• Communications for Statistical Applications and Methods
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• v.12 no.2
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• pp.265-273
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• 2005

In this paper, we proposed multivariate EWMA control charts for both combine-accumulate and accumulate-combine approaches to monitor dispersion matrix of multiple quality variables. Numerical performance of the proposed charts are evaluated in terms of average run length(ARL). The performances show that small smoothing constants with accumulate-combine approach is preferred for detecting small shifts of the production process.

• Journal of Korean Society for Quality Management
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• v.25 no.1
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• pp.100-115
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• 1997

Shewhart control chart is a basic technique to monitor the state of a process. We observe samples of size four or five and plot some statistic(e.g., mean or range) of each sample on the chart. When setting up the chart, we need to obtain u, pp.r and lower control limits. It is common practice that those limits are calculated from the preliminary 20-40 samples presumed to be homogeneous. However, it may ha, pp.n in practice that the samples are contaminated by outlying observations caused by various reasons. The presence of outlying observations make the control limits wider and hence decrease the sensitivity of the charts. In this paper, we introduce robust control charts with tighter control limits when outlying observations are present in the preliminary samples. Examples will be given via simulation study.

• The Korean Journal of Applied Statistics
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• v.21 no.3
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• pp.509-521
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• 2008

Two control charts are usually required to monitor both the process mean and variance. In this paper, we introduce control procedures for jointly monitoring the process mean and variance with one control chart, and investigate efficiency of the introduced charts by comparing with the combined two EWMA charts. Our numerical results show that the GLR chart, the Omnibus EWMA chart, and the Interval chart have good ARL properties for simultaneous changes in the process mean and variance.

• Journal of the Korean Society for Precision Engineering
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• v.15 no.10
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• pp.103-112
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• 1998

The evolution of semiconductor manufacturing technology has accelerated the reduction of device dimensions and the increase of integrated circuit density. In order to improve yield within a short turn around time and maintain it at high level, a system that can rapidly determine problematic processing steps is needed. The statistical process control detects abnormal process variation of key parameters. Expert systems in SPC can serve as a valuable tool to automate the analysis and interpretation of control charts. A set of IF-THEN rules was used to formalize knowledge base of special causes. This research proposes a strategy to apply expert system to SPC in semiconductor manufacturing. In analysis, the expert system accomplishes the instability detection of process parameter, In diagnosis, an engineer is supported by process analyzer program. An example has been used to demonstrate the expert system and the process analyzer.

• Journal of the Korean Operations Research and Management Science Society
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• v.20 no.3
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• pp.123-146
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• 1995

Several quality control schemes have been extensively compared using multivariate normal data sets simulated with various correlation structures. They include multiple univariate CUSUM charts, multivariate EWMA charts, multivariate CUSUM charts and Shewhart T$^{3}$ chart. This paper considers a new approach of the multivariate EWMA chart, in which the smoothing matrix has full elements instead of only diagonal elements. Performance of the schemes is measured by avaerage run length (ARL), coefficient of variation of run length (CVRL) and rank in order of signaling of off-target shifts in the process mean vector. The schemes are also compared by noncentrality parameter. The multiple univariate CUSUM charts are generally affected by the correlation structure. The multivariate EWMA charts provide better ARL performance. Especially, the new EWMA chart shows remarkable results in small shifts.

• Journal of Korean Society for Quality Management
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• v.40 no.3
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• pp.327-336
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• 2012

Purpose: In this study, we research the hurdle rate method to suggest the robust control chart for a contaminated process less vulnerable to fault values than existing control charts. Methods: We produce the results of p, ARL values to compare the performance of two control charts, $\bar{x}-s$ that has been used typically and TM-TS that is suggested by this paper. We implement the simulation focusing on three cases, change of deviation, mean and both of them. Results: We draw a conclusion that the TM-TS control chart has better efficiency than $\bar{x}-s$ control chart over the three cases. Conclusion: We insist that applying TM-TS control chart for a polluted process is more effective than $\bar{x}-s$ control chart.

• International Journal of Quality Innovation
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• v.4 no.1
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• pp.191-204
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• 2003

The target costing technique, mathematically discussed by Sauers, only uses the $C_p index along with Taguchi loss function and $\bar{X}$-P control charts to setup goal control limits. The new specification limits derived from Taguchi loss function is linked through the $C_p value to $\bar{X}$-P control charts to obtain goal control limits. Studies have shown that the point estimator of the $C_p index, $C_p, could vary from time to time due to the sampling error. The suggested approach is to use confidence intervals, especially the lower confidence intervals, to replace the point estimator. Therefore, an improvement on target costing technique is presented by applying the lower confidence interval of the $C_p index and using both Taguchi and Spiring's loss functions together with $\bar{X}$-P charts to make this technique more robust in practice. An example is also provided to illustrate how the improved target costing technique works.

• Proceedings of the Society of Korea Industrial and System Engineering Conference
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• 2002.05a
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• pp.359-364
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• 2002

In case of pn control chart often used in mass production system of plant industry and so on, we could evaluate it's performance by the approximation to normal distribution. It has many differences according to sample sizes and defective fraction, and have disadvantage that needs much samples to use the normal distribution approximation. Existent control charts can not detect the cause of process something wrong because it is taking the sampling intervals of fixed length about all times from the process. Therefore, to overcome this shortcoming we use VSI(variable sampling intervals) techniques in this paper. This technique takes a long sampling interval to have the next sampling point if the sample point is in stable state, and if the sample point is near control lines, it takes short sampling interval because the probability to escape control limit is high. To analyze performance of pn control charts that have existent fixed sampling intervals(FSI) and that use VSI technique, we compare ATS of two charts, and analyze the performance of each control chart by the sample sizes, process fraction defective and control limits that Ryan and Schwertman had proposed.

• Journal of Korean Society for Quality Management
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• v.39 no.2
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• pp.234-243
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• 2011

Multivariate control charts are widely used to monitor the performance of a multivariate process over time to maintain control of the process. Although existing multivariate control charts provide control limits to monitor the process and detect any extraordinary events, it is a challenge to identify the causes of an out-of-control alarm when the number of process variables is large. Several fault identification methods have been developed to address this issue. However, these methods require a normality assumption of the process data. In the present study, we propose a bootstrapped-based $T^2$ decomposition technique that does not require any distributional assumption. A simulation study was conducted to examine the properties of the proposed fault identification method under various scenarios and compare it with the existing parametric $T^2$ decomposition method. The simulation results showed that the proposed method produced better results than the existing one, especially in nonnormal situations.

• Journal of Korean Society for Quality Management
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• v.25 no.3
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• pp.39-50
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• 1997

Markov chain method to evaluate the properties of control charts with variable sampling intervals(VSI0 for simultaneously monitoring several correlated quality characteristics under multivariate normal process are investigated. For comparing the efficiencies and properties of multivariate control charts, we consider multivariate Shewhart, CUSUM and EWMA charts in terms of average time to signal(ATS) and average number of samples to signal(ANSS). We obtained stabilized numerical results with Markov chain method when the number of transient state is greater than 100.