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http://dx.doi.org/10.5302/J.ICROS.2009.15.9.899

Algorithm for Segmenting Resin Bleed and Melting on the Surface of QFN Packages  

Wang, Ming-Jie (효서대학교 디지털디스플레이공학과)
Park, Duck-Chun (효서대학교 디지털디스플레이공학과)
Joo, Hyo-Nam (효서대학교 디지털디스플레이공학과)
Kim, Joon-Seek (호서대학교 전자공학과)
Publication Information
Journal of Institute of Control, Robotics and Systems / v.15, no.9, 2009 , pp. 899-905 More about this Journal
Abstract
There are many different types of surface defects on semiconductor Integrated Chips (IC's) caused by various factors during manufacturing process, such as Scratch, Flash, Resin bleed, and Melting. These defects must be detected and classified by an inspection system for productivity improvement and effective process control. Among defects, in particular, Resin bleed and Melting are the most difficult ones to classify accurately. The brightness value and the shape of Resin bleed and Melting defects are so similar that normally it is difficult to classify the Resin bleed and Melting. In this paper, we propose a segmenting method and a set of features for detecting and classifying the Resin bleed and Melting defects.
Keywords
QFN; QFN package; inspection; resin bleed; melting; lead frame; segmentation; classifying;
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  • Reference
1 N. Otsu, 'A threshold selection method form gray-level histogram,' IEEE Trans, System, Man, and Cybernetics, vol. 9, no. 1,pp.62-66, 1979   DOI   ScienceOn
2 J. F. Canny, 'A computational approach to edge detection,' IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. PAMI-8, no. 6, pp.679- 698, Nov. 1986   DOI   ScienceOn
3 R. W. Farcbrothcr, Fitting Linear Relationships: A History of the Calculus of Observations 1750-1900. Springer, USA pp. 50-60, 1999
4 R. C. Gonzalez and R. E. Woods, Digital Image Processing, 3nd Ed., Prentice Hall, USA, pp. 749-752,2001
5 T. C. Lionge and A. Pascual. 'Impact of Quad flat no lead frame package on automated X-ray inspection,' IEEE International Test Conference, pp. 1-10,2007
6 P.-S. Liao, T.-S. Chen, and P.-C. Chung, 'A fast algorithm for multilevel thresholding,' Journal CJf Information Science And Engineering, vol. 17,pp. 713-727,2001