;양영구
    • 한국전자파학회논문지
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    • 제27권2호
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    • pp.108-114
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    • 2016
  • 본 논문에서는 2.6 GHz에서 동작하는 Doherty 전력증폭기 집적회로를 설계 및 제작하여 평균 전력에서의 효율을 개선하였다. Small-cell 기지국 시스템에 적합하도록 전력 밀도가 높은 GaN-HEMT 공정을 사용하여 설계하였으며, 제작된 Doherty 전력증폭기 집적회로를 QFN 패키지 내부에 수용하여 시스템 적용에 용이하도록 하였다. 제작된 GaN-HEMT Doherty 전력증폭기 집적회로는 10 MHz의 대역폭 및 6.5 dB의 PAPR 특성을 갖는 2.6 GHz LTE 신호에 대하여 평균 전력 33.9 dBm에서 15.8 dB의 전력 이득, 43.0%의 효율 및 -30.0 dBc의 ACLR 특성을 나타낸다.

Single-Phase Energy Metering Chip with Built-in Calibration Function

  • Lee, Youn-Sung;Seo, Jeongwook;Wee, Jungwook;Kang, Mingoo;Kim, Dong Ku
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • 제9권8호
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    • pp.3103-3120
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    • 2015
  • This paper presents a single-phase energy metering chip with built-in calibration function to measure electric power quantities. The entire chip consists of an analog front end, a filter block, a computation engine, a calibration engine, and an external interface block. The key design issues are how to reduce the implementation costs of the computation engine from repeatedly used arithmetic operations and how to simplify calibration procedure and reduce calibration time. The proposed energy metering chip simplifies the computation engine using time-division multiplexed arithmetic units. It also provides a simple and fast calibration scheme by using integrated digital calibration functionality. The chip is fabricated with 0.18-μm six-layer metal CMOS process and housed in a 32-pin quad-flat no-leads (QFN) package. It operates at a clock speed of 4096 kHz and consumes 9.84 mW in 3.3 V supply.

A Triple-Band Transceiver Module for 2.3/2.5/3.5 GHz Mobile WiMAX Applications

  • Jang, Yeon-Su;Kang, Sung-Chan;Kim, Young-Eil;Lee, Jong-Ryul;Yi, Jae-Hoon;Chun, Kuk-Jin
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제11권4호
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    • pp.295-301
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    • 2011
  • A triple-band transceiver module for 2.3/2.5/3.5 GHz mobile WiMAX, IEEE 802.16e, applications is introduced. The suggested transceiver module consists of RFIC, reconfigurable/multi-resonance MIMO antenna, embedded PCB, mobile WiMAX base band, memory and channel selection front-end module. The RFIC is fabricated in $0.13{\mu}m$ RF CMOS process and has 3.5 dB noise figure(NF) of receiver and 1 dBm maximum power of transmitter with 68-pin QFN package, $8{\times}8\;mm^2$ area. The area reduction of transceiver module is achieved by using embedded PCB which decreases area by 9% of the area of transceiver module with normal PCB. The developed triple-band mobile WiMAX transceiver module is tested by performing radio conformance test(RCT) and measuring carrier to interference plus noise ratio (CINR) and received signal strength indication (RSSI) in each 2.3/2.5/3.5 GHz frequency.